M. Friendlich

1.4k total citations
37 papers, 1.1k citations indexed

About

M. Friendlich is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Computer Networks and Communications. According to data from OpenAlex, M. Friendlich has authored 37 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 36 papers in Electrical and Electronic Engineering, 15 papers in Hardware and Architecture and 9 papers in Computer Networks and Communications. Recurrent topics in M. Friendlich's work include Radiation Effects in Electronics (28 papers), Integrated Circuits and Semiconductor Failure Analysis (17 papers) and VLSI and Analog Circuit Testing (14 papers). M. Friendlich is often cited by papers focused on Radiation Effects in Electronics (28 papers), Integrated Circuits and Semiconductor Failure Analysis (17 papers) and VLSI and Analog Circuit Testing (14 papers). M. Friendlich collaborates with scholars based in United States and Netherlands. M. Friendlich's co-authors include Melanie D. Berg, Kenneth A. LaBel, C.M. Seidleck, M.A. Xapsos, Timothy R. Oldham, Anthony Phan, Jonathan A. Pellish, Hak Kim, P.E. Dodd and Kenneth P. Rodbell and has published in prestigious journals such as IEEE Transactions on Nuclear Science, NASA STI Repository (National Aeronautics and Space Administration) and NASA Technical Reports Server (NASA).

In The Last Decade

M. Friendlich

37 papers receiving 1.0k citations

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
M. Friendlich 1.1k 356 121 98 85 37 1.1k
Melanie D. Berg 1.1k 1.0× 427 1.2× 108 0.9× 80 0.8× 98 1.2× 82 1.1k
C.M. Seidleck 1.2k 1.2× 280 0.8× 174 1.4× 128 1.3× 103 1.2× 64 1.3k
Gilles Gasiot 1.7k 1.6× 726 2.0× 134 1.1× 42 0.4× 54 0.6× 89 1.7k
Hak Kim 783 0.7× 167 0.5× 85 0.7× 62 0.6× 28 0.3× 71 832
Jeffrey D. Black 1.5k 1.4× 742 2.1× 79 0.7× 47 0.5× 36 0.4× 36 1.5k
Martin A. Carts 1.0k 1.0× 258 0.7× 70 0.6× 20 0.2× 65 0.8× 56 1.1k
T.L. Turflinger 1.1k 1.1× 427 1.2× 68 0.6× 19 0.2× 39 0.5× 35 1.2k
N.F. Haddad 826 0.8× 237 0.7× 76 0.6× 47 0.5× 12 0.1× 33 844
K.B. Crawford 572 0.5× 196 0.6× 60 0.5× 29 0.3× 35 0.4× 43 633
Gregory R. Allen 518 0.5× 202 0.6× 37 0.3× 26 0.3× 69 0.8× 61 559

Countries citing papers authored by M. Friendlich

Since Specialization
Citations

This map shows the geographic impact of M. Friendlich's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Friendlich with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Friendlich more than expected).

Fields of papers citing papers by M. Friendlich

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Friendlich. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Friendlich. The network helps show where M. Friendlich may publish in the future.

Co-authorship network of co-authors of M. Friendlich

This figure shows the co-authorship network connecting the top 25 collaborators of M. Friendlich. A scholar is included among the top collaborators of M. Friendlich based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Friendlich. M. Friendlich is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Berg, Melanie D., M. Friendlich, Hak Kim, et al.. (2013). Characterizing the Effects of Single Event Upsets on Synchronous Data Paths. IEEE Transactions on Nuclear Science. 60(4). 2697–2703. 3 indexed citations
2.
Oldham, Timothy R., et al.. (2012). Retention Characteristics of Commercial NAND Flash Memory After Radiation Exposure. IEEE Transactions on Nuclear Science. 59(6). 3011–3015. 7 indexed citations
3.
Wilcox, Edward P., Melanie D. Berg, M. Friendlich, et al.. (2012). A Robust Strategy for Total Ionizing Dose Testing of Field Programmable Gate Arrays. NASA Technical Reports Server (NASA). 3 indexed citations
4.
Rodbell, Kenneth P., David F. Heidel, Jonathan A. Pellish, et al.. (2011). 32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches. IEEE Transactions on Nuclear Science. 58(6). 2702–2710. 51 indexed citations
5.
Berg, Melanie D., et al.. (2011). Single Event Effects (SEE) Testing of Embedded DSP Cores within Microsemi RTAX4000D Field Programmable Gate Array (FPGA) Devices. NASA Technical Reports Server (NASA). 1 indexed citations
6.
Oldham, Timothy R., et al.. (2011). Effect of Radiation Exposure on the Retention of Commercial NAND Flash Memory. IEEE Transactions on Nuclear Science. 58(6). 2904–2910. 27 indexed citations
7.
Oldham, Timothy R., Melanie D. Berg, M. Friendlich, et al.. (2011). Investigation of Current Spike Phenomena during Heavy Ion Irradiation of NAND Flash Memories. NASA STI Repository (National Aeronautics and Space Administration). 1–9. 20 indexed citations
8.
Berg, Melanie D., S. Büchner, Hak Kim, et al.. (2010). Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device Testing. IEEE Transactions on Nuclear Science. 57(4). 1958–1965. 6 indexed citations
9.
Dodds, Nathaniel A., John M. Hutson, Jonathan A. Pellish, et al.. (2010). Selection of Well Contact Densities for Latchup-Immune Minimal-Area ICs. IEEE Transactions on Nuclear Science. 20 indexed citations
10.
Berg, Melanie D., Kenneth A. LaBel, Hak Kim, et al.. (2009). A Comprehensive Methodology for Complex Field Programmable Gate Array Single Event Effects Test and Evaluation. IEEE Transactions on Nuclear Science. 56(2). 366–374. 10 indexed citations
11.
Oldham, Timothy R., M. Friendlich, Martin A. Carts, C.M. Seidleck, & Kenneth A. LaBel. (2009). Effect of Radiation Exposure on the Endurance of Commercial nand Flash Memory. IEEE Transactions on Nuclear Science. 56(6). 3280–3284. 25 indexed citations
12.
Ladbury, Ray, et al.. (2008). Radiation Performance of 1 Gbit DDR2 SDRAMs Fabricated with 80-90 nm CMOS. 42–46. 11 indexed citations
13.
Berg, Melanie D., C. Poivey, Austin Lesea, et al.. (2008). Effectiveness of Internal Versus External SEU Scrubbing Mitigation Strategies in a Xilinx FPGA: Design, Test, and Analysis. IEEE Transactions on Nuclear Science. 55(4). 2259–2266. 105 indexed citations
14.
Black, Jeffrey D., Dennis R. Ball, William H. Robinson, et al.. (2008). Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection. IEEE Transactions on Nuclear Science. 55(6). 2943–2947. 68 indexed citations
15.
Poivey, C., Melanie D. Berg, M. Friendlich, et al.. (2007). Single Event Effects (SEE) response of embedded power PCs in a Xilinx Virtex-4 FPGA for a space application. 1–5. 10 indexed citations
16.
Berg, Melanie D., et al.. (2007). Risk Reduction for Use of Complex Devices in Space Projects. IEEE Transactions on Nuclear Science. 54(6). 2137–2140. 3 indexed citations
17.
Oldham, Timothy R., et al.. (2007). TID and SEE Response of an Advanced Samsung 4G NAND Flash Memory. NASA Technical Reports Server (NASA). 1 indexed citations
18.
Ladbury, Ray, Melanie D. Berg, Kenneth A. LaBel, et al.. (2006). Radiation Performance of 1 Gbit DDR SDRAMs Fabricated in the 90 nm CMOS Technology Node. NASA STI Repository (National Aeronautics and Space Administration). 126–130. 16 indexed citations
19.
Oldham, Timothy R., Ray Ladbury, M. Friendlich, et al.. (2006). SEE and TID Characterization of an Advanced Commercial 2Gbit NAND Flash Nonvolatile Memory. IEEE Transactions on Nuclear Science. 53(6). 3217–3222. 90 indexed citations
20.
Berg, Melanie D., Ray Ladbury, Hak Kim, et al.. (2006). An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays. IEEE Transactions on Nuclear Science. 53(6). 3569–3574. 28 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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