D. Louis
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- Copper Interconnects and Reliability 16
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- Semiconductor materials and devices 19
- 3D IC and TSV technologies 7
- Integrated Circuits and Semiconductor Failure Analysis 6
- Advancements in Photolithography Techniques 5
- Advancements in Semiconductor Devices and Circuit Design 5
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- Advanced Surface Polishing Techniques 3
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- Semiconductor materials and interfaces 2
D. Louis
26 papers receiving 281 citations
Peers
Comparison fields: 5 of 30
- Electronic, Optical and Magnetic Materials 102
- Electrical and Electronic Engineering 269
- Mechanics of Materials 36
- Surfaces, Coatings and Films 10
- Biomedical Engineering 61
Countries citing papers authored by D. Louis
This map shows the geographic impact of D. Louis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Louis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Louis more than expected).
Fields of papers citing papers by D. Louis
This network shows the impact of papers produced by D. Louis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Louis. The network helps show where D. Louis may publish in the future.
Co-authorship network
The 25 scholars most cited alongside D. Louis, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2019 | 5 | |
| 2 | 2006 | 20 | |
| 3 | 2006 | 4 | |
| 4 | 2004 | 1 | |
| 5 | 2004 | 1 | |
| 6 | 2004 | 34 | |
| 7 | 2004 | 4 | |
| 8 | 2003 | 4 | |
| 9 | 2003 | 4 | |
| 10 | 2003 | 5 | |
| 11 | 2002 | 1 | |
| 12 | 2002 | 18 | |
| 13 | 2002 | 1 | |
| 14 | 2002 | 4 | |
| 15 | 2002 | 15 | |
| 16 | 2001 | 7 | |
| 17 | 2000 | 5 | |
| 18 | 1999 | 13 | |
| 19 | 1997 | 5 | |
| 20 | 1997 | 6 |
About D. Louis
D. Louis is a scholar working on Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering, Surfaces, Coatings and Films, Forestry and Atomic and Molecular Physics, and Optics, having authored 28 papers that have together received 295 indexed citations. Recurring topics across this work include Semiconductor materials and devices (19 papers), Copper Interconnects and Reliability (16 papers), 3D IC and TSV technologies (7 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Advancements in Photolithography Techniques (5 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers), Advanced Surface Polishing Techniques (3 papers) and Semiconductor materials and interfaces (2 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (102 citations), Electrical and Electronic Engineering (269 citations), Mechanics of Materials (36 citations), Surfaces, Coatings and Films (10 citations) and Biomedical Engineering (61 citations). D. Louis has collaborated with scholars based in France, Switzerland and United States. Frequent co-authors include D. Dutartre, T. Skotnicki, D.R. Holmes, Y. Morand, M. Assous, F. Leverd, S. Monfray, J. Farkas, G. Passemard and C. Vizioz. Their work appears in journals such as Microelectronic Engineering, Solid-State Electronics, JOURNAL OF RENEWABLE MATERIALS and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.