Vincent Wiaux
- Electrical and Electronic Engineering top 2%
- Atomic and Molecular Physics, and Optics top 2%
- Biomedical Engineering top 10%
- Surfaces, Coatings and Films top 1%
- Hardware and Architecture top 5%
- Co-authors
- Wim BogaertsDirk TaillaertPieter DumonDries Van ThourhoutBert LuyssaertPeter BienstmanJoris Van CampenhoutRoel Baets
- Topics
- Advancements in Photolithography Techniques (49 papers)Integrated Circuits and Semiconductor Failure Analysis (24 papers)Photonic Crystals and Applications (21 papers)
- Cited by
- Surfaces, Coatings and FilmsAtomic and Molecular Physics, and OpticsElectrical and Electronic Engineering
- Partner nations
- BelgiumUnited StatesNetherlands
In The Last Decade
Vincent Wiaux
69 papers receiving 2.1k citations
Hit Papers
Peers
Comparison fields: 5 of 51
- Electrical and Electronic Engineering 2.1k
- Atomic and Molecular Physics, and Optics 1.3k
- Biomedical Engineering 417
- Surfaces, Coatings and Films 412
- Hardware and Architecture 102
Countries citing papers authored by Vincent Wiaux
This map shows the geographic impact of Vincent Wiaux's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Vincent Wiaux with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Vincent Wiaux more than expected).
Fields of papers citing papers by Vincent Wiaux
This network shows the impact of papers produced by Vincent Wiaux. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Vincent Wiaux. The network helps show where Vincent Wiaux may publish in the future.
Co-authorship network of co-authors of Vincent Wiaux
This figure shows the co-authorship network connecting the top 25 collaborators of Vincent Wiaux. A scholar is included among the top collaborators of Vincent Wiaux based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Vincent Wiaux. Vincent Wiaux is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 2 | |
| 3 | 2 | |
| 4 | 5 | |
| 5 | 7 | |
| 6 | 5 | |
| 7 | 8 | |
| 8 | 2 | |
| 9 | 3 | |
| 10 | 1 | |
| 11 | 4 | |
| 12 | Nanophotonic waveguides in silicon-on-insulator fabricated with CMOS technologybreakdown → | 657 |
| 13 | 10 | |
| 14 | 95 | |
| 15 | 22 | |
| 16 | 201 | |
| 17 | 5 | |
| 18 | Low-loss photonic wires and compact ring resonators in silicon-on-insulator | 4 |
| 19 | 113 | |
| 20 | 2 |
About Vincent Wiaux
Vincent Wiaux is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics, having authored 73 papers that have together received 2.2k indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (49 papers), Integrated Circuits and Semiconductor Failure Analysis (24 papers) and Photonic Crystals and Applications (21 papers). The work is most often cited by research in Surfaces, Coatings and Films (412 citations), Atomic and Molecular Physics, and Optics (1.3k citations) and Electrical and Electronic Engineering (2.1k citations). Vincent Wiaux has collaborated with scholars based in Belgium, United States and Netherlands. Frequent co-authors include Wim Bogaerts, Dirk Taillaert, Pieter Dumon, Dries Van Thourhout, Bert Luyssaert, Peter Bienstman, Joris Van Campenhout, Roel Baets, S. Beckx and S. Beckx. Their work appears in journals such as Optics Letters, Optics Express and Japanese Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.