John M. Hutson
- Electrical and Electronic Engineering top 10%
- Hardware and Architecture top 10%
- Electronic, Optical and Magnetic Materials
- Materials Chemistry
- Condensed Matter Physics
- Co-authors
- Ronald D. SchrimpfRobert A. ReedDennis R. BallArthur F. WitulskiK.F. GallowayAndrew L. SternbergMichael L. AllesRobert A. Johnson
- Topics
- Radiation Effects in Electronics (16 papers)Integrated Circuits and Semiconductor Failure Analysis (11 papers)Silicon Carbide Semiconductor Technologies (8 papers)
- Cited by
- Hardware and ArchitectureElectrical and Electronic EngineeringElectronic, Optical and Magnetic Materials
- Partner nations
- United StatesFinlandChina
In The Last Decade
John M. Hutson
18 papers receiving 380 citations
Peers
Comparison fields: 5 of 25
- Electrical and Electronic Engineering 391
- Hardware and Architecture 62
- Electronic, Optical and Magnetic Materials 30
- Materials Chemistry 29
- Condensed Matter Physics 17
Countries citing papers authored by John M. Hutson
This map shows the geographic impact of John M. Hutson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John M. Hutson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John M. Hutson more than expected).
Fields of papers citing papers by John M. Hutson
This network shows the impact of papers produced by John M. Hutson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John M. Hutson. The network helps show where John M. Hutson may publish in the future.
Co-authorship network of co-authors of John M. Hutson
This figure shows the co-authorship network connecting the top 25 collaborators of John M. Hutson. A scholar is included among the top collaborators of John M. Hutson based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with John M. Hutson. John M. Hutson is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 3 | |
| 3 | 19 | |
| 4 | 8 | |
| 5 | 6 | |
| 6 | 25 | |
| 7 | 16 | |
| 8 | 41 | |
| 9 | 9 | |
| 10 | 107 | |
| 11 | 20 | |
| 12 | 9 | |
| 13 | Analysis of Single-Event Latchup Cross Section in 65 nm SRAMs | 1 |
| 14 | 42 | |
| 15 | 17 | |
| 16 | 16 | |
| 17 | 43 | |
| 18 | 19 | |
| 19 | 3 |
About John M. Hutson
John M. Hutson is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Computer Networks and Communications, having authored 19 papers that have together received 404 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (16 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers) and Silicon Carbide Semiconductor Technologies (8 papers). The work is most often cited by research in Hardware and Architecture (62 citations), Electrical and Electronic Engineering (391 citations) and Electronic, Optical and Magnetic Materials (30 citations). John M. Hutson has collaborated with scholars based in United States, Finland and China. Frequent co-authors include Ronald D. Schrimpf, Robert A. Reed, Dennis R. Ball, Arthur F. Witulski, K.F. Galloway, Andrew L. Sternberg, Michael L. Alles, Robert A. Johnson, Jean‐Marie Lauenstein and Arto Javanainen. Their work appears in journals such as Journal of Applied Physics, IEEE Transactions on Nuclear Science and Materials science forum.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.