M. Friendlich

1.4k total citations
37 papers, 1.1k citations indexed

About

M. Friendlich is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Computer Networks and Communications. According to data from OpenAlex, M. Friendlich has authored 37 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 36 papers in Electrical and Electronic Engineering, 15 papers in Hardware and Architecture and 9 papers in Computer Networks and Communications. Recurrent topics in M. Friendlich's work include Radiation Effects in Electronics (28 papers), Integrated Circuits and Semiconductor Failure Analysis (17 papers) and VLSI and Analog Circuit Testing (14 papers). M. Friendlich is often cited by papers focused on Radiation Effects in Electronics (28 papers), Integrated Circuits and Semiconductor Failure Analysis (17 papers) and VLSI and Analog Circuit Testing (14 papers). M. Friendlich collaborates with scholars based in United States and Netherlands. M. Friendlich's co-authors include Melanie D. Berg, Kenneth A. LaBel, C.M. Seidleck, M.A. Xapsos, Timothy R. Oldham, Anthony Phan, Jonathan A. Pellish, Hak Kim, P.E. Dodd and Paul W. Marshall and has published in prestigious journals such as IEEE Transactions on Nuclear Science, NASA STI Repository (National Aeronautics and Space Administration) and NASA Technical Reports Server (NASA).

In The Last Decade

M. Friendlich

37 papers receiving 1.0k citations

Peers

Countries citing papers authored by M. Friendlich

Since Specialization

Citations

This map shows the geographic impact of M. Friendlich's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Friendlich with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Friendlich more than expected).

Fields of papers citing papers by M. Friendlich

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Friendlich. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Friendlich. The network helps show where M. Friendlich may publish in the future.

Co-authorship network of co-authors of M. Friendlich

This figure shows the co-authorship network connecting the top 25 collaborators of M. Friendlich. A scholar is included among the top collaborators of M. Friendlich based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Friendlich. M. Friendlich is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Characterizing the Effects of Single Event Upsets on Synchronous Data Paths 2013 ·IEEE Transactions on Nuclear Science ·Melanie D. Berg, M. Friendlich, Hak Kim, (unknown), Kenneth A. LaBel, Ray Ladbury, Jonathan A. Pellish	3
2	Retention Characteristics of Commercial NAND Flash Memory After Radiation Exposure 2012 ·IEEE Transactions on Nuclear Science ·Timothy R. Oldham, (unknown), M. Friendlich, Kenneth A. LaBel	7
3	32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches 2011 ·IEEE Transactions on Nuclear Science ·Kenneth P. Rodbell, David F. Heidel, Jonathan A. Pellish, Paul W. Marshall, Henry H. K. Tang, Conal E. Murray, Kenneth A. LaBel, Michael S. Gordon, Kevin Stawiasz, James R. Schwank, Melanie D. Berg, Hak Kim, M. Friendlich, Anthony M. Phan, C.M. Seidleck	51
4	Single Event Effects (SEE) Testing of Embedded DSP Cores within Microsemi RTAX4000D Field Programmable Gate Array (FPGA) Devices 2011 ·NASA Technical Reports Server (NASA) ·(unknown), Melanie D. Berg, M. Friendlich	1
5	Effect of Radiation Exposure on the Retention of Commercial NAND Flash Memory 2011 ·IEEE Transactions on Nuclear Science ·Timothy R. Oldham, (unknown), M. Friendlich, Martin A. Carts, C.M. Seidleck, Kenneth A. LaBel	27
6	Low-Energy Proton Testing Using Cyclotrons Sources 2011 ·NASA Technical Reports Server (NASA) ·Jonathan A. Pellish, Paul W. Marshall, C.M. Castaneda, Robert A. Weller, David F. Heidel, Kenneth P. Rodbell, Kenneth A. LaBel, Melanie D. Berg, (unknown), M. Friendlich, Anthony M. Phan, (unknown), C.M. Seidleck, J.R. Schwank, Marcus H. Mendenhall, Robert A. Reed	2
7	Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device Testing 2010 ·IEEE Transactions on Nuclear Science ·Melanie D. Berg, S. Büchner, Hak Kim, M. Friendlich, Christopher J. Perez, Anthony M. Phan, C.M. Seidleck, Kenneth A. LaBel, (unknown)	6
8	Effect of Radiation Exposure on the Endurance of Commercial nand Flash Memory 2009 ·IEEE Transactions on Nuclear Science ·Timothy R. Oldham, M. Friendlich, Martin A. Carts, C.M. Seidleck, Kenneth A. LaBel	25
9	A Comprehensive Methodology for Complex Field Programmable Gate Array Single Event Effects Test and Evaluation 2009 ·IEEE Transactions on Nuclear Science ·Melanie D. Berg, Kenneth A. LaBel, Hak Kim, M. Friendlich, Anthony M. Phan, Christopher J. Perez	10
10	Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM 2009 ·IEEE Transactions on Nuclear Science ·David F. Heidel, Paul W. Marshall, Jonathan A. Pellish, Kenneth P. Rodbell, Kenneth A. LaBel, James R. Schwank, Stewart E. Rauch, Mark C. Hakey, Melanie D. Berg, (unknown), P.E. Dodd, M. Friendlich, Anthony Phan, C.M. Seidleck, M.R. Shaneyfelt, M.A. Xapsos	137
11	Radiation Performance of 1 Gbit DDR2 SDRAMs Fabricated with 80-90 nm CMOS 2008 ·Ray Ladbury, Melanie D. Berg, Kenneth A. LaBel, M. Friendlich, A. Phan, (unknown)	11
12	Effectiveness of Internal Versus External SEU Scrubbing Mitigation Strategies in a Xilinx FPGA: Design, Test, and Analysis 2008 ·IEEE Transactions on Nuclear Science ·Melanie D. Berg, C. Poivey, (unknown), (unknown), Austin Lesea, K.A. LaBel, M. Friendlich, (unknown), Anthony Phan	105
13	Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection 2008 ·IEEE Transactions on Nuclear Science ·Jeffrey D. Black, Dennis R. Ball, William H. Robinson, Daniel M. Fleetwood, Ronald D. Schrimpf, Robert A. Reed, Dolores Black, Kevin M. Warren, Alan D. Tipton, P.E. Dodd, N.F. Haddad, M.A. Xapsos, (unknown), M. Friendlich	68
14	TID and SEE Response of an Advanced Samsung 4G NAND Flash Memory 2007 ·NASA Technical Reports Server (NASA) ·Timothy R. Oldham, M. Friendlich, James W. Howard, (unknown), (unknown), (unknown), Kenneth A. LaBel	1
15	Risk Reduction for Use of Complex Devices in Space Projects 2007 ·IEEE Transactions on Nuclear Science ·Melanie D. Berg, C. Poivey, (unknown), Kenneth A. LaBel, M. Friendlich, (unknown), (unknown)	3
16	Single Event Effects (SEE) response of embedded power PCs in a Xilinx Virtex-4 FPGA for a space application 2007 ·C. Poivey, Melanie D. Berg, M. Friendlich, Hak Kim, (unknown), (unknown), Kenneth A. LaBel, C.M. Seidleck, Anthony M. Phan, Tim Irwin	10
17	Radiation Performance of 1 Gbit DDR SDRAMs Fabricated in the 90 nm CMOS Technology Node 2006 ·NASA STI Repository (National Aeronautics and Space Administration) ·Ray Ladbury, Melanie D. Berg, (unknown), Kenneth A. LaBel, M. Friendlich, R. Koga, J. George, S. Crain, (unknown), Robert A. Reed	16
18	SEE and TID Characterization of an Advanced Commercial 2Gbit NAND Flash Nonvolatile Memory 2006 ·IEEE Transactions on Nuclear Science ·Timothy R. Oldham, Ray Ladbury, M. Friendlich, H.S. Kim, Melanie D. Berg, Tim Irwin, C.M. Seidleck, Kenneth A. LaBel	90
19	Development of a Low-Cost and High-speed Single Event Effects Testers based on Reconfigurable Field Programmable Gate Arrays (FPGA) 2006 ·NASA Technical Reports Server (NASA) ·James W. Howard, (unknown), Melanie D. Berg, Kenneth A. LaBel, (unknown), M. Friendlich, Tim Irwin	13
20	An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays 2006 ·IEEE Transactions on Nuclear Science ·Melanie D. Berg, (unknown), Ray Ladbury, (unknown), Hak Kim, J.W. Howard, K.A. LaBel, Anthony M. Phan, Tim Irwin, M. Friendlich	28

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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