Peter Vanoppen

1.4k total citations
42 papers, 1.2k citations indexed

About

Peter Vanoppen is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Surfaces, Coatings and Films. According to data from OpenAlex, Peter Vanoppen has authored 42 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Electrical and Electronic Engineering, 21 papers in Biomedical Engineering and 16 papers in Surfaces, Coatings and Films. Recurrent topics in Peter Vanoppen's work include Advancements in Photolithography Techniques (19 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers) and Optical Coatings and Gratings (9 papers). Peter Vanoppen is often cited by papers focused on Advancements in Photolithography Techniques (19 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers) and Optical Coatings and Gratings (9 papers). Peter Vanoppen collaborates with scholars based in Netherlands, Belgium and Germany. Peter Vanoppen's co-authors include Frans C. De Schryver, Steven De Feyter, Suresh Valiyaveettil, Kläus Müllen, R. Ravishankar, Brian J. Schoeman, Pierre A. Jacobs, Piet J. Grobet, Christine E. A. Kirschhock and Georg Möessner and has published in prestigious journals such as Journal of the American Chemical Society, Angewandte Chemie International Edition and The Journal of Physical Chemistry B.

In The Last Decade

Peter Vanoppen

40 papers receiving 1.2k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Peter Vanoppen Netherlands 15 692 490 439 327 273 42 1.2k
Joan Teyssandier Belgium 19 819 1.2× 476 1.0× 479 1.1× 208 0.6× 222 0.8× 31 1.3k
Katherine E. Plass United States 18 708 1.0× 663 1.4× 658 1.5× 144 0.4× 323 1.2× 31 1.3k
Kurt Wostyn Belgium 21 705 1.0× 482 1.0× 511 1.2× 101 0.3× 438 1.6× 90 1.6k
Jinjie Xü China 10 648 0.9× 190 0.4× 271 0.6× 358 1.1× 62 0.2× 13 1.1k
M.V. Russo Italy 22 442 0.6× 291 0.6× 415 0.9× 73 0.2× 289 1.1× 61 1.3k
Vincent Huc France 22 806 1.2× 294 0.6× 364 0.8× 137 0.4× 153 0.6× 60 1.4k
Cristiano Albonetti Italy 24 645 0.9× 390 0.8× 1.0k 2.3× 89 0.3× 437 1.6× 71 1.8k
Olivier Lebel Canada 19 652 0.9× 161 0.3× 220 0.5× 414 1.3× 106 0.4× 47 1.2k
Alicia Forment‐Aliaga Spain 22 983 1.4× 165 0.3× 584 1.3× 325 1.0× 300 1.1× 56 1.7k
Zhong-Ze Gu Japan 15 394 0.6× 190 0.4× 300 0.7× 100 0.3× 401 1.5× 17 1.0k

Countries citing papers authored by Peter Vanoppen

Since Specialization
Citations

This map shows the geographic impact of Peter Vanoppen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Peter Vanoppen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Peter Vanoppen more than expected).

Fields of papers citing papers by Peter Vanoppen

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Peter Vanoppen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Peter Vanoppen. The network helps show where Peter Vanoppen may publish in the future.

Co-authorship network of co-authors of Peter Vanoppen

This figure shows the co-authorship network connecting the top 25 collaborators of Peter Vanoppen. A scholar is included among the top collaborators of Peter Vanoppen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Peter Vanoppen. Peter Vanoppen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Peeters, Rudy, Sjoerd Lok, Jan van Schoot, et al.. (2024). The next step in Moore’s law: high-NA EUV introduction at the customer. 35–35. 4 indexed citations
3.
Smeets, Bart, et al.. (2023). Supporting future DRAM overlay and EPE roadmaps with the NXT:2100i. 34–34. 1 indexed citations
4.
Peeters, Rudy, Jeroen van Dongen, Sjoerd Lok, et al.. (2023). High-NA EUV platform realization as next step in EUV technology. 1–1. 4 indexed citations
5.
Ebert, Martin, et al.. (2016). New approaches in diffraction based optical metrology. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9778. 97782N–97782N. 3 indexed citations
6.
Leray, Philippe, Koen D’havé, Paul Hinnen, et al.. (2011). 3D features measurement using YieldStar, an angle resolved polarized scatterometer. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7971. 79712E–79712E.
7.
Leray, Philippe, Koen D’havé, Paul Hinnen, et al.. (2011). 3D features measurement using YieldStar: an angle resolved polarized scatterometer. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8169. 81690Q–81690Q. 1 indexed citations
8.
Vanoppen, Peter, et al.. (2008). Novel approach for immersion lithography defectivity control to increase productivity. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6922. 69223U–69223U. 3 indexed citations
9.
Setten, Eelco van, et al.. (2007). MacroCD contact ellipticity measurement for lithography tool qualification. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6518. 651837–651837. 1 indexed citations
10.
Vanoppen, Peter, et al.. (2007). Immersion-induced defect SEM-based library for fast baseline improvement and excursion. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6518. 65182G–65182G. 2 indexed citations
11.
Moers, M.H.P., et al.. (2005). Lithographic performance of a dual-stage 0.93NA ArF step and scan system. 65–65. 7 indexed citations
12.
Vanoppen, Peter, Thomas Gensch, Johan Hofkens, et al.. (2000). Mechanical and optical manipulation of porphyrin rings at the submicrometre scale. Nanotechnology. 11(1). 16–23. 20 indexed citations
13.
Finders, Jo, Peter Vanoppen, Mircea Dusa, et al.. (2000). KrF lithography for 130 nm. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4000. 192–192. 3 indexed citations
14.
Feyter, Steven De, Petrus C. M. Grim, Peter Vanoppen, et al.. (1998). Expression of Chirality by Achiral Coadsorbed Molecules in Chiral Monolayers Observed by STM. Angewandte Chemie International Edition. 37(9). 1223–1226. 88 indexed citations
15.
Rowan, Alan E., Peter Vanoppen, Loredana Latterini, et al.. (1998). Hexakis Porphyrinato Benzenes. A New Class of Porphyrin Arrays. Journal of the American Chemical Society. 120(43). 11054–11060. 122 indexed citations
16.
Ravishankar, R., Christine E. A. Kirschhock, Brian J. Schoeman, et al.. (1998). Physicochemical Characterization of Silicalite-1 Nanophase Material. The Journal of Physical Chemistry B. 102(15). 2633–2639. 162 indexed citations
17.
Ravishankar, R., Christine E. A. Kirschhock, Brian J. Schoeman, et al.. (1998). ChemInform Abstract: Physicochemical Characterization of Silicalite‐1 Nanophase Material.. ChemInform. 29(29). 1 indexed citations
18.
19.
Schryver, Frans C. De, et al.. (1997). Near-field scanning optical microscopy and polymers. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 131(1-4). 30–37. 4 indexed citations
20.
Hofkens, Johan, Loredana Latterini, Peter Vanoppen, et al.. (1997). Mesostructure of Evaporated Porphyrin Thin Films:  Porphyrin Wheel Formation. The Journal of Physical Chemistry B. 101(49). 10588–10598. 68 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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