B. L. Bhuva

8.0k total citations · 1 hit paper
313 papers, 6.2k citations indexed

About

B. L. Bhuva is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, B. L. Bhuva has authored 313 papers receiving a total of 6.2k indexed citations (citations by other indexed papers that have themselves been cited), including 301 papers in Electrical and Electronic Engineering, 164 papers in Hardware and Architecture and 7 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in B. L. Bhuva's work include Radiation Effects in Electronics (269 papers), VLSI and Analog Circuit Testing (158 papers) and Semiconductor materials and devices (145 papers). B. L. Bhuva is often cited by papers focused on Radiation Effects in Electronics (269 papers), VLSI and Analog Circuit Testing (158 papers) and Semiconductor materials and devices (145 papers). B. L. Bhuva collaborates with scholars based in United States, China and Canada. B. L. Bhuva's co-authors include L. W. Massengill, Ronald D. Schrimpf, Arthur F. Witulski, W.T. Holman, Balaji Narasimham, T. D. Loveless, Oluwole A. Amusan, Jonathan R. Ahlbin, Michael L. Alles and Andrew L. Sternberg and has published in prestigious journals such as Applied Physics Letters, Journal of Food Science and IEEE Electron Device Letters.

In The Last Decade

B. L. Bhuva

303 papers receiving 5.9k citations

Hit Papers

Charge Collection and Charge Sharing in a 130 nm CMOS Tec... 2006 2026 2012 2019 2006 100 200 300
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Charge Collection and Charge Sharing in a 130 nm CMOS Technology
    2006 327 citations L. W. Massengill, B. L. Bhuva et al. IEEE Transactions on Nuclear Science profile →

Peers

B. L. Bhuva
Arthur F. Witulski United States
Véronique Ferlet-Cavrois Netherlands
A. Visconti Italy
Chang Chen United States
S.A. Bota Spain
P.K. Ko United States
Paul R. Gray United States
Lírida Naviner France
S. Siskos Greece
Thomas Toifl Switzerland
Arthur F. Witulski United States
B. L. Bhuva
Citations per year, relative to B. L. Bhuva B. L. Bhuva (= 1×) peers Arthur F. Witulski

Countries citing papers authored by B. L. Bhuva

Since Specialization
Citations

This map shows the geographic impact of B. L. Bhuva's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. L. Bhuva with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. L. Bhuva more than expected).

Fields of papers citing papers by B. L. Bhuva

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B. L. Bhuva. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. L. Bhuva. The network helps show where B. L. Bhuva may publish in the future.

Co-authorship network of co-authors of B. L. Bhuva

This figure shows the co-authorship network connecting the top 25 collaborators of B. L. Bhuva. A scholar is included among the top collaborators of B. L. Bhuva based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B. L. Bhuva. B. L. Bhuva is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Bhuva, B. L., et al.. (2025). Production, characterization and bio-functional properties of multi-functional peptides from fermented plant-based foods: A review. Food Bioscience. 64. 105877–105877. 3 indexed citations
2.
Bhuva, B. L., Amar A. Sakure, Mahendra Bishnoi, et al.. (2025). Influence of Lactobacillus and yeast on antioxidative, antidiabetic, and anti‐inflammatory attributes of camel milk and Gir cow milk as well as release of bioactive peptides: A comparative study. Journal of Food Science. 90(3). e70112–e70112. 3 indexed citations
3.
Ball, Dennis R., et al.. (2025). Single-Event Upsets Due to n-Hits and p-Hits at the 3-nm Bulk FinFET Node. IEEE Transactions on Nuclear Science. 72(8). 2645–2651.
4.
Fung, Rita, et al.. (2024). Evaluation of Threshold Frequencies for Logic Single-Event Upsets at Bulk FinFET Technology Nodes. IEEE Transactions on Nuclear Science. 71(8). 1675–1681. 1 indexed citations
5.
Ball, Dennis R., et al.. (2023). Effects of TID on SRAM Data Retention Stability at the 5-nm Node. IEEE Transactions on Nuclear Science. 71(8). 1864–1871. 2 indexed citations
6.
Zhang, En Xia, B. L. Bhuva, J. L. Davidson, et al.. (2023). Total-Ionizing-Dose Effects and Low-Frequency Noise in N-Type Carbon Nanotube Field-Effect Transistors With HfO₂ Gate Dielectrics. IEEE Transactions on Nuclear Science. 70(4). 449–455. 5 indexed citations
7.
McCurdy, Michael W., et al.. (2023). Evaluation of the Single-Event-Upset Vulnerability for Low-Energy Protons at the 7- and 5-nm Bulk FinFET Nodes. IEEE Transactions on Nuclear Science. 70(8). 1687–1693. 4 indexed citations
8.
Wang, Pengfei, et al.. (2021). Supply Voltage Dependence of Ring Oscillator Frequencies for Total Ionizing Dose Exposures for 7-nm Bulk FinFET Technology. IEEE Transactions on Nuclear Science. 68(8). 1579–1584. 8 indexed citations
9.
Wender, S.A., J. M. O’Donnell, Lukas Zavorka, & B. L. Bhuva. (2020). Measured Energy-Dependent Neutron Attenuation Through the Stacked Printed Circuit Boards. IEEE Transactions on Nuclear Science. 67(6). 1114–1117. 4 indexed citations
10.
Cao, Jingchen, B. L. Bhuva, Rita Fung, et al.. (2020). SE Response of Guard-Gate FF in 16- and 7-nm Bulk FinFET Technologies. IEEE Transactions on Nuclear Science. 67(7). 1436–1442. 4 indexed citations
11.
Kauppila, J. S., T. D. Haeffner, Andrew L. Sternberg, et al.. (2019). Empirical Modeling of FinFET SEU Cross Sections Across Supply Voltage. IEEE Transactions on Nuclear Science. 66(7). 1427–1432. 10 indexed citations
12.
Kauppila, J. S., T. D. Haeffner, En Xia Zhang, et al.. (2019). Exploiting SEU Data Analysis to Extract Fast SET Pulses. IEEE Transactions on Nuclear Science. 66(6). 932–937. 1 indexed citations
13.
Cazzaniga, Carlo, et al.. (2018). Atmospheric-Like Neutron Attenuation During Accelerated Neutron Testing With Multiple Printed Circuit Boards. IEEE Transactions on Nuclear Science. 65(8). 1830–1834. 9 indexed citations
14.
Kauppila, J. S., Dennis R. Ball, T. D. Haeffner, et al.. (2018). Effect of Transistor Variants on Single-Event Transients at the 14-/16-nm Bulk FinFET Technology Generation. IEEE Transactions on Nuclear Science. 65(8). 1807–1813. 17 indexed citations
15.
Kauppila, J. S., Dennis R. Ball, T. D. Haeffner, et al.. (2017). Dual-Interlocked Logic for Single-Event Transient Mitigation. IEEE Transactions on Nuclear Science. 65(8). 1872–1878. 11 indexed citations
16.
Massengill, L. W., Andrew L. Sternberg, En Xia Zhang, et al.. (2017). Time-Domain Modeling of All-Digital PLLs to Single-Event Upset Perturbations. IEEE Transactions on Nuclear Science. 65(1). 311–317. 4 indexed citations
17.
Kauppila, J. S., et al.. (2017). An Empirical Model for Predicting SE Cross Section for Combinational Logic Circuits in Advanced Technologies. IEEE Transactions on Nuclear Science. 65(1). 304–310. 8 indexed citations
18.
Ball, Dennis R., Michael L. Alles, J. S. Kauppila, et al.. (2017). The Impact of Charge Collection Volume and Parasitic Capacitance on SEUs in SOI- and Bulk-FinFET D Flip-Flops. IEEE Transactions on Nuclear Science. 65(1). 326–330. 21 indexed citations
19.
Kauppila, J. S., Dennis R. Ball, T. D. Haeffner, et al.. (2017). Impact of Single-Event Transient Duration and Electrical Delay at Reduced Supply Voltages on SET Mitigation Techniques. IEEE Transactions on Nuclear Science. 65(1). 362–368. 13 indexed citations
20.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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