Dennis R. Ball

3.0k citations

113 papers · 2.3k indexed · h-index 26

Hardware and Architecture top 1%
- VLSI and Analog Circuit Testing 29
Electrical and Electronic Engineering top 2%
- Radiation Effects in Electronics 87
- Semiconductor materials and devices 63
- Integrated Circuits and Semiconductor Failure Analysis 47
- Advancements in Semiconductor Devices and Circuit Design 35
- Low-power high-performance VLSI design 13
- Silicon Carbide Semiconductor Technologies 13
- Electrostatic Discharge in Electronics 8
Radiation top 10%
Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Co-authors: Ronald D. Schrimpf L. W. Massengill Michael L. Alles Robert A. Reed B. L. Bhuva Arthur F. Witulski Andrew L. Sternberg Kevin M. Warren
Cited by: Hardware and Architecture Electrical and Electronic Engineering Radiation
Journals: Applied Physics Letters (2 papers)Journal of The Electrochemical Society (1 paper)Optics Communications (1 paper)
Partner nations: United States Finland United Kingdom

In The Last Decade

Dennis R. Ball

105 papers receiving 2.2k citations

Peers

Countries citing papers authored by Dennis R. Ball

Since Specialization

Citations

This map shows the geographic impact of Dennis R. Ball's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Dennis R. Ball with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Dennis R. Ball more than expected).

Fields of papers citing papers by Dennis R. Ball

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Dennis R. Ball. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Dennis R. Ball. The network helps show where Dennis R. Ball may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Dennis R. Ball, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Dennis R. Ball Line = papers co-authored together Dennis R. Ball links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Effects of Incident Angle on Single-Event Leakage Current Degradation in Heavy-Ion Irradiated 1800- and 4500-V SiC Power MOSFETs IEEE Transactions on Nuclear Science ·Arijit Sengupta,C. Martinella,Dennis R. Ball,K. Niskanen,A. S. Senarath,S. Islam,P. M. Harris,John M. Hutson,Jason M. Osheroff,Andrew L. Sternberg,H. Kettunen,S.L. Kosier,Ulrike Großner,Arto Javanainen,K.F. Galloway,Ronald D. Schrimpf,Arthur F. Witulski	2025	0
2	Single-Event Upsets Due to n-Hits and p-Hits at the 3-nm Bulk FinFET Node IEEE Transactions on Nuclear Science ·Jenna B. Kronenberg,Nicholas J. Pieper,Yoni Xiong,Dennis R. Ball,B. L. Bhuva	2025	0
3	Single-event burnout in homojunction GaN vertical PiN diodes with hybrid edge termination design Applied Physics Letters ·A. S. Senarath,S. Islam,Arijit Sengupta,Michael W. McCurdy,Travis J. Anderson,Alan G. Jacobs,Robert Kaplar,Dennis R. Ball,En Xia Zhang,Sokrates T. Pantelides,Robert A. Reed,Mona A. Ebrish,Daniel M. Fleetwood,Joshua D. Caldwell,Ronald D. Schrimpf	2024	8
4	Multicell Upsets in Flip-Flops in Advanced FinFET Nodes IEEE Transactions on Nuclear Science ·Nicholas J. Pieper,Yoni Xiong,Jenna B. Kronenberg,C. Sánchez,M.J. Delaney,Dennis R. Ball,Megan C. Casey,Rita Fung,B. L. Bhuva	2024	2
5	Effects of TID on SRAM Data Retention Stability at the 5-nm Node IEEE Transactions on Nuclear Science ·Nicholas J. Pieper,Yoni Xiong,John Pasternak,Dennis R. Ball,B. L. Bhuva	2023	2
6	Evaluation of the Single-Event-Upset Vulnerability for Low-Energy Protons at the 7- and 5-nm Bulk FinFET Nodes IEEE Transactions on Nuclear Science ·Yoni Xiong,Nicholas J. Pieper,Michael W. McCurdy,Dennis R. Ball,Brian D. Sierwaski,B. L. Bhuva	2023	4
7	On-Chip Emulation and Measurement of Variable-Length Photocurrents in Sub-50nm ICs IEEE Transactions on Nuclear Science ·Joseph V. D’Amico,Sean T. Vibbert,Rick M. Cadena,Michael L. Alles,Dennis R. Ball,Andrew L. Sternberg,En Xia Zhang,W.T. Holman,J. S. Kauppila,L. W. Massengill	2023	1
8	Single-Event Upsets for Single-Port and Two-Port SRAM Cells at the 5-nm FinFET Technology IEEE Transactions on Nuclear Science ·Nicholas J. Pieper,Yoni Xiong,John Pasternak,Nathaniel A. Dodds,Dennis R. Ball,B. L. Bhuva	2023	2
9	Study of Multicell Upsets in SRAM at a 5-nm Bulk FinFET Node IEEE Transactions on Nuclear Science ·Nicholas J. Pieper,Yoni Xiong,A. Feeley,John Pasternak,Nathaniel A. Dodds,Dennis R. Ball,B. L. Bhuva	2023	9
10	Mitigating Total-Ionizing-Dose-Induced Threshold-Voltage Shifts Using Back-Gate Biasing in 22-nm FD-SOI Transistors IEEE Transactions on Nuclear Science ·A. C. Watkins,Sean T. Vibbert,Joseph V. D’Amico,J. S. Kauppila,T. D. Haeffner,Dennis R. Ball,En Xia Zhang,Kevin M. Warren,Michael L. Alles,L. W. Massengill	2022	5
11	In Situ Measurement of TID-Induced Leakage Using On-Chip Frequency Modulation IEEE Transactions on Nuclear Science ·Sean T. Vibbert,A. C. Watkins,Joseph V. D’Amico,M. W. McKinney,D. S. Vibbert,En Xia Zhang,Dennis R. Ball,T. D. Haeffner,Michael L. Alles,J. S. Kauppila,L. W. Massengill	2021	3
12	Modeling Logic Error Single-Event Cross Sections at the 7-nm Bulk FinFET Technology Node IEEE Transactions on Nuclear Science ·Yoni Xiong,A. Feeley,Dennis R. Ball,B. L. Bhuva	2021	3
13	Empirical Modeling of FinFET SEU Cross Sections Across Supply Voltage IEEE Transactions on Nuclear Science ·R. C. Harrington,J. S. Kauppila,J. A. Maharrey,T. D. Haeffner,Andrew L. Sternberg,En Xia Zhang,Dennis R. Ball,Patrick Nsengiyumva,B. L. Bhuva,L. W. Massengill	2019	10
14	Exploiting SEU Data Analysis to Extract Fast SET Pulses IEEE Transactions on Nuclear Science ·R. C. Harrington,J. S. Kauppila,J. A. Maharrey,T. D. Haeffner,En Xia Zhang,Dennis R. Ball,Patrick Nsengiyumva,Michael L. Alles,B. L. Bhuva,L. W. Massengill	2019	1
15	A Bias-Dependent Single-Event-Enabled Compact Model for Bulk FinFET Technologies IEEE Transactions on Nuclear Science ·J. S. Kauppila,Dennis R. Ball,J. A. Maharrey,R. C. Harrington,T. D. Haeffner,Andrew L. Sternberg,Michael L. Alles,L. W. Massengill	2019	9
16	Effect of Transistor Variants on Single-Event Transients at the 14-/16-nm Bulk FinFET Technology Generation IEEE Transactions on Nuclear Science ·R. C. Harrington,J. A. Maharrey,J. S. Kauppila,Patrick Nsengiyumva,Dennis R. Ball,T. D. Haeffner,En Xia Zhang,B. L. Bhuva,L. W. Massengill	2018	17
17	Dual-Interlocked Logic for Single-Event Transient Mitigation IEEE Transactions on Nuclear Science ·J. A. Maharrey,J. S. Kauppila,R. C. Harrington,Patrick Nsengiyumva,Dennis R. Ball,T. D. Haeffner,En Xia Zhang,B. L. Bhuva,W.T. Holman,L. W. Massengill	2017	11
18	The Impact of Charge Collection Volume and Parasitic Capacitance on SEUs in SOI- and Bulk-FinFET D Flip-Flops IEEE Transactions on Nuclear Science ·Dennis R. Ball,Michael L. Alles,J. S. Kauppila,R. C. Harrington,J. A. Maharrey,Patrick Nsengiyumva,T. D. Haeffner,J. D. Rowe,Andrew L. Sternberg,En Xia Zhang,B. L. Bhuva,L. W. Massengill	2017	21
19	Impact of Single-Event Transient Duration and Electrical Delay at Reduced Supply Voltages on SET Mitigation Techniques IEEE Transactions on Nuclear Science ·J. A. Maharrey,J. S. Kauppila,R. C. Harrington,Patrick Nsengiyumva,Dennis R. Ball,T. D. Haeffner,En Xia Zhang,B. L. Bhuva,W.T. Holman,L. W. Massengill	2017	13
20	Exploiting Parallelism and Heterogeneity in a Radiation Effects Test Vehicle for Efficient Single-Event Characterization of Nanoscale Circuits IEEE Transactions on Nuclear Science ·J. S. Kauppila,J. A. Maharrey,R. C. Harrington,T. D. Haeffner,Patrick Nsengiyumva,Dennis R. Ball,Andrew L. Sternberg,En Xia Zhang,B. L. Bhuva,L. W. Massengill	2017	14

About Dennis R. Ball

Dennis R. Ball is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, having authored 113 papers that have together received 2.3k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (87 papers), Semiconductor materials and devices (63 papers), Integrated Circuits and Semiconductor Failure Analysis (47 papers), Advancements in Semiconductor Devices and Circuit Design (35 papers), VLSI and Analog Circuit Testing (29 papers), Low-power high-performance VLSI design (13 papers), Silicon Carbide Semiconductor Technologies (13 papers) and Electrostatic Discharge in Electronics (8 papers). The work is most often cited by research in Hardware and Architecture (613 citations), Electrical and Electronic Engineering (2.2k citations) and Radiation (65 citations). Dennis R. Ball has collaborated with scholars based in United States, Finland and United Kingdom. Frequent co-authors include Ronald D. Schrimpf, L. W. Massengill, Michael L. Alles, Robert A. Reed, B. L. Bhuva, Arthur F. Witulski, Andrew L. Sternberg, Kevin M. Warren, K.F. Galloway and Jean‐Marie Lauenstein. Their work appears in journals such as Applied Physics Letters, Journal of The Electrochemical Society and Optics Communications.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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