M. King

8.1k total citations
43 papers, 994 citations indexed

About

M. King is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, M. King has authored 43 papers receiving a total of 994 indexed citations (citations by other indexed papers that have themselves been cited), including 40 papers in Electrical and Electronic Engineering, 11 papers in Condensed Matter Physics and 5 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in M. King's work include Semiconductor materials and devices (26 papers), Integrated Circuits and Semiconductor Failure Analysis (19 papers) and Radiation Effects in Electronics (19 papers). M. King is often cited by papers focused on Semiconductor materials and devices (26 papers), Integrated Circuits and Semiconductor Failure Analysis (19 papers) and Radiation Effects in Electronics (19 papers). M. King collaborates with scholars based in United States, Belgium and Netherlands. M. King's co-authors include Robert Kaplar, Andrew A. Allerman, Andrew Armstrong, Ronald D. Schrimpf, Hugh Barnaby, Ivan Sanchez Esqueda, Robert A. Reed, Robert A. Weller, Jeramy Ray Dickerson and Marcus H. Mendenhall and has published in prestigious journals such as Applied Physics Letters, IEEE Transactions on Power Electronics and IEEE Transactions on Electron Devices.

In The Last Decade

M. King

42 papers receiving 943 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. King United States 18 870 361 218 123 115 43 994
Arto Javanainen Finland 21 1.3k 1.5× 49 0.1× 55 0.3× 76 0.6× 101 0.9× 69 1.4k
Toshio Hirao Japan 14 627 0.7× 57 0.2× 28 0.1× 57 0.5× 56 0.5× 68 695
D.S. Yaney United States 9 281 0.3× 85 0.2× 73 0.3× 128 1.0× 54 0.5× 17 514
Bongim Jun United States 14 459 0.5× 227 0.6× 169 0.8× 74 0.6× 16 0.1× 22 567
Nicolas J.-H. Roche United States 16 506 0.6× 47 0.1× 27 0.1× 51 0.4× 37 0.3× 43 555
Ricardo Ascázubi United States 10 329 0.4× 138 0.4× 44 0.2× 51 0.4× 32 0.3× 20 422
J.L. Leray France 22 1.1k 1.3× 5 0.0× 38 0.2× 190 1.5× 76 0.7× 66 1.2k
F Guarin United States 18 1000 1.1× 83 0.2× 32 0.1× 76 0.6× 13 0.1× 82 1.0k
P. Hazdra Czechia 19 1.0k 1.2× 53 0.1× 27 0.1× 134 1.1× 5 0.0× 96 1.1k
S. Sanfilippo Switzerland 12 250 0.3× 202 0.6× 93 0.4× 84 0.7× 79 549

Countries citing papers authored by M. King

Since Specialization
Citations

This map shows the geographic impact of M. King's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. King with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. King more than expected).

Fields of papers citing papers by M. King

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. King. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. King. The network helps show where M. King may publish in the future.

Co-authorship network of co-authors of M. King

This figure shows the co-authorship network connecting the top 25 collaborators of M. King. A scholar is included among the top collaborators of M. King based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. King. M. King is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
King, M., et al.. (2024). In Situ Observation of Circuit Behavior Using Pump-Probe Laser Voltage Probe Technique. IEEE Transactions on Nuclear Science. 71(4). 654–662. 1 indexed citations
2.
Xiao, T. Patrick, Edward S. Bielejec, György Vizkelethy, et al.. (2021). Investigating Heavy-Ion Effects on 14-nm Process FinFETs: Displacement Damage Versus Total Ionizing Dose. IEEE Transactions on Nuclear Science. 68(5). 724–732. 17 indexed citations
3.
Barnaby, Hugh, Lawrence T. Clark, John Brunhaver, et al.. (2021). Evidence of Interface Trap Build-Up in Irradiated 14-nm Bulk FinFET Technologies. IEEE Transactions on Nuclear Science. 68(5). 671–676. 5 indexed citations
4.
King, M., Robert Kaplar, Jeramy Ray Dickerson, et al.. (2016). Identification of the primary compensating defect level responsible for determining blocking voltage of vertical GaN power diodes. Applied Physics Letters. 109(18). 11 indexed citations
5.
Baca, Albert G., Andrew Armstrong, Andrew A. Allerman, et al.. (2016). An AlN/Al<inf>0.85</inf>Ga<inf>0.15</inf>N high electron mobility transistor with a regrown ohmic contact. 1–2. 1 indexed citations
6.
Léonard, François, Jeramy Ray Dickerson, M. King, et al.. (2016). In-Operando Spatial Imaging of Edge Termination Electric Fields in GaN Vertical p-n Junction Diodes. IEEE Electron Device Letters. 1–1. 3 indexed citations
7.
King, M., Xiaogang Wu, M. Eller, et al.. (2016). Analysis of TID Process, Geometry, and Bias Condition Dependence in 14-nm FinFETs and Implications for RF and SRAM Performance. IEEE Transactions on Nuclear Science. 64(1). 285–292. 60 indexed citations
8.
Armstrong, Andrew, Andrew A. Allerman, A. J. Fischer, et al.. (2016). High voltage and high current density vertical GaN power diodes. Electronics Letters. 52(13). 1170–1171. 63 indexed citations
9.
10.
Dickerson, Jeramy Ray, Andrew A. Allerman, Arthur Fischer, et al.. (2015). Vertical GaN Power Diodes With a Bilayer Edge Termination. IEEE Transactions on Electron Devices. 63(1). 419–425. 103 indexed citations
11.
Reed, Robert A., Brian D. Sierawski, Robert A. Weller, et al.. (2015). Electron-Induced Single Event Upsets in 28 nm and 45 nm Bulk SRAMs. IEEE Transactions on Nuclear Science. 62(6). 2709–2716. 25 indexed citations
12.
Weeden-Wright, Stephanie L., M. King, Nicholas C. Hooten, et al.. (2015). Effects of Energy-Deposition Variability on Soft Error Rate Prediction. IEEE Transactions on Nuclear Science. 62(5). 2181–2186. 8 indexed citations
13.
Reed, Robert A., Robert A. Weller, Marcus H. Mendenhall, et al.. (2015). Physical Processes and Applications of the Monte Carlo Radiative Energy Deposition (MRED) Code. IEEE Transactions on Nuclear Science. 62(4). 1441–1461. 49 indexed citations
14.
Weeden-Wright, Stephanie L., Nicholas C. Hooten, En Xia Zhang, et al.. (2014). TID and Displacement Damage Resilience of 1T1R <formula formulatype="inline"><tex Notation="TeX">${\rm HfO}_2/{\rm Hf}$</tex></formula> Resistive Memories. IEEE Transactions on Nuclear Science. 61(6). 2972–2978. 24 indexed citations
15.
Roche, Nicolas J.-H., S. Büchner, C.C. Foster, et al.. (2014). Validation of the Variable Depth Bragg Peak Method for Single-Event Latchup Testing Using Ion Beam Characterization. IEEE Transactions on Nuclear Science. 61(6). 3061–3067. 4 indexed citations
16.
Auden, Elizabeth C., Robert A. Weller, Ronald D. Schrimpf, et al.. (2013). Effects of High Electric Fields on the Magnitudes of Current Steps Produced by Single Particle Displacement Damage. IEEE Transactions on Nuclear Science. 60(6). 4094–4102. 9 indexed citations
17.
Dodds, Nathaniel A., Nicholas C. Hooten, Robert A. Reed, et al.. (2013). SEL-Sensitive Area Mapping and the Effects of Reflection and Diffraction From Metal Lines on Laser SEE Testing. IEEE Transactions on Nuclear Science. 60(4). 2550–2558. 20 indexed citations
18.
Turowski, Marek, Ashok Raman, Michael L. Alles, et al.. (2012). Effect of Carrier Transport in Oxides Surrounding Active Devices on SEU in 45 nm SOI SRAM. IEEE Transactions on Nuclear Science. 59(4). 728–734. 5 indexed citations
19.
Casey, Megan C., Rajan Arora, M. King, et al.. (2009). Effect of Total Ionizing Dose on a Bulk 130 nm Ring Oscillator Operating at Ultra-Low Power. IEEE Transactions on Nuclear Science. 56(6). 3262–3266. 10 indexed citations
20.
King, M.. (1961). Reliability of electronic equipment. ˜The œjournal of the Institution of Electrical Engineers. 7(74). 93–93. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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