Arthur F. Witulski

6.5k citations

140 papers · 3.9k indexed · 1 hit paper · h-index 36

Hardware and Architecture top 0.5%
- VLSI and Analog Circuit Testing 35
Electrical and Electronic Engineering top 1%
- Radiation Effects in Electronics 91
- Semiconductor materials and devices 37
- Advanced DC-DC Converters 32
- Integrated Circuits and Semiconductor Failure Analysis 27
- Silicon Carbide Semiconductor Technologies 22
- Low-power high-performance VLSI design 17
- Electrostatic Discharge in Electronics 14
Control and Systems Engineering top 5%
Automotive Engineering top 5%
Condensed Matter Physics top 10%

Co-authors: L. W. Massengill B. L. Bhuva Ronald D. Schrimpf Robert W. Erickson Andrew L. Sternberg Michael L. Alles Oluwole A. Amusan K.F. Galloway
Cited by: Hardware and Architecture Electrical and Electronic Engineering Control and Systems Engineering
Journals: IEEE Transactions on Power Electronics (12 papers)IEEE Journal of Solid-State Circuits (1 paper)IEEE Transactions on Aerospace and Electronic Systems (6 papers)
Partner nations: United States China Finland

In The Last Decade

Arthur F. Witulski

138 papers receiving 3.7k citations

Hit Papers

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Peers

Countries citing papers authored by Arthur F. Witulski

Since Specialization

Citations

This map shows the geographic impact of Arthur F. Witulski's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Arthur F. Witulski with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Arthur F. Witulski more than expected).

Fields of papers citing papers by Arthur F. Witulski

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Arthur F. Witulski. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Arthur F. Witulski. The network helps show where Arthur F. Witulski may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Arthur F. Witulski, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Arthur F. Witulski Line = papers co-authored together Arthur F. Witulski links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Effects of Incident Angle on Single-Event Leakage Current Degradation in Heavy-Ion Irradiated 1800- and 4500-V SiC Power MOSFETs IEEE Transactions on Nuclear Science ·Arijit Sengupta,C. Martinella,Dennis R. Ball,K. Niskanen,A. S. Senarath,S. Islam,P. M. Harris,John M. Hutson,Jason M. Osheroff,Andrew L. Sternberg,H. Kettunen,S.L. Kosier,Ulrike Großner,Arto Javanainen,K.F. Galloway,Ronald D. Schrimpf,Arthur F. Witulski	2025	0
2	Effects of Epitaxial Layer Thickness on Heavy Ion-Induced Single-Event Burnout in Vertical β-Ga₂O₃ Schottky Barrier Diodes IEEE Transactions on Nuclear Science ·S. Islam,A. S. Senarath,Esmat Farzana,Dennis R. Ball,Arijit Sengupta,Andrew L. Sternberg,Robert A. Reed,Sokrates T. Pantelides,Arthur F. Witulski,James S. Speck,Daniel M. Fleetwood,Ronald D. Schrimpf	2025	2
3	Physical Model for SiC Power Device Heavy-Ion Burnout Based on Pre-Strike Depletion Capacitance Energy Storage IEEE Transactions on Nuclear Science ·S.L. Kosier,Arijit Sengupta,Dennis R. Ball,John M. Hutson,Andrew L. Sternberg,S. Islam,Arthur F. Witulski,Ronald D. Schrimpf,K.F. Galloway,Michael L. Alles,Jason M. Osheroff	2025	3
4	LET and Voltage Dependence of Single-Event Burnout and Single-Event Leakage Current in High-Voltage SiC Power Devices IEEE Transactions on Nuclear Science ·Arijit Sengupta,Dennis R. Ball,Andrew L. Sternberg,S. Islam,A. S. Senarath,Robert A. Reed,Michael W. McCurdy,En Xia Zhang,John M. Hutson,Michael L. Alles,Jason M. Osheroff,Biju Jacob,Collin Hitchcock,Shubhodeep Goswami,Ronald D. Schrimpf,K.F. Galloway,Arthur F. Witulski	2024	19
5	Single-Event Effects in Heavy-Ion Irradiated 3-kV SiC Charge-Balanced Power Devices IEEE Transactions on Nuclear Science ·Arijit Sengupta,Dennis R. Ball,S. Islam,A. S. Senarath,Andrew L. Sternberg,En Xia Zhang,Michael L. Alles,Jason M. Osheroff,Reza Ghandi,Biju Jacob,Shubhodeep Goswami,Collin Hitchcock,John M. Hutson,Robert A. Reed,K.F. Galloway,Ronald D. Schrimpf,Arthur F. Witulski	2024	8
6	Incorporating Component-Level Testing Into Bayesian Degradation Distributions to Estimate a Voltage Regulator’s Radiation Failure Probabilities IEEE Transactions on Nuclear Science ·Richard H. Nederlander,Arthur F. Witulski,Robert A. Reed,Gábor Karsai,Ray Ladbury,En Xia Zhang,Ronald D. Schrimpf,Kaitlyn L. Ryder,Michael J. Campola,Nag Mahadevan,Rebekah Austin,Brian D. Sierawski	2023	1
7	Modeling COTS System TID Response With Monte Carlo Sampling and Transistor Swapping Experiments IEEE Transactions on Nuclear Science ·M. Brandon Smith,Arthur F. Witulski,J. S. Kauppila,Andrew L. Sternberg,Kaitlyn L. Ryder,Nagabhushan Mahadevan,Ronald D. Schrimpf	2021	1
8	A System-Level Modeling Approach for Simulating Radiation Effects in Successive-Approximation Analog-to-Digital Converters IEEE Transactions on Nuclear Science ·M. W. Rony,En Xia Zhang,Mahmud Reaz,K. Li,Andrew Daniel,B.G. Rax,Philippe C. Adell,J. S. Kauppila,Gábor Karsai,Tim Holman,Robert A. Reed,Arthur F. Witulski,Ronald D. Schrimpf	2021	1
9	Analysis of Temporal Masking Effects on Master- and Slave-Type Flip-Flop SEUs and Related Applications IEEE Transactions on Nuclear Science ·Rongmei Chen,N. N. Mahatme,Z. J. Diggins,L. Wang,En Xia Zhang,Yanran P. Chen,Y. N. Liu,Balaji Narasimham,Arthur F. Witulski,B. L. Bhuva,Daniel M. Fleetwood	2018	2
10	Towards a Framework for Reliability and Safety Analysis of Complex Space Missions John Evans,Frank Groen,Lui Wang,Rebekah Austin,Arthur F. Witulski,Steven L. Cornford,Martin S. Feather,Nancy J. Lindsey	2017	8
11	Impact of Temporal Masking of Flip-Flop Upsets on Soft Error Rates of Sequential Circuits IEEE Transactions on Nuclear Science ·Rongmei Chen,N. N. Mahatme,Z. J. Diggins,Liang Wang,En Xia Zhang,Yanran P. Chen,Yi Liu,Balaji Narasimham,Arthur F. Witulski,B. L. Bhuva,Dan Fleetwood	2017	12
12	Effects of Temperature and Supply Voltage on SEU- and SET-Induced Errors in Bulk 40-nm Sequential Circuits IEEE Transactions on Nuclear Science ·Rongmei Chen,Z. J. Diggins,N. N. Mahatme,Liang Wang,En Xia Zhang,Yanran P. Chen,H. Zhang,Y. N. Liu,Balaji Narasimham,Arthur F. Witulski,B. L. Bhuva,Dan Fleetwood	2017	11
13	Mobility Modeling Considerations for Radiation Effects Simulations in Silicon IEEE Transactions on Nuclear Science ·Daniel J. Cummings,Arthur F. Witulski,Hyunwoo Park,Ronald D. Schrimpf,Scott E. Thompson,Mark E. Law	2010	4
14	On-Chip Characterization of Single-Event Transient Pulsewidths IEEE Transactions on Device and Materials Reliability ·Balaji Narasimham,Vishwa Ramachandran,B. L. Bhuva,Ronald D. Schrimpf,Arthur F. Witulski,William Timothy Holman,L. W. Massengill,J. D. Black,William H. Robinson,Dale McMorrow	2006	125
15	HBD layout isolation techniques for multiple node charge collection mitigation IEEE Transactions on Nuclear Science ·Jeffrey D. Black,Andrew L. Sternberg,Michael L. Alles,Arthur F. Witulski,B. L. Bhuva,L. W. Massengill,J.M. Benedetto,M.P. Baze,J.L. Wert,M. G. Hubert	2005	93
16	Application of a constant-output-power converter in multiple-module converter systems John Glaser,Arthur F. Witulski	2003	10
17	Design issues for high power factor AC-DC converter systems John Glaser,Arthur F. Witulski	2002	7
18	Analytic solutions for LLCC parallel resonant converter simplify use of twoand three-element converters IEEE Transactions on Power Electronics ·Jung-Hui Cheng,Arthur F. Witulski	1998	22
19	Extension of state-space averaging to resonant switches and beyond IEEE Transactions on Power Electronics ·Arthur F. Witulski,Robert W. Erickson	1990	86
20	Design of the Series Resonant Converter for Minimum Component Stress IEEE Transactions on Aerospace and Electronic Systems ·Arthur F. Witulski,Robert W. Erickson	1986	50

About Arthur F. Witulski

Arthur F. Witulski is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Statistics, Probability and Uncertainty, having authored 140 papers that have together received 3.9k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (91 papers), Semiconductor materials and devices (37 papers), VLSI and Analog Circuit Testing (35 papers), Advanced DC-DC Converters (32 papers), Integrated Circuits and Semiconductor Failure Analysis (27 papers), Silicon Carbide Semiconductor Technologies (22 papers), Low-power high-performance VLSI design (17 papers) and Electrostatic Discharge in Electronics (14 papers). The work is most often cited by research in Hardware and Architecture (1.1k citations), Electrical and Electronic Engineering (3.8k citations) and Control and Systems Engineering (335 citations). Arthur F. Witulski has collaborated with scholars based in United States, China and Finland. Frequent co-authors include L. W. Massengill, B. L. Bhuva, Ronald D. Schrimpf, Robert W. Erickson, Andrew L. Sternberg, Michael L. Alles, Oluwole A. Amusan, K.F. Galloway, Dennis R. Ball and Jeffrey D. Black. Their work appears in journals such as IEEE Transactions on Power Electronics, IEEE Journal of Solid-State Circuits and IEEE Transactions on Aerospace and Electronic Systems.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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