R. Baumann
- Hardware and Architecture top 0.2%
- VLSI and Analog Circuit Testing 17
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- Radiation Effects in Electronics 37
- Semiconductor materials and devices 19
- Integrated Circuits and Semiconductor Failure Analysis 14
- Photonic and Optical Devices 5
- Software top 5%
- Radiation top 2%
- Radiation Detection and Scintillator Technologies 6
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- Photorefractive and Nonlinear Optics 8
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- Particle Detector Development and Performance 6
- Co-authors
- E.B. SmithT. A. RabsonRobert A. WellerRonald D. SchrimpfMarcus H. MendenhallBrian D. SierawskiRobert A. ReedHaruaki Kitagawa
- Journals
- IEEE Transactions on Nuclear Science (17 papers)Nuclear Physics A (2 papers)Anesthesiology (2 papers)
- Partner nations
- United StatesBrazilUnited Kingdom
In The Last Decade
R. Baumann
63 papers receiving 3.2k citations
Hit Papers
Peers
Comparison fields: 5 of 118
- Hardware and Architecture 1.6k
- Electrical and Electronic Engineering 3.0k
- Software 127
- Radiation 257
- Safety, Risk, Reliability and Quality 173
Countries citing papers authored by R. Baumann
This map shows the geographic impact of R. Baumann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Baumann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Baumann more than expected).
Fields of papers citing papers by R. Baumann
This network shows the impact of papers produced by R. Baumann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Baumann. The network helps show where R. Baumann may publish in the future.
Co-authorship network
The 25 scholars most cited alongside R. Baumann, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 11 | |
| 2 | 2024 | 1 | |
| 3 | 2022 | 8 | |
| 4 | 2017 | 14 | |
| 5 | 2015 | 25 | |
| 6 | 2008 | 17 | |
| 7 | 2007 | 25 | |
| 8 | Radiation-induced soft errors in advanced semiconductor technologiesbreakdown → | 2005 | 1022 |
| 9 | 2004 | 26 | |
| 10 | 2004 | 20 | |
| 11 | 2002 | 1 | |
| 12 | 1999 | 63 | |
| 13 | 1999 | 11 | |
| 14 | 1997 | 41 | |
| 15 | 1997 | 6 | |
| 16 | 1995 | 3 | |
| 17 | 1995 | 11 | |
| 18 | 1991 | 16 | |
| 19 | Discussion of the beam geometry in a ring laser gyro in relation to its performance | 1984 | 1 |
| 20 | 1964 | 2 |
About R. Baumann
R. Baumann is a scholar working on Hardware and Architecture, Radiation, Electrical and Electronic Engineering, Nuclear and High Energy Physics and Safety, Risk, Reliability and Quality, having authored 69 papers that have together received 3.4k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (37 papers), Semiconductor materials and devices (19 papers), VLSI and Analog Circuit Testing (17 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers), Photorefractive and Nonlinear Optics (8 papers), Particle Detector Development and Performance (6 papers), Radiation Detection and Scintillator Technologies (6 papers) and Photonic and Optical Devices (5 papers). The work is most often cited by research in Hardware and Architecture (1.6k citations), Electrical and Electronic Engineering (3.0k citations), Software (127 citations), Radiation (257 citations) and Safety, Risk, Reliability and Quality (173 citations). R. Baumann has collaborated with scholars based in United States, Brazil and United Kingdom. Frequent co-authors include E.B. Smith, T. A. Rabson, Robert A. Weller, Ronald D. Schrimpf, Marcus H. Mendenhall, Brian D. Sierawski, Robert A. Reed, Haruaki Kitagawa, Shunsuke Murata and Gilles Bertschy. Their work appears in journals such as IEEE Transactions on Nuclear Science, Nuclear Physics A, Anesthesiology, Journal of Applied Physics and IEEE Transactions on Device and Materials Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.