Nathaniel A. Dodds

614 total citations
32 papers, 404 citations indexed

About

Nathaniel A. Dodds is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Pulmonary and Respiratory Medicine. According to data from OpenAlex, Nathaniel A. Dodds has authored 32 papers receiving a total of 404 indexed citations (citations by other indexed papers that have themselves been cited), including 32 papers in Electrical and Electronic Engineering, 5 papers in Hardware and Architecture and 3 papers in Pulmonary and Respiratory Medicine. Recurrent topics in Nathaniel A. Dodds's work include Radiation Effects in Electronics (25 papers), Integrated Circuits and Semiconductor Failure Analysis (23 papers) and Semiconductor materials and devices (17 papers). Nathaniel A. Dodds is often cited by papers focused on Radiation Effects in Electronics (25 papers), Integrated Circuits and Semiconductor Failure Analysis (23 papers) and Semiconductor materials and devices (17 papers). Nathaniel A. Dodds collaborates with scholars based in United States, Canada and Netherlands. Nathaniel A. Dodds's co-authors include Robert A. Reed, Ronald D. Schrimpf, Robert A. Weller, P.E. Dodd, M.R. Shaneyfelt, Nicholas C. Hooten, Paul W. Marshall, Jonathan A. Pellish, Michael A. Clemens and Marcus H. Mendenhall and has published in prestigious journals such as IEEE Transactions on Nuclear Science, OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) and Proceedings - International Symposium for Testing and Failure Analysis.

In The Last Decade

Nathaniel A. Dodds

29 papers receiving 386 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Nathaniel A. Dodds United States	12	375	90	76	55	34	32	404
N. Buard France	12	415 1.1×	99 1.1×	55 0.7×	43 0.8×	27 0.8×	30	443
Alan D. Tipton United States	9	430 1.1×	146 1.6×	44 0.6×	41 0.7×	33 1.0×	13	452
Andrew Michael Chugg United Kingdom	13	332 0.9×	70 0.8×	69 0.9×	30 0.5×	47 1.4×	29	362
Anthony M. Phan United States	14	601 1.6×	150 1.7×	79 1.0×	62 1.1×	49 1.4×	39	634
C. Barillot France	8	316 0.8×	78 0.9×	44 0.6×	26 0.5×	43 1.3×	20	345
M.W. Savage United States	12	460 1.2×	123 1.4×	43 0.6×	23 0.4×	21 0.6×	23	475
N.F. Haddad United States	12	826 2.2×	237 2.6×	76 1.0×	47 0.9×	62 1.8×	33	844
F.-X. Guerre Netherlands	10	282 0.8×	32 0.4×	88 1.2×	90 1.6×	60 1.8×	16	305
Maris Tali Switzerland	10	192 0.5×	27 0.3×	98 1.3×	81 1.5×	50 1.5×	27	231
Ali Zadeh Netherlands	11	285 0.8×	32 0.4×	68 0.9×	73 1.3×	45 1.3×	27	318

Countries citing papers authored by Nathaniel A. Dodds

Since Specialization

Citations

This map shows the geographic impact of Nathaniel A. Dodds's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Nathaniel A. Dodds with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Nathaniel A. Dodds more than expected).

Fields of papers citing papers by Nathaniel A. Dodds

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Nathaniel A. Dodds. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Nathaniel A. Dodds. The network helps show where Nathaniel A. Dodds may publish in the future.

Co-authorship network of co-authors of Nathaniel A. Dodds

This figure shows the co-authorship network connecting the top 25 collaborators of Nathaniel A. Dodds. A scholar is included among the top collaborators of Nathaniel A. Dodds based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Nathaniel A. Dodds. Nathaniel A. Dodds is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Dodds, Nathaniel A., Keshab Sapkota, Phil Oldiges, et al.. (2025). TID Response of IBM Gate-All-Around Stacked Nanosheet Transistors. IEEE Transactions on Nuclear Science. 72(8). 2303–2310. 2 indexed citations

Dodds, Nathaniel A., B. Dodd, Hugh Barnaby, et al.. (2025). The Effect of Number of Fins per Transistor on the TID Response of 12LP FinFET Technology. IEEE Transactions on Nuclear Science. 72(8). 2317–2323.

Dodds, Nathaniel A., Phil Oldiges, Keshab Sapkota, et al.. (2025). Impact of 12-nm FinFET Technology Variations on TID Effects: A Comparative Study of GF 12LP and 12LP+ at the Transistor Level. IEEE Transactions on Nuclear Science. 72(4). 1268–1275.

Dodds, Nathaniel A., Phil Oldiges, B. Dodd, et al.. (2024). The Effects of Threshold Voltage and Number of Fins Per Transistor on the TID Response of GF 12LP Technology. IEEE Transactions on Nuclear Science. 71(4). 477–484. 5 indexed citations

Dodds, Nathaniel A., et al.. (2024). Contribution of Secondary Alpha Particles to Soft Error Rates in Space Systems. IEEE Transactions on Nuclear Science. 71(4). 535–541. 1 indexed citations

Dodds, Nathaniel A., et al.. (2023). Single-Event Upsets for Single-Port and Two-Port SRAM Cells at the 5-nm FinFET Technology. IEEE Transactions on Nuclear Science. 70(8). 1673–1679. 2 indexed citations

Dodds, Nathaniel A., et al.. (2023). Study of Multicell Upsets in SRAM at a 5-nm Bulk FinFET Node. IEEE Transactions on Nuclear Science. 70(4). 401–409. 9 indexed citations

Dodds, Nathaniel A., et al.. (2023). Response of 5-nm Bulk FinFET SRAMs to Extreme Ionizing and Non-Ionizing Doses. IEEE Transactions on Nuclear Science. 71(4). 437–445. 4 indexed citations

Teng, Jeffrey W., George N. Tzintzarov, K. Li, et al.. (2021). Response of Integrated Silicon Microwave pin Diodes to X-Ray and Fast-Neutron Irradiation. IEEE Transactions on Nuclear Science. 69(3). 282–289. 1 indexed citations

10.

Lee, David, Gregory C. Allen, Matthew V. Cannon, et al.. (2021). Preliminary Results from Heavy-Ion Irradiation of the Xilinx Versal ACAP.. OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information). 2 indexed citations

11.

Beechem, Thomas E., et al.. (2021). Impacts of Substrate Thinning on FPGA Performance and Reliability. Proceedings - International Symposium for Testing and Failure Analysis. 84215. 423–429. 1 indexed citations

12.

Sternberg, Andrew L., Brian D. Sierawski, En Xia Zhang, et al.. (2020). Sensitive-Volume Model of Single-Event Latchup for a 180-nm SRAM Test Structure. IEEE Transactions on Nuclear Science. 67(9). 2015–2020. 5 indexed citations

13.

Gerardin, Simone, Marta Bagatin, A. Paccagnella, et al.. (2016). Upsets in Erased Floating Gate Cells With High-Energy Protons. IEEE Transactions on Nuclear Science. 64(1). 421–426. 1 indexed citations

14.

Khachatrian, Ani, Nicolas J.-H. Roche, Nathaniel A. Dodds, et al.. (2015). The Impact of Metal Line Reflections on Through-Wafer TPA SEE Testing. IEEE Transactions on Nuclear Science. 62(6). 2452–2457. 3 indexed citations

15.

Dodds, Nathaniel A., P.E. Dodd, M.R. Shaneyfelt, et al.. (2015). New Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle. IEEE Transactions on Nuclear Science. 62(6). 2822–2829. 25 indexed citations

16.

Roche, Nicolas J.-H., S. Büchner, C.C. Foster, et al.. (2014). Validation of the Variable Depth Bragg Peak Method for Single-Event Latchup Testing Using Ion Beam Characterization. IEEE Transactions on Nuclear Science. 61(6). 3061–3067. 4 indexed citations

17.

Dodds, Nathaniel A., Nicholas C. Hooten, Robert A. Reed, et al.. (2012). Effectiveness of SEL Hardening Strategies and the Latchup Domino Effect. IEEE Transactions on Nuclear Science. 59(6). 2642–2650. 39 indexed citations

18.

Clemens, Michael A., Brian D. Sierawski, Kevin M. Warren, et al.. (2011). The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets. IEEE Transactions on Nuclear Science. 58(6). 2591–2598. 30 indexed citations

19.

Clemens, Michael A., Nicholas C. Hooten, Nathaniel A. Dodds, et al.. (2010). The Effect of High-Z Materials on Proton-Induced Charge Collection. IEEE Transactions on Nuclear Science. 32 indexed citations

20.

Clemens, Michael A., Nathaniel A. Dodds, Robert A. Weller, et al.. (2009). The Effects of Nuclear Fragmentation Models on Single Event Effect Prediction. IEEE Transactions on Nuclear Science. 56(6). 3158–3164. 13 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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