K. Watson
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- Semiconductor materials and devices 16
- Advancements in Semiconductor Devices and Circuit Design 13
- Radio Frequency Integrated Circuit Design 4
- Integrated Circuits and Semiconductor Failure Analysis 3
- Electrostatic Discharge in Electronics 3
- Radiation Effects in Electronics 2
- Silicon Carbide Semiconductor Technologies 2
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- Copper Interconnects and Reliability 1
- Co-authors
- S. SubbannaTerence B. HookG. FreemanAlvin JosephWilliam F. ClarkS. MittlD.L. HarameR. Groves
- Cited by
- Electrical and Electronic EngineeringHardware and ArchitectureElectronic, Optical and Magnetic Materials
- Journals
- IEEE Transactions on Electron Devices (3 papers)IEEE Transactions on Nuclear Science (2 papers)IEEE Electron Device Letters (2 papers)
- Partner nations
- United StatesCanadaJapan
In The Last Decade
K. Watson
18 papers receiving 289 citations
Peers
Comparison fields: 5 of 25
- Electrical and Electronic Engineering 310
- Hardware and Architecture 24
- Electronic, Optical and Magnetic Materials 15
- Radiation 7
- Atomic and Molecular Physics, and Optics 20
Countries citing papers authored by K. Watson
This map shows the geographic impact of K. Watson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Watson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Watson more than expected).
Fields of papers citing papers by K. Watson
This network shows the impact of papers produced by K. Watson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Watson. The network helps show where K. Watson may publish in the future.
Co-authorship network
The 25 scholars most cited alongside K. Watson, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2014 | 3 | |
| 2 | 2005 | 1 | |
| 3 | 2005 | 2 | |
| 4 | 2004 | 21 | |
| 5 | 2003 | 29 | |
| 6 | Electrical Characteristics and Reliability of UV Transparent Si N Metal-Insulator-Metal (MIM) Capacitors | 2003 | 1 |
| 7 | 2003 | 9 | |
| 8 | 2003 | 34 | |
| 9 | 2003 | 10 | |
| 10 | 2002 | 5 | |
| 11 | 2002 | 2 | |
| 12 | 2001 | 100 | |
| 13 | 1999 | 33 | |
| 14 | 1999 | 24 | |
| 15 | 1997 | 8 | |
| 16 | A CMOS Technology for a Sub-5-ns 3.3-V LVTTL 1-Mbit SRAM | 1995 | 9 |
| 17 | 1991 | 15 | |
| 18 | 1988 | 12 |
About K. Watson
K. Watson is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Radiation, Condensed Matter Physics and Electronic, Optical and Magnetic Materials, having authored 18 papers that have together received 318 indexed citations. Recurring topics across this work include Semiconductor materials and devices (16 papers), Advancements in Semiconductor Devices and Circuit Design (13 papers), Radio Frequency Integrated Circuit Design (4 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Electrostatic Discharge in Electronics (3 papers), Radiation Effects in Electronics (2 papers), Silicon Carbide Semiconductor Technologies (2 papers) and Copper Interconnects and Reliability (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (310 citations), Hardware and Architecture (24 citations), Electronic, Optical and Magnetic Materials (15 citations), Radiation (7 citations) and Atomic and Molecular Physics, and Optics (20 citations). K. Watson has collaborated with scholars based in United States, Canada and Japan. Frequent co-authors include S. Subbanna, Terence B. Hook, G. Freeman, Alvin Joseph, William F. Clark, S. Mittl, D.L. Harame, R. Groves, Rob Johnson and D. Ahlgren. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Transactions on Nuclear Science, IEEE Electron Device Letters, IEEE Transactions on Device and Materials Reliability and Journal of Electronic Materials.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.