R. Palla
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Plasma Diagnostics and Applications
- Ferroelectric and Negative Capacitance Devices
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- Nanowire Synthesis and Applications
Papers in
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- Semiconductor materials and devices 13
- Advancements in Semiconductor Devices and Circuit Design 10
- Integrated Circuits and Semiconductor Failure Analysis 7
- Silicon Carbide Semiconductor Technologies 2
- Energy Harvesting in Wireless Networks 1
- Advancements in Photolithography Techniques 1
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- Semiconductor Quantum Structures and Devices 4
- Journals
- Quality and Reliability Engineering International (2 papers)Journal of Crystal Growth (1 paper)IEEE Transactions on Vehicular Technology (1 paper)Solid-State Electronics (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (1 paper)
In The Last Decade
R. Palla
14 papers receiving 221 citations
Peers
Comparison fields: 5 of 21
- Electrical and Electronic Engineering 234
- Biomedical Engineering 58
- Atomic and Molecular Physics, and Optics 39
- Surfaces, Coatings and Films 4
- Mechanics of Materials 12
Countries citing papers authored by R. Palla
This map shows the geographic impact of R. Palla's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Palla with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Palla more than expected).
Fields of papers citing papers by R. Palla
This network shows the impact of papers produced by R. Palla. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Palla. The network helps show where R. Palla may publish in the future.
Co-authorship network
The 25 scholars most cited alongside R. Palla, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 6 | |
| 2 | 2005 | 17 | |
| 3 | 2004 | 2 | |
| 4 | 2004 | 34 | |
| 5 | 2003 | 16 | |
| 6 | 2003 | 42 | |
| 7 | 2003 | 39 | |
| 8 | 2003 | 18 | |
| 9 | 2002 | 1 | |
| 10 | 2002 | 46 | |
| 11 | 2002 | 1 | |
| 12 | 2002 | 3 | |
| 13 | 1996 | 0 | |
| 14 | 1996 | 1 | |
| 15 | 1995 | 14 |
About R. Palla
R. Palla is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Aerospace Engineering, Biomedical Engineering and Materials Chemistry, having authored 15 papers that have together received 240 indexed citations. Recurring topics across this work include Semiconductor materials and devices (13 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Semiconductor Quantum Structures and Devices (4 papers), Silicon Carbide Semiconductor Technologies (2 papers), Energy Harvesting in Wireless Networks (1 paper), Advancements in Photolithography Techniques (1 paper) and Electronic and Structural Properties of Oxides (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (234 citations), Biomedical Engineering (58 citations), Atomic and Molecular Physics, and Optics (39 citations), Surfaces, Coatings and Films (4 citations) and Mechanics of Materials (12 citations). R. Palla has collaborated with scholars based in France and India. Frequent co-authors include T. Skotnicki, D. Dutartre, S. Monfray, P. Mazoyer, P. Ribot, O. Joubert, E. Pargon, L. Vallier, Y. Morand and G. Cunge. Their work appears in journals such as Quality and Reliability Engineering International, Journal of Crystal Growth, IEEE Transactions on Vehicular Technology, Solid-State Electronics and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.