Arthur F. Witulski

138 papers receiving 3.7k citations

Hit Papers

Charge Collection and Charge Sharing in a 130 nm CMOS Tec...20062026201220192006100200300

Peers

Arthur F. Witulski
Comparison fields: 5 of 60
  • Electrical and Electronic Engineering 3.8k
  • Hardware and Architecture 1.1k
  • Control and Systems Engineering 335
  • Mechanical Engineering 160
  • Automotive Engineering 150
Replace P. Hazucha with:
P. Hazucha United States
Shi-Jie Wen United States
B. L. Bhuva United States
Chang Chen United States
J.B. Bernstein United States
Richard Wong United States
D. Navarro Spain
T.H. Hubing United States
Allen R. Hefner United States
Arthur F. Witulski relative to P. Hazucha United States P. Hazucha's profile →
Citations per field
00.5×7.2×
P. Hazucha · 1×
Citations per year

Countries citing papers authored by Arthur F. Witulski

Since Specialization
Citations

This map shows the geographic impact of Arthur F. Witulski's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Arthur F. Witulski with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Arthur F. Witulski more than expected).

Fields of papers citing papers by Arthur F. Witulski

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Arthur F. Witulski. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Arthur F. Witulski. The network helps show where Arthur F. Witulski may publish in the future.

Co-authorship network of co-authors of Arthur F. Witulski

This figure shows the co-authorship network connecting the top 25 collaborators of Arthur F. Witulski. A scholar is included among the top collaborators of Arthur F. Witulski based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Arthur F. Witulski. Arthur F. Witulski is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
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4 19
5 8
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8 1
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14 125
15 93
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About Arthur F. Witulski

Arthur F. Witulski is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Statistics, Probability and Uncertainty, having authored 140 papers that have together received 3.9k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (91 papers), Semiconductor materials and devices (37 papers) and VLSI and Analog Circuit Testing (35 papers). The work is most often cited by research in Hardware and Architecture (1.1k citations), Electrical and Electronic Engineering (3.8k citations) and Control and Systems Engineering (335 citations). Arthur F. Witulski has collaborated with scholars based in United States, China and Finland. Frequent co-authors include L. W. Massengill, B. L. Bhuva, Ronald D. Schrimpf, Robert W. Erickson, Andrew L. Sternberg, Michael L. Alles, Oluwole A. Amusan, K.F. Galloway, Dennis R. Ball and Jeffrey D. Black. Their work appears in journals such as IEEE Transactions on Power Electronics, IEEE Journal of Solid-State Circuits and IEEE Transactions on Aerospace and Electronic Systems.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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