Hak Kim
About
In The Last Decade
Hak Kim
64 papers receiving 785 citations
Peers
Comparison fields: 5 of 52
- Electrical and Electronic Engineering 783
- Hardware and Architecture 167
- Radiation 85
- Pulmonary and Respiratory Medicine 62
- Aerospace Engineering 62
Countries citing papers authored by Hak Kim
This map shows the geographic impact of Hak Kim's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Hak Kim with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Hak Kim more than expected).
Fields of papers citing papers by Hak Kim
This network shows the impact of papers produced by Hak Kim. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Hak Kim. The network helps show where Hak Kim may publish in the future.
Co-authorship network of co-authors of Hak Kim
This figure shows the co-authorship network connecting the top 25 collaborators of Hak Kim. A scholar is included among the top collaborators of Hak Kim based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Hak Kim. Hak Kim is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | Microsemi RTG4 Rev C Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report | 1 |
| 3 | Xilinx Kintex-UltraScale Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report | 3 |
| 4 | Heavy Ion Test Report for the AD9257-EP Analog-to-Digital Converter | 1 |
| 5 | Evaluation of the Radiation Susceptibility of a 3D NAND Flash Memory | 2 |
| 6 | Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary Data | 1 |
| 7 | 12 | |
| 8 | Destructive Single-Event Failures in Schottky Diodes | 3 |
| 9 | 8 | |
| 10 | 20 | |
| 11 | 51 | |
| 12 | Probing the SEB Sensitive Depth of a Power MOSFET Using a Two-Photon Absorption Laser Method | 3 |
| 13 | 3 | |
| 14 | 0 | |
| 15 | 6 | |
| 16 | 8 | |
| 17 | 0 | |
| 18 | The Impact of System Configuration on Device Radiation Damage Testing of Optical Components | 1 |
| 19 | 7 | |
| 20 | Proton-induced bit error studies in a 10 gigabit per second fiber optic link | 1 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.