Markus P. Benk
Impact in
- Structural Biology top 5%
- Advanced Electron Microscopy Techniques and Applications
- Radiation top 5%
- Advanced X-ray Imaging Techniques
- X-ray Spectroscopy and Fluorescence Analysis
Papers in
-
- Advancements in Photolithography Techniques 37
- Integrated Circuits and Semiconductor Failure Analysis 14
-
- Electron and X-Ray Spectroscopy Techniques 29
- Co-authors
- K. Bergmann (7 shared papers)Kenneth A. Goldberg (36 shared papers)Antoine Wojdyla (22 shared papers)Patrick Naulleau (21 shared papers)Thomas Wilhein (4 shared papers)David Schäfer (3 shared papers)Obert R. Wood (9 shared papers)Pawitter J. S. Mangat (8 shared papers)
- Journals
- Journal of Micro/Nanolithography MEMS and MOEMS (5 papers)Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (2 papers)Scientific Reports (1 paper)Review of Scientific Instruments (1 paper)Optics Letters (1 paper)
- Partner nations
- United StatesGermanyBelgium
In The Last Decade
Markus P. Benk
41 papers receiving 262 citations
Peers
Comparison fields: 5 of 28
- Structural Biology 56
- Radiation 177
- Surfaces, Coatings and Films 116
- Electrical and Electronic Engineering 194
- Nuclear and High Energy Physics 21
Countries citing papers authored by Markus P. Benk
This map shows the geographic impact of Markus P. Benk's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Markus P. Benk with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Markus P. Benk more than expected).
Fields of papers citing papers by Markus P. Benk
This network shows the impact of papers produced by Markus P. Benk. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Markus P. Benk. The network helps show where Markus P. Benk may publish in the future.
Co-authors
The 25 scholars most cited alongside Markus P. Benk, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 45 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2008 | 51 | |
| 2 | 2014 | 21 | |
| 3 | 2014 | 18 | |
| 4 | 2012 | 17 | |
| 5 | 2008 | 16 | |
| 6 | 2015 | 14 | |
| 7 | 2018 | 12 | |
| 8 | 2015 | 12 | |
| 9 | 2015 | 10 | |
| 10 | 2016 | 8 | |
| 11 | 2016 | 8 | |
| 12 | 2015 | 8 | |
| 13 | 2015 | 8 | |
| 14 | 2020 | 7 | |
| 15 | 2009 | 7 | |
| 16 | 2015 | 6 | |
| 17 | 2015 | 6 | |
| 18 | 2009 | 5 | |
| 19 | 2019 | 5 | |
| 20 | 2016 | 5 |
About Markus P. Benk
Markus P. Benk is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Radiation, Structural Biology and Media Technology, having authored 45 papers that have together received 282 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (37 papers), Electron and X-Ray Spectroscopy Techniques (29 papers), Advanced X-ray Imaging Techniques (26 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers), Advanced Electron Microscopy Techniques and Applications (6 papers), X-ray Spectroscopy and Fluorescence Analysis (5 papers), Image Processing Techniques and Applications (3 papers) and Laser-Plasma Interactions and Diagnostics (2 papers). The work is most often cited by research in Structural Biology (56 citations), Radiation (177 citations), Surfaces, Coatings and Films (116 citations), Electrical and Electronic Engineering (194 citations) and Nuclear and High Energy Physics (21 citations). Markus P. Benk has collaborated with scholars based in United States, Germany and Belgium. Frequent co-authors include K. Bergmann, Kenneth A. Goldberg, Antoine Wojdyla, Patrick Naulleau, Thomas Wilhein, David Schäfer, Obert R. Wood, Pawitter J. S. Mangat, Weilun Chao and David Johnson. Their work appears in journals such as Journal of Micro/Nanolithography MEMS and MOEMS, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Scientific Reports, Review of Scientific Instruments and Optics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.