S. Borel

662 citations
37 papers · 383 indexed · h-index 14

S. Borel

34 papers receiving 363 citations

Peers

S. Borel
Comparison fields: 5 of 26
  • Electrical and Electronic Engineering 363
  • Biomedical Engineering 131
  • Hardware and Architecture 18
  • Structural Biology 2
  • Atomic and Molecular Physics, and Optics 44
Replace Xiaopeng Xu with:
Xiaopeng Xu United States
G. Bouche France
T. Enot France
V. Lapras France
Maximilian Schmid Germany
R. Yu United States
Josef Weber Germany
C. Tabone France
Lieve Bogaerts Belgium
L. Shi United States
S. Borel relative to Xiaopeng Xu United States Xiaopeng Xu's profile →
Citations per field
00.5×3.2×
Xiaopeng Xu · 1×
Citations per year

Countries citing papers authored by S. Borel

Since Specialization
Citations

This map shows the geographic impact of S. Borel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Borel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Borel more than expected).

Fields of papers citing papers by S. Borel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Borel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Borel. The network helps show where S. Borel may publish in the future.

Co-authorship network

The 25 scholars most cited alongside S. Borel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. Borel Line = papers co-authored together S. Borel links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20242
2 20236
3 202313
4 20213
5 201818
6 20152
7 20131
8 20135
9 20097
10 20082
11 20077
12 20072
13 200723
14 20061
15 20058
16 200517
17 200417
18 200415
19 20041
20 200428

About S. Borel

S. Borel is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Automotive Engineering, Biomedical Engineering and Materials Chemistry, having authored 37 papers that have together received 383 indexed citations. Recurring topics across this work include Semiconductor materials and devices (21 papers), Advancements in Semiconductor Devices and Circuit Design (18 papers), 3D IC and TSV technologies (12 papers), Electronic Packaging and Soldering Technologies (10 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers), Silicon and Solar Cell Technologies (7 papers), Physical Unclonable Functions (PUFs) and Hardware Security (4 papers) and Thin-Film Transistor Technologies (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (363 citations), Biomedical Engineering (131 citations), Hardware and Architecture (18 citations), Structural Biology (2 citations) and Atomic and Molecular Physics, and Optics (44 citations). S. Borel has collaborated with scholars based in France, Czechia and Switzerland. Frequent co-authors include Jean‐Michel Hartmann, V. Destefanis, C. Vizioz, V. Maffini-Alvaro, M. Assous, T. Ernst, V. Delaye, C. Arvet, N. Bresson and D. Bensahel. Their work appears in journals such as Japanese Journal of Applied Physics, Microelectronic Engineering, Solid-State Electronics, MRS Communications and Applied Physics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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