Hak Kim

1.1k total citations
71 papers, 832 citations indexed

About

Hak Kim is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Aerospace Engineering. According to data from OpenAlex, Hak Kim has authored 71 papers receiving a total of 832 indexed citations (citations by other indexed papers that have themselves been cited), including 68 papers in Electrical and Electronic Engineering, 23 papers in Hardware and Architecture and 8 papers in Aerospace Engineering. Recurrent topics in Hak Kim's work include Radiation Effects in Electronics (56 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers) and Semiconductor materials and devices (20 papers). Hak Kim is often cited by papers focused on Radiation Effects in Electronics (56 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers) and Semiconductor materials and devices (20 papers). Hak Kim collaborates with scholars based in United States, South Korea and Ireland. Hak Kim's co-authors include Anthony M. Phan, Kenneth A. LaBel, C.M. Seidleck, Jean‐Marie Lauenstein, M. Friendlich, Edward P. Wilcox, Megan C. Casey, Melanie D. Berg, Jonathan A. Pellish and Anthony Phan and has published in prestigious journals such as Japanese Journal of Applied Physics, Solid-State Electronics and IEEE Transactions on Nuclear Science.

In The Last Decade

Hak Kim

64 papers receiving 785 citations

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
Hak Kim 783 167 85 62 62 71 832
P. Calvel 867 1.1× 137 0.8× 57 0.7× 34 0.5× 52 0.8× 59 912
J. Boch 1.0k 1.3× 169 1.0× 83 1.0× 48 0.8× 22 0.4× 92 1.1k
M. Friendlich 1.1k 1.4× 356 2.1× 121 1.4× 98 1.6× 32 0.5× 37 1.1k
Martin A. Carts 1.0k 1.3× 258 1.5× 70 0.8× 20 0.3× 49 0.8× 56 1.1k
G.L. Hash 1.6k 2.0× 339 2.0× 136 1.6× 70 1.1× 35 0.6× 48 1.6k
C.M. Seidleck 1.2k 1.6× 280 1.7× 174 2.0× 128 2.1× 62 1.0× 64 1.3k
B.G. Rax 1.0k 1.3× 133 0.8× 64 0.8× 14 0.2× 51 0.8× 64 1.1k
A. I. Chumakov 661 0.8× 188 1.1× 66 0.8× 15 0.2× 25 0.4× 91 715
F. Miller 614 0.8× 138 0.8× 57 0.7× 21 0.3× 19 0.3× 44 661
Gilles Gasiot 1.7k 2.1× 726 4.3× 134 1.6× 42 0.7× 37 0.6× 89 1.7k

Countries citing papers authored by Hak Kim

Since Specialization
Citations

This map shows the geographic impact of Hak Kim's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hak Kim with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hak Kim more than expected).

Fields of papers citing papers by Hak Kim

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Hak Kim. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hak Kim. The network helps show where Hak Kim may publish in the future.

Co-authorship network of co-authors of Hak Kim

This figure shows the co-authorship network connecting the top 25 collaborators of Hak Kim. A scholar is included among the top collaborators of Hak Kim based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Hak Kim. Hak Kim is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Berg, Melanie D., Hak Kim, Anthony Phan, et al.. (2019). Microsemi RTG4 Rev C Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report. NASA Technical Reports Server (NASA). 1 indexed citations
3.
Berg, Melanie D., Hak Kim, Anthony Phan, et al.. (2018). Xilinx Kintex-UltraScale Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report. NASA Technical Reports Server (NASA). 3 indexed citations
4.
Chen, Dakai, et al.. (2017). Heavy Ion Test Report for the AD9257-EP Analog-to-Digital Converter. NASA Technical Reports Server (NASA). 1 indexed citations
5.
Chen, Dakai, Edward P. Wilcox, Raymond L. Ladbury, et al.. (2017). Evaluation of the Radiation Susceptibility of a 3D NAND Flash Memory. NASA STI Repository (National Aeronautics and Space Administration). 2 indexed citations
6.
Berg, Melanie D., Hak Kim, Anthony Phan, C.M. Seidleck, & K.A. LaBel. (2016). Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data. NASA Technical Reports Server (NASA). 1 indexed citations
7.
Chen, Dakai, Edward P. Wilcox, Melanie D. Berg, et al.. (2015). Single-Event Effect Performance of a Conductive-Bridge Memory EEPROM. IEEE Transactions on Nuclear Science. 62(6). 2703–2708. 12 indexed citations
8.
Casey, Megan C., Jean‐Marie Lauenstein, Edward P. Wilcox, et al.. (2014). Destructive Single-Event Failures in Schottky Diodes. NASA Technical Reports Server (NASA). 3 indexed citations
9.
Lauenstein, Jean‐Marie, Megan C. Casey, Edward P. Wilcox, et al.. (2013). Recent Radiation Test Results for Power MOSFETs. NASA STI Repository (National Aeronautics and Space Administration). 1–6. 8 indexed citations
10.
Lauenstein, Jean‐Marie, Sandra Liu, Jeffrey L. Titus, et al.. (2011). Probing the SEB Sensitive Depth of a Power MOSFET Using a Two-Photon Absorption Laser Method. NASA Technical Reports Server (NASA). 3 indexed citations
11.
Rodbell, Kenneth P., David F. Heidel, Jonathan A. Pellish, et al.. (2011). 32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches. IEEE Transactions on Nuclear Science. 58(6). 2702–2710. 51 indexed citations
12.
Lauenstein, Jean‐Marie, Neil Goldsman, Sandra Liu, et al.. (2011). Effects of Ion Atomic Number on Single-Event Gate Rupture (SEGR) Susceptibility of Power MOSFETs. IEEE Transactions on Nuclear Science. 58(6). 2628–2636. 20 indexed citations
13.
Chen, Dakai, Jonathan A. Pellish, Anthony Phan, et al.. (2010). Radiation Performance of Commercial SiGe HBT BiCMOS High Speed Operational Amplifiers. NASA STI Repository (National Aeronautics and Space Administration). 5–5. 3 indexed citations
14.
Chen, Dakai, Timothy R. Oldham, Hak Kim, et al.. (2010). Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA. 56. 8–8.
15.
Berg, Melanie D., S. Büchner, Hak Kim, et al.. (2010). Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device Testing. IEEE Transactions on Nuclear Science. 57(4). 1958–1965. 6 indexed citations
16.
Chen, Dakai, S. Büchner, Anthony M. Phan, et al.. (2009). The Effects of Elevated Temperature on Pulsed-Laser-Induced Single Event Transients in Analog Devices. IEEE Transactions on Nuclear Science. 56(6). 3138–3144. 8 indexed citations
17.
Berg, Melanie D., Kenneth A. LaBel, Hak Kim, et al.. (2009). A Comprehensive Methodology for Complex Field Programmable Gate Array Single Event Effects Test and Evaluation. IEEE Transactions on Nuclear Science. 56(2). 366–374. 10 indexed citations
18.
Poivey, C., Melanie D. Berg, M. Friendlich, et al.. (2007). Single Event Effects (SEE) response of embedded power PCs in a Xilinx Virtex-4 FPGA for a space application. 1–5. 10 indexed citations
19.
Marshall, Paul W., et al.. (2004). The Impact of System Configuration on Device Radiation Damage Testing of Optical Components. ESA Special Publication. 536. 17. 1 indexed citations
20.
Marshall, Paul W., et al.. (2003). Proton-induced bit error studies in a 10 gigabit per second fiber optic link. 23–26. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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