Timon Fliervoet

789 total citations
27 papers, 641 citations indexed

About

Timon Fliervoet is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Geophysics. According to data from OpenAlex, Timon Fliervoet has authored 27 papers receiving a total of 641 indexed citations (citations by other indexed papers that have themselves been cited), including 18 papers in Electrical and Electronic Engineering, 14 papers in Surfaces, Coatings and Films and 6 papers in Geophysics. Recurrent topics in Timon Fliervoet's work include Advancements in Photolithography Techniques (18 papers), Electron and X-Ray Spectroscopy Techniques (10 papers) and Integrated Circuits and Semiconductor Failure Analysis (9 papers). Timon Fliervoet is often cited by papers focused on Advancements in Photolithography Techniques (18 papers), Electron and X-Ray Spectroscopy Techniques (10 papers) and Integrated Circuits and Semiconductor Failure Analysis (9 papers). Timon Fliervoet collaborates with scholars based in Netherlands, Germany and Belgium. Timon Fliervoet's co-authors include Martyn R. Drury, S. H. White, R. J. Angel, F. Seifert, Prame Chopra, Nancy L. Ross, Reinoud L.M. Vissers, Eelco van Setten, Ruth Knoche and Natalia Davydova and has published in prestigious journals such as Nature, Tectonophysics and Applied Surface Science.

In The Last Decade

Timon Fliervoet

25 papers receiving 609 citations

Peers

Countries citing papers authored by Timon Fliervoet

Since Specialization

Citations

This map shows the geographic impact of Timon Fliervoet's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Timon Fliervoet with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Timon Fliervoet more than expected).

Fields of papers citing papers by Timon Fliervoet

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Timon Fliervoet. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Timon Fliervoet. The network helps show where Timon Fliervoet may publish in the future.

Co-authorship network of co-authors of Timon Fliervoet

This figure shows the co-authorship network connecting the top 25 collaborators of Timon Fliervoet. A scholar is included among the top collaborators of Timon Fliervoet based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Timon Fliervoet. Timon Fliervoet is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Fundamental understanding and experimental verification of bright versus dark field imaging 2020 ·Natalia Davydova, Jo Finders, (unknown), Eelco van Setten, Claire van Lare, Joern-Holger Franke, Andreas Frommhold, (unknown), (unknown), Andreas Verch, (unknown), (unknown), Timon Fliervoet	12
2	Pathfinding the perfect EUV mask: the role of the multilayer 2020 ·Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) ·(unknown), Peter Evanschitzky, (unknown), Eelco van Setten, Timon Fliervoet, Andreas Erdmann	9
3	Experimental verification of high-NA imaging simulations using SHARP 2020 ·Natalia Davydova, Fei Liu, Markus P. Benk, Eelco van Setten, (unknown), (unknown), (unknown), Vincent Wiaux, Joern-Holger Franke, Kenneth A. Goldberg, (unknown), (unknown), Patrick Naulleau, Timon Fliervoet, (unknown)	1
4	3D mask effects in high NA EUV imaging 2019 ·Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) ·Andreas Erdmann, Peter Evanschitzky, (unknown), Eelco van Setten, Timon Fliervoet	19
5	High NA EUV lithography: Next step in EUV imaging 2019 ·Eelco van Setten, (unknown), (unknown), Jan van Schoot, Kars Troost, (unknown), Timon Fliervoet, Stephen Hsu, J. Zimmermann, (unknown), Bartosz Bilski, Paul Graeupner	45
6	Simulation study of illumination effects in high-NA EUV lithography 2018 ·Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) ·(unknown), Peter Evanschitzky, Andreas Erdmann, Eelco van Setten, (unknown), Timon Fliervoet	1
7	Assist features: placement, impact, and relevance for EUV imaging 2016 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Iacopo Mochi, Vicky Philipsen, Emily Gallagher, Eric Hendrickx, (unknown), (unknown), (unknown), Timon Fliervoet, Shibing Wang, Stephen Hsu, (unknown), (unknown), (unknown)	15
8	Sub-50 nm metrology on extreme ultra violet chemically amplified resist—A systematic assessment 2015 ·Review of Scientific Instruments ·Diederik Maas, Timon Fliervoet, R.W. Herfst, Emile van Veldhoven, (unknown), (unknown), Hamed Sadeghian	3
9	Alternative EUV mask technology to compensate for mask 3D effects 2015 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Lieve Van Look, Vicky Philipsen, Eric Hendrickx, Geert Vandenberghe, Natalia Davydova, (unknown), (unknown), (unknown), (unknown), Timon Fliervoet, Jan van Schoot, Jens Timo Neumann	7
10	Influence of etch process on contact hole local critical dimension uniformity in extreme-ultraviolet lithography 2015 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Gian F. Lorusso, Ming Mao, Liesbeth Reijnen, (unknown), (unknown), Gijsbert Rispens, Timon Fliervoet	11
11	Evaluation of EUV resist performance below 20nm CD using helium ion lithography 2014 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Diederik Maas, Emile van Veldhoven, (unknown), Paul F. A. Alkemade, Sander F. Wuister, (unknown), (unknown), (unknown), Timon Fliervoet	11
12	Advanced overlay control in volume manufacturing 2011 ·(unknown), Christopher P. Ausschnitt, Nelson Felix, (unknown), (unknown), Allen H. Gabor, (unknown), (unknown), James B. Schreiber, Timon Fliervoet, (unknown), (unknown)	0
13	Lithographic scanner stability improvements through advanced metrology and control 2010 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Peter Vanoppen, (unknown), (unknown), (unknown), Timon Fliervoet, Martin Ebert, (unknown)	12
14	Dense lines created by spacer DPT scheme: process control by local dose adjustment using advanced scanner control 2009 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Jo Finders, Mircea Dusa, (unknown), Timon Fliervoet, (unknown), (unknown), (unknown), (unknown), (unknown), C.M. Leewis, (unknown), Mireille Maenhoudt, (unknown), T. Vandeweyer, Gayle Murdoch, Efrain Altamirano Sánchez	6
15	High Resolution, High Throughput Electron Tomography Reconstruction 2005 ·Microscopy and Microanalysis ·Remco Schoenmakers, (unknown), Timon Fliervoet, Wim F. Voorhout	12
16	Analysis of nanoscale multilayers by EDXS and EELS in the STEM 2001 ·Applied Surface Science ·Jürgen Thomas, Timon Fliervoet, Klaus Wetzig	2
17	Evidence for dominant grain-boundary sliding deformation in greenschist- and amphibolite-grade polymineralic ultramylonites from the Redbank Deformed Zone, Central Australia 1997 ·Journal of Structural Geology ·Timon Fliervoet, S. H. White, Martyn R. Drury	121
18	Structural characterization of pentacoordinate silicon in a calcium silicate 1996 ·Nature ·R. J. Angel, Nancy L. Ross, F. Seifert, Timon Fliervoet	78
19	Quartz deformation in a very fine grained quartzo-feldspathic mylonite: a lack of evidence for dominant grain boundary sliding deformation 1995 ·Journal of Structural Geology ·Timon Fliervoet, S. H. White	43
20	Cryptocrystalline Permian tourmalinites of possible metasomatic origin in the Orobic Alps, northern Italy 1994 ·Economic Geology ·(unknown), Cees W. Passchier, John F. Slack, Timon Fliervoet, H. de Boorder	14

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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