Simon Tam

1.5k total citations · 1 hit paper
2 papers, 1.1k citations indexed

About

Simon Tam is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Infectious Diseases. According to data from OpenAlex, Simon Tam has authored 2 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 2 papers in Electrical and Electronic Engineering, 1 paper in Materials Chemistry and 0 papers in Infectious Diseases. Recurrent topics in Simon Tam's work include Semiconductor materials and devices (2 papers), Advancements in Semiconductor Devices and Circuit Design (2 papers) and Integrated Circuits and Semiconductor Failure Analysis (1 paper). Simon Tam is often cited by papers focused on Semiconductor materials and devices (2 papers), Advancements in Semiconductor Devices and Circuit Design (2 papers) and Integrated Circuits and Semiconductor Failure Analysis (1 paper). Simon Tam collaborates with scholars based in United States and Italy. Simon Tam's co-authors include Ping-Keung Ko, K.W. Terrill, Fu-Chieh Hsu, Chenming Hu and Chenming Hu and has published in prestigious journals such as IEEE Journal of Solid-State Circuits and IEEE Transactions on Electron Devices.

In The Last Decade

Simon Tam

2 papers receiving 1.1k citations

Hit Papers

Hot-electron-induced MOSFET degradation—Model, ... 1985 2026 1998 2012 1985 250 500 750

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Simon Tam United States 2 1.1k 51 40 33 26 2 1.1k
Fu-Chieh Hsu United States 6 1.3k 1.1× 54 1.1× 41 1.0× 38 1.2× 27 1.0× 12 1.3k
D.E. Ward United States 7 575 0.5× 31 0.6× 13 0.3× 52 1.6× 50 1.9× 10 590
Christian Schlünder Germany 18 1.2k 1.1× 66 1.3× 46 1.1× 51 1.5× 26 1.0× 51 1.2k
Jeffrey B. Johnson United States 12 415 0.4× 21 0.4× 32 0.8× 41 1.2× 17 0.7× 49 431
L.R. Hite United States 10 488 0.4× 86 1.7× 30 0.8× 35 1.1× 5 0.2× 20 507
Toshihiro Sekigawa Japan 9 339 0.3× 46 0.9× 39 1.0× 34 1.0× 18 0.7× 48 353
M. Cho Belgium 12 446 0.4× 50 1.0× 9 0.2× 28 0.8× 12 0.5× 24 457
S. Ramey United States 15 684 0.6× 45 0.9× 44 1.1× 115 3.5× 20 0.8× 50 732
Jenn-Gang Chern United States 7 420 0.4× 30 0.6× 23 0.6× 45 1.4× 6 0.2× 13 436
D. Moy United States 11 372 0.3× 27 0.5× 47 1.2× 88 2.7× 13 0.5× 31 395

Countries citing papers authored by Simon Tam

Since Specialization
Citations

This map shows the geographic impact of Simon Tam's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Simon Tam with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Simon Tam more than expected).

Fields of papers citing papers by Simon Tam

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Simon Tam. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Simon Tam. The network helps show where Simon Tam may publish in the future.

Co-authorship network of co-authors of Simon Tam

This figure shows the co-authorship network connecting the top 25 collaborators of Simon Tam. A scholar is included among the top collaborators of Simon Tam based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Simon Tam. Simon Tam is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

2 of 2 papers shown
1.
Hu, Chenming, et al.. (1985). Hot-electron-induced MOSFET degradation—Model, monitor, and improvement. IEEE Transactions on Electron Devices. 32(2). 375–385. 891 indexed citations breakdown →
2.
Hu, Chenming, et al.. (1985). Hot-Electron-Induced MOSFET Degradation - Model, Monitor, and Improvement. IEEE Journal of Solid-State Circuits. 20(1). 295–305. 235 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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