Jonathan A. Pellish

2.2k total citations
102 papers, 1.5k citations indexed

About

Jonathan A. Pellish is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Aerospace Engineering. According to data from OpenAlex, Jonathan A. Pellish has authored 102 papers receiving a total of 1.5k indexed citations (citations by other indexed papers that have themselves been cited), including 98 papers in Electrical and Electronic Engineering, 26 papers in Hardware and Architecture and 15 papers in Aerospace Engineering. Recurrent topics in Jonathan A. Pellish's work include Radiation Effects in Electronics (90 papers), Integrated Circuits and Semiconductor Failure Analysis (39 papers) and Semiconductor materials and devices (28 papers). Jonathan A. Pellish is often cited by papers focused on Radiation Effects in Electronics (90 papers), Integrated Circuits and Semiconductor Failure Analysis (39 papers) and Semiconductor materials and devices (28 papers). Jonathan A. Pellish collaborates with scholars based in United States, Netherlands and Canada. Jonathan A. Pellish's co-authors include Robert A. Reed, Ronald D. Schrimpf, Paul W. Marshall, Robert A. Weller, Kenneth A. LaBel, Marcus H. Mendenhall, Brian D. Sierawski, M.A. Xapsos, C.M. Seidleck and Melanie D. Berg and has published in prestigious journals such as IEEE Electron Device Letters, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms and Solid-State Electronics.

In The Last Decade

Jonathan A. Pellish

96 papers receiving 1.4k citations

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
Jonathan A. Pellish 1.5k 371 174 140 125 102 1.5k
Brian D. Sierawski 1.6k 1.1× 368 1.0× 232 1.3× 185 1.3× 166 1.3× 73 1.7k
S. Duzellier 1.1k 0.7× 278 0.7× 172 1.0× 158 1.1× 158 1.3× 77 1.3k
F. Wrobel 1.5k 1.0× 435 1.2× 271 1.6× 186 1.3× 163 1.3× 147 1.6k
Kevin M. Warren 2.0k 1.4× 656 1.8× 238 1.4× 190 1.4× 180 1.4× 60 2.1k
C. Poivey 1.2k 0.8× 338 0.9× 233 1.3× 199 1.4× 156 1.2× 111 1.3k
R. Koga 1.5k 1.0× 509 1.4× 137 0.8× 104 0.7× 111 0.9× 87 1.6k
C.M. Seidleck 1.2k 0.9× 280 0.8× 174 1.0× 128 0.9× 89 0.7× 64 1.3k
Frédéric Saigné 1.8k 1.3× 386 1.0× 323 1.9× 206 1.5× 187 1.5× 192 2.0k
G.L. Hash 1.6k 1.1× 339 0.9× 136 0.8× 70 0.5× 85 0.7× 48 1.6k
J.C. Pickel 1.1k 0.7× 259 0.7× 163 0.9× 106 0.8× 112 0.9× 36 1.2k

Countries citing papers authored by Jonathan A. Pellish

Since Specialization
Citations

This map shows the geographic impact of Jonathan A. Pellish's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jonathan A. Pellish with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jonathan A. Pellish more than expected).

Fields of papers citing papers by Jonathan A. Pellish

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jonathan A. Pellish. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jonathan A. Pellish. The network helps show where Jonathan A. Pellish may publish in the future.

Co-authorship network of co-authors of Jonathan A. Pellish

This figure shows the co-authorship network connecting the top 25 collaborators of Jonathan A. Pellish. A scholar is included among the top collaborators of Jonathan A. Pellish based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jonathan A. Pellish. Jonathan A. Pellish is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Casey, Megan C., et al.. (2021). Single-Event Response of 22-nm Fully Depleted Silicon-on-Insulator Static Random Access Memory. IEEE Transactions on Nuclear Science. 68(4). 402–409. 8 indexed citations
2.
LaBel, Kenneth A., Jonathan A. Pellish, Martha V. O'Bryan, et al.. (2019). NASA Goddard Space Flight Center’s Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results. 1–10. 8 indexed citations
3.
O'Bryan, Martha V., Kenneth A. LaBel, Edward P. Wilcox, et al.. (2017). Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program. NASA STI Repository (National Aeronautics and Space Administration). 1–9. 6 indexed citations
4.
Xapsos, M.A., A. Phan, S. McClure, et al.. (2016). Inclusion of Radiation Environment Variability in Total Dose Hardness Assurance Methodology. IEEE Transactions on Nuclear Science. 64(1). 325–331. 20 indexed citations
5.
LaBel, Kenneth A. & Jonathan A. Pellish. (2014). Notional Radiation Hardness Assurance (RHA) Planning For NASA Missions: Updated Guidance. NASA STI Repository (National Aeronautics and Space Administration). 1 indexed citations
6.
Dodds, Nathaniel A., Nicholas C. Hooten, Robert A. Reed, et al.. (2013). SEL-Sensitive Area Mapping and the Effects of Reflection and Diffraction From Metal Lines on Laser SEE Testing. IEEE Transactions on Nuclear Science. 60(4). 2550–2558. 20 indexed citations
7.
Chen, Dakai, Jonathan A. Pellish, Raymond L. Ladbury, et al.. (2012). Compendium of Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA. NASA STI Repository (National Aeronautics and Space Administration). 1–9. 7 indexed citations
8.
Rodbell, Kenneth P., David F. Heidel, Jonathan A. Pellish, et al.. (2011). 32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches. IEEE Transactions on Nuclear Science. 58(6). 2702–2710. 51 indexed citations
9.
Seifert, N., B. Gill, Jonathan A. Pellish, Paul W. Marshall, & Kenneth A. LaBel. (2011). The Susceptibility of 45 and 32 nm Bulk CMOS Latches to Low-Energy Protons. IEEE Transactions on Nuclear Science. 58(6). 2711–2718. 28 indexed citations
10.
Schwank, James R., M.R. Shaneyfelt, Véronique Ferlet-Cavrois, et al.. (2011). Hardness assurance testing for proton direct ionization effects. 788–794. 4 indexed citations
11.
Campola, Michael J., Martin A. Carts, Megan C. Casey, et al.. (2011). Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems. NASA STI Repository (National Aeronautics and Space Administration). 1–10. 3 indexed citations
12.
Chen, Dakai, Jonathan A. Pellish, Anthony Phan, et al.. (2010). Radiation Performance of Commercial SiGe HBT BiCMOS High Speed Operational Amplifiers. NASA STI Repository (National Aeronautics and Space Administration). 5–5. 3 indexed citations
13.
Pellish, Jonathan A., M.A. Xapsos, Thomas Jordan, et al.. (2010). Impact of Spacecraft Shielding on Direct Ionization Soft Error Rates. NASA STI Repository (National Aeronautics and Space Administration). 1 indexed citations
14.
Chen, Dakai, Timothy R. Oldham, Hak Kim, et al.. (2010). Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA. 56. 8–8.
15.
Marshall, Cheryl J., Paul W. Marshall, Raymond L. Ladbury, et al.. (2010). New Particle-Induced Single Event Latchup Mechanism Observed in a Cryogenic CMOS Readout Integrated Circuit. NASA Technical Reports Server (NASA).
16.
Gadlage, Matthew J., Ronald D. Schrimpf, Balaji Narasimham, et al.. (2008). Assessing Alpha Particle-Induced Single Event Transient Vulnerability in a 90-nm CMOS Technology. IEEE Electron Device Letters. 29(6). 638–640. 18 indexed citations
17.
Sutton, Akil K., John D. Cressler, Martin A. Carts, et al.. (2007). Proton-induced SEU in SiGe digital logic at cryogenic temperatures. 53. 1–2. 5 indexed citations
18.
Tipton, Alan D., Jonathan A. Pellish, Patrick R. Fleming, et al.. (2007). High Energy Neutron Multiple-Bit Upset. 53. 1–3. 4 indexed citations
19.
Reed, Robert A., Robert A. Weller, Marcus H. Mendenhall, et al.. (2007). Impact of Ion Energy and Species on Single Event Effects Analysis. IEEE Transactions on Nuclear Science. 54(6). 2312–2321. 95 indexed citations
20.
Pellish, Jonathan A., Robert A. Reed, Akil K. Sutton, et al.. (2007). A Generalized SiGe HBT Single-Event Effects Model for On-Orbit Event Rate Calculations. IEEE Transactions on Nuclear Science. 54(6). 2322–2329. 25 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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