Jens Timo Neumann
- Electrical and Electronic Engineering top 10%
- Surfaces, Coatings and Films top 2%
- Biomedical Engineering
- Radiation top 5%
- Atomic and Molecular Physics, and Optics
- Co-authors
- Winfried KaiserBernhard KneerJan van SchootPaul GräupnerPeter EvanschitzkyAndreas ErdmannDetlef KipEelco van Setten
- Topics
- Advancements in Photolithography Techniques (26 papers)Integrated Circuits and Semiconductor Failure Analysis (16 papers)Electron and X-Ray Spectroscopy Techniques (14 papers)
- Partner nations
- GermanyNetherlandsUnited States
In The Last Decade
Jens Timo Neumann
41 papers receiving 510 citations
Peers
Comparison fields: 5 of 42
- Electrical and Electronic Engineering 468
- Surfaces, Coatings and Films 259
- Biomedical Engineering 139
- Radiation 104
- Atomic and Molecular Physics, and Optics 97
Countries citing papers authored by Jens Timo Neumann
This map shows the geographic impact of Jens Timo Neumann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jens Timo Neumann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jens Timo Neumann more than expected).
Fields of papers citing papers by Jens Timo Neumann
This network shows the impact of papers produced by Jens Timo Neumann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jens Timo Neumann. The network helps show where Jens Timo Neumann may publish in the future.
Co-authorship network of co-authors of Jens Timo Neumann
This figure shows the co-authorship network connecting the top 25 collaborators of Jens Timo Neumann. A scholar is included among the top collaborators of Jens Timo Neumann based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jens Timo Neumann. Jens Timo Neumann is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 1 | |
| 3 | 5 | |
| 4 | 15 | |
| 5 | 3 | |
| 6 | 11 | |
| 7 | 20 | |
| 8 | 11 | |
| 9 | 7 | |
| 10 | 16 | |
| 11 | 1 | |
| 12 | 11 | |
| 13 | 3 | |
| 14 | 2 | |
| 15 | 34 | |
| 16 | 12 | |
| 17 | 3 | |
| 18 | 0 | |
| 19 | 0 | |
| 20 | 3 |
About Jens Timo Neumann
Jens Timo Neumann is a scholar working on Surfaces, Coatings and Films, Structural Biology and Industrial and Manufacturing Engineering, having authored 46 papers that have together received 565 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (26 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers) and Electron and X-Ray Spectroscopy Techniques (14 papers). The work is most often cited by research in Surfaces, Coatings and Films (259 citations), Radiation (104 citations) and Electrical and Electronic Engineering (468 citations). Jens Timo Neumann has collaborated with scholars based in Germany, Netherlands and United States. Frequent co-authors include Winfried Kaiser, Bernhard Kneer, Jan van Schoot, Paul Gräupner, Peter Evanschitzky, Andreas Erdmann, Detlef Kip, Eelco van Setten, Kars Troost and Gijsbert Rispens. Their work appears in journals such as Physical Review A, Optics Letters and Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.