Dennis R. Ball

3.0k total citations
113 papers, 2.3k citations indexed

About

Dennis R. Ball is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Dennis R. Ball has authored 113 papers receiving a total of 2.3k indexed citations (citations by other indexed papers that have themselves been cited), including 113 papers in Electrical and Electronic Engineering, 33 papers in Hardware and Architecture and 6 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Dennis R. Ball's work include Radiation Effects in Electronics (87 papers), Semiconductor materials and devices (63 papers) and Integrated Circuits and Semiconductor Failure Analysis (47 papers). Dennis R. Ball is often cited by papers focused on Radiation Effects in Electronics (87 papers), Semiconductor materials and devices (63 papers) and Integrated Circuits and Semiconductor Failure Analysis (47 papers). Dennis R. Ball collaborates with scholars based in United States, Finland and United Kingdom. Dennis R. Ball's co-authors include Ronald D. Schrimpf, L. W. Massengill, Michael L. Alles, Robert A. Reed, B. L. Bhuva, Arthur F. Witulski, Andrew L. Sternberg, Kevin M. Warren, K.F. Galloway and Jean‐Marie Lauenstein and has published in prestigious journals such as Applied Physics Letters, Journal of The Electrochemical Society and Optics Communications.

In The Last Decade

Dennis R. Ball

105 papers receiving 2.2k citations

Peers

Countries citing papers authored by Dennis R. Ball

Since Specialization

Citations

This map shows the geographic impact of Dennis R. Ball's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Dennis R. Ball with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Dennis R. Ball more than expected).

Fields of papers citing papers by Dennis R. Ball

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Dennis R. Ball. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Dennis R. Ball. The network helps show where Dennis R. Ball may publish in the future.

Co-authorship network of co-authors of Dennis R. Ball

This figure shows the co-authorship network connecting the top 25 collaborators of Dennis R. Ball. A scholar is included among the top collaborators of Dennis R. Ball based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Dennis R. Ball. Dennis R. Ball is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Effects of Incident Angle on Single-Event Leakage Current Degradation in Heavy-Ion Irradiated 1800- and 4500-V SiC Power MOSFETs 2025 ·IEEE Transactions on Nuclear Science ·(unknown), C. Martinella, Dennis R. Ball, (unknown), (unknown), (unknown), (unknown), John M. Hutson, (unknown), Andrew L. Sternberg, (unknown), S.L. Kosier, Ulrike Großner, Arto Javanainen, K.F. Galloway, Ronald D. Schrimpf, Arthur F. Witulski	0
2	Single-Event Upsets Due to n-Hits and p-Hits at the 3-nm Bulk FinFET Node 2025 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), (unknown), Dennis R. Ball, B. L. Bhuva	0
3	Single-event burnout in homojunction GaN vertical PiN diodes with hybrid edge termination design 2024 ·Applied Physics Letters ·(unknown), (unknown), (unknown), Michael W. McCurdy, Travis J. Anderson, Alan G. Jacobs, Robert Kaplar, Dennis R. Ball, En Xia Zhang, Sokrates T. Pantelides, Robert A. Reed, Mona A. Ebrish, Daniel M. Fleetwood, Joshua D. Caldwell, Ronald D. Schrimpf	8
4	Multicell Upsets in Flip-Flops in Advanced FinFET Nodes 2024 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), (unknown), C. Sánchez, M.J. Delaney, Dennis R. Ball, Megan C. Casey, Rita Fung, B. L. Bhuva	2
5	Effects of TID on SRAM Data Retention Stability at the 5-nm Node 2023 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), (unknown), Dennis R. Ball, B. L. Bhuva	2
6	Evaluation of the Single-Event-Upset Vulnerability for Low-Energy Protons at the 7- and 5-nm Bulk FinFET Nodes 2023 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), Michael W. McCurdy, Dennis R. Ball, (unknown), B. L. Bhuva	4
7	On-Chip Emulation and Measurement of Variable-Length Photocurrents in Sub-50nm ICs 2023 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), (unknown), Michael L. Alles, Dennis R. Ball, Andrew L. Sternberg, En Xia Zhang, W.T. Holman, J. S. Kauppila, L. W. Massengill	1
8	Single-Event Upsets for Single-Port and Two-Port SRAM Cells at the 5-nm FinFET Technology 2023 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), (unknown), Nathaniel A. Dodds, Dennis R. Ball, B. L. Bhuva	2
9	Study of Multicell Upsets in SRAM at a 5-nm Bulk FinFET Node 2023 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), (unknown), (unknown), Nathaniel A. Dodds, Dennis R. Ball, B. L. Bhuva	9
10	Mitigating Total-Ionizing-Dose-Induced Threshold-Voltage Shifts Using Back-Gate Biasing in 22-nm FD-SOI Transistors 2022 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), (unknown), J. S. Kauppila, T. D. Haeffner, Dennis R. Ball, En Xia Zhang, Kevin M. Warren, Michael L. Alles, L. W. Massengill	5
11	In Situ Measurement of TID-Induced Leakage Using On-Chip Frequency Modulation 2021 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), (unknown), (unknown), (unknown), En Xia Zhang, Dennis R. Ball, T. D. Haeffner, Michael L. Alles, J. S. Kauppila, L. W. Massengill	3
12	Modeling Logic Error Single-Event Cross Sections at the 7-nm Bulk FinFET Technology Node 2021 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), Dennis R. Ball, B. L. Bhuva	3
13	Empirical Modeling of FinFET SEU Cross Sections Across Supply Voltage 2019 ·IEEE Transactions on Nuclear Science ·(unknown), J. S. Kauppila, (unknown), T. D. Haeffner, Andrew L. Sternberg, En Xia Zhang, Dennis R. Ball, (unknown), B. L. Bhuva, L. W. Massengill	10
14	Exploiting SEU Data Analysis to Extract Fast SET Pulses 2019 ·IEEE Transactions on Nuclear Science ·(unknown), J. S. Kauppila, (unknown), T. D. Haeffner, En Xia Zhang, Dennis R. Ball, (unknown), Michael L. Alles, B. L. Bhuva, L. W. Massengill	1
15	A Bias-Dependent Single-Event-Enabled Compact Model for Bulk FinFET Technologies 2019 ·IEEE Transactions on Nuclear Science ·J. S. Kauppila, Dennis R. Ball, (unknown), (unknown), T. D. Haeffner, Andrew L. Sternberg, Michael L. Alles, L. W. Massengill	9
16	Effect of Transistor Variants on Single-Event Transients at the 14-/16-nm Bulk FinFET Technology Generation 2018 ·IEEE Transactions on Nuclear Science ·(unknown), (unknown), J. S. Kauppila, (unknown), Dennis R. Ball, T. D. Haeffner, En Xia Zhang, B. L. Bhuva, L. W. Massengill	17
17	Dual-Interlocked Logic for Single-Event Transient Mitigation 2017 ·IEEE Transactions on Nuclear Science ·(unknown), J. S. Kauppila, (unknown), (unknown), Dennis R. Ball, T. D. Haeffner, En Xia Zhang, B. L. Bhuva, W.T. Holman, L. W. Massengill	11
18	The Impact of Charge Collection Volume and Parasitic Capacitance on SEUs in SOI- and Bulk-FinFET D Flip-Flops 2017 ·IEEE Transactions on Nuclear Science ·Dennis R. Ball, Michael L. Alles, J. S. Kauppila, (unknown), (unknown), (unknown), T. D. Haeffner, (unknown), Andrew L. Sternberg, En Xia Zhang, B. L. Bhuva, L. W. Massengill	21
19	Impact of Single-Event Transient Duration and Electrical Delay at Reduced Supply Voltages on SET Mitigation Techniques 2017 ·IEEE Transactions on Nuclear Science ·(unknown), J. S. Kauppila, (unknown), (unknown), Dennis R. Ball, T. D. Haeffner, En Xia Zhang, B. L. Bhuva, W.T. Holman, L. W. Massengill	13
20	Exploiting Parallelism and Heterogeneity in a Radiation Effects Test Vehicle for Efficient Single-Event Characterization of Nanoscale Circuits 2017 ·IEEE Transactions on Nuclear Science ·J. S. Kauppila, (unknown), (unknown), T. D. Haeffner, (unknown), Dennis R. Ball, Andrew L. Sternberg, En Xia Zhang, B. L. Bhuva, L. W. Massengill	14

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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