Michael L. Alles
Impact in
- Hardware and Architecture top 0.5%
- VLSI and Analog Circuit Testing
-
- Radiation Effects in Electronics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Low-power high-performance VLSI design
- Advanced Memory and Neural Computing
- Silicon Carbide Semiconductor Technologies
Papers in
-
- VLSI and Analog Circuit Testing 28
-
- Radiation Effects in Electronics 120
- Semiconductor materials and devices 111
- Advancements in Semiconductor Devices and Circuit Design 71
- Integrated Circuits and Semiconductor Failure Analysis 58
- Advanced Memory and Neural Computing 22
- Electrostatic Discharge in Electronics 15
- Low-power high-performance VLSI design 11
- Co-authors
- Ronald D. SchrimpfL. W. MassengillRobert A. ReedB. L. BhuvaArthur F. WitulskiDaniel M. FleetwoodEn Xia ZhangDennis R. Ball
- Journals
- IEEE Transactions on Nuclear Science (117 papers)Solid-State Electronics (4 papers)Applied Physics Letters (3 papers)Microelectronic Engineering (3 papers)Microelectronics Reliability (3 papers)
- Partner nations
- United StatesBelgiumFrance
In The Last Decade
Michael L. Alles
186 papers receiving 3.8k citations
Hit Papers
Peers
Comparison fields: 5 of 69
- Hardware and Architecture 942
- Electrical and Electronic Engineering 3.8k
- Radiation 88
- Materials Chemistry 342
- Electronic, Optical and Magnetic Materials 102
Countries citing papers authored by Michael L. Alles
This map shows the geographic impact of Michael L. Alles's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael L. Alles with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael L. Alles more than expected).
Fields of papers citing papers by Michael L. Alles
This network shows the impact of papers produced by Michael L. Alles. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael L. Alles. The network helps show where Michael L. Alles may publish in the future.
Co-authors
The 25 scholars most cited alongside Michael L. Alles, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 2024 | 19 | |
| 3 | 2024 | 8 | |
| 4 | 2023 | 5 | |
| 5 | 2023 | 3 | |
| 6 | 2023 | 1 | |
| 7 | 2023 | 1 | |
| 8 | 2022 | 5 | |
| 9 | 2022 | 9 | |
| 10 | 2021 | 3 | |
| 11 | 2021 | 12 | |
| 12 | 2019 | 1 | |
| 13 | 2019 | 5 | |
| 14 | 2019 | 9 | |
| 15 | 2019 | 23 | |
| 16 | 2017 | 21 | |
| 17 | 2017 | 2 | |
| 18 | 2017 | 21 | |
| 19 | 2017 | 15 | |
| 20 | 2006 | 3 |
About Michael L. Alles
Michael L. Alles is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Radiation, Safety, Risk, Reliability and Quality and Materials Chemistry, having authored 194 papers that have together received 4.0k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (120 papers), Semiconductor materials and devices (111 papers), Advancements in Semiconductor Devices and Circuit Design (71 papers), Integrated Circuits and Semiconductor Failure Analysis (58 papers), VLSI and Analog Circuit Testing (28 papers), Advanced Memory and Neural Computing (22 papers), Electrostatic Discharge in Electronics (15 papers) and Low-power high-performance VLSI design (11 papers). The work is most often cited by research in Hardware and Architecture (942 citations), Electrical and Electronic Engineering (3.8k citations), Radiation (88 citations), Materials Chemistry (342 citations) and Electronic, Optical and Magnetic Materials (102 citations). Michael L. Alles has collaborated with scholars based in United States, Belgium and France. Frequent co-authors include Ronald D. Schrimpf, L. W. Massengill, Robert A. Reed, B. L. Bhuva, Arthur F. Witulski, Daniel M. Fleetwood, En Xia Zhang, Dennis R. Ball, Andrew L. Sternberg and Oluwole A. Amusan. Their work appears in journals such as IEEE Transactions on Nuclear Science, Solid-State Electronics, Applied Physics Letters, Microelectronic Engineering and Microelectronics Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.