M. DeLaus

835 citations
13 papers · 680 indexed · h-index 7

M. DeLaus

12 papers receiving 620 citations

Peers

M. DeLaus
Comparison fields: 5 of 32
  • Electrical and Electronic Engineering 675
  • Hardware and Architecture 28
  • Radiation 17
  • Automotive Engineering 11
  • Materials Chemistry 37
Replace S.L. Kosier with:
S.L. Kosier United States
A. Wei United States
E.W. Enlow United States
C. Dachs Belgium
M. Gehlhausen United States
G.W. Dunham United States
D Platteter United States
G.H. Johnson United States
John M. Hutson United States
X. J. Zhou United States
M. DeLaus relative to S.L. Kosier United States S.L. Kosier's profile →
Citations per field
00.5×1.5×
S.L. Kosier · 1×
Citations per year

Countries citing papers authored by M. DeLaus

Since Specialization
Citations

This map shows the geographic impact of M. DeLaus's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. DeLaus with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. DeLaus more than expected).

Fields of papers citing papers by M. DeLaus

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. DeLaus. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. DeLaus. The network helps show where M. DeLaus may publish in the future.

Co-authorship network

The 14 scholars most cited alongside M. DeLaus, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M. DeLaus Line = papers co-authored together M. DeLaus links everyone, so they are left out of the graph.

All Works

13 of 13 papers shown
#Work
1 20129
2 20050
3 20021
4 20023
5 199596
6 199532
7 199562
8 19946
9 1994228
10 199469
11
Correlation of hot-carrier stress and ionization induced degradation in bipolar transistors
19941
12 19936
13 1993167

About M. DeLaus

M. DeLaus is a scholar working on Electrical and Electronic Engineering, Polymers and Plastics, Materials Chemistry, Mechanics of Materials and Atomic and Molecular Physics, and Optics, having authored 13 papers that have together received 680 indexed citations. Recurring topics across this work include Semiconductor materials and devices (11 papers), Advancements in Semiconductor Devices and Circuit Design (9 papers), Radiation Effects in Electronics (5 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), 3D IC and TSV technologies (2 papers), Diamond and Carbon-based Materials Research (2 papers), Electronic and Structural Properties of Oxides (1 paper) and Semiconductor Quantum Structures and Devices (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (675 citations), Hardware and Architecture (28 citations), Radiation (17 citations), Automotive Engineering (11 citations) and Materials Chemistry (37 citations). M. DeLaus has collaborated with scholars based in United States. Frequent co-authors include Ronald D. Schrimpf, W.E. Combs, R.L. Pease, Daniel M. Fleetwood, S.L. Kosier, A. Wei, R.N. Nowlin, R.A. Reber, P.S. Winokur and D. Schmidt. Their work appears in journals such as IEEE Transactions on Nuclear Science, IEEE Transactions on Electron Devices, Journal of Electronic Packaging and University of North Texas Digital Library (University of North Texas).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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