D. Misra

1.4k total citations
132 papers, 1.0k citations indexed

About

D. Misra is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, D. Misra has authored 132 papers receiving a total of 1.0k indexed citations (citations by other indexed papers that have themselves been cited), including 121 papers in Electrical and Electronic Engineering, 18 papers in Atomic and Molecular Physics, and Optics and 16 papers in Materials Chemistry. Recurrent topics in D. Misra's work include Semiconductor materials and devices (98 papers), Advancements in Semiconductor Devices and Circuit Design (68 papers) and Ferroelectric and Negative Capacitance Devices (39 papers). D. Misra is often cited by papers focused on Semiconductor materials and devices (98 papers), Advancements in Semiconductor Devices and Circuit Design (68 papers) and Ferroelectric and Negative Capacitance Devices (39 papers). D. Misra collaborates with scholars based in United States, Belgium and India. D. Misra's co-authors include P. Srinivasan, Cor Claeys, Eddy Simoen, Hiroshi Iwai, E.L. Heasell, L. Pantisano, Hei Wong, T.R. Viswanathan, G. Bersuker and Rino Choi and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and NeuroImage.

In The Last Decade

D. Misra

125 papers receiving 985 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
D. Misra United States	17	906	252	134	114	94	132	1.0k
B.P. Linder United States	22	1.8k 1.9×	251 1.0×	150 1.1×	68 0.6×	120 1.3×	85	1.8k
Jinjuan Xiang China	18	1.2k 1.3×	497 2.0×	156 1.2×	182 1.6×	65 0.7×	116	1.3k
Jun H. Souk South Korea	12	350 0.4×	156 0.6×	188 1.4×	83 0.7×	239 2.5×	39	575
Laurie E. Calvet France	14	415 0.5×	400 1.6×	245 1.8×	225 2.0×	58 0.6×	41	829
J.J. Liou United States	16	1.4k 1.5×	222 0.9×	236 1.8×	223 2.0×	36 0.4×	68	1.5k
Katsuhisa Aratani Taiwan	12	423 0.5×	204 0.8×	225 1.7×	100 0.9×	44 0.5×	39	575
Seok-Lyul Lee Taiwan	13	388 0.4×	230 0.9×	316 2.4×	120 1.1×	353 3.8×	24	786
Paru Deshpande United States	8	408 0.5×	339 1.3×	220 1.6×	238 2.1×	67 0.7×	12	780
Winston Chern United States	14	802 0.9×	484 1.9×	131 1.0×	504 4.4×	88 0.9×	47	1.1k
Tengfei Yan China	15	537 0.6×	740 2.9×	123 0.9×	115 1.0×	90 1.0×	33	884

Countries citing papers authored by D. Misra

Since Specialization

Citations

This map shows the geographic impact of D. Misra's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Misra with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Misra more than expected).

Fields of papers citing papers by D. Misra

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. Misra. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Misra. The network helps show where D. Misra may publish in the future.

Co-authorship network of co-authors of D. Misra

This figure shows the co-authorship network connecting the top 25 collaborators of D. Misra. A scholar is included among the top collaborators of D. Misra based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. Misra. D. Misra is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Trevisoli, Renan, et al.. (2024). Characterization of Switching Properties in ReRAM Devices by the Capacitance of the MIM Structure. Journal of Integrated Circuits and Systems. 19(2). 1–6. 1 indexed citations

Trevisoli, Renan, et al.. (2024). Experimental Comparison of HfO_2/X-Based ReRAM Devices Switching Properties by the MIM Capacitance. IEEE Journal of the Electron Devices Society. 12. 1037–1043.

Misra, D.. (2023). Special Issue of Interface on Neuromorphic Computing: An Introduction and State of the Field. The Electrochemical Society Interface. 32(1). 45–46. 4 indexed citations

Trevisoli, Renan, et al.. (2023). Experimental Characterization of Switching Properties of ReRAM Devices by the Capacitance Measurements. 1–4. 1 indexed citations

Friedman, Robert, et al.. (2020). Active Research Experience For Undergraduates Increases Students' Motivation And Academic Performance. Papers on Engineering Education Repository (American Society for Engineering Education). 8.161.1–8.161.18. 2 indexed citations

Djavid, Mehrdad, et al.. (2017). Fabrication of Phosphor-Free III-Nitride Nanowire Light-Emitting Diodes on Metal Substrates for Flexible Photonics. ACS Omega. 2(9). 5708–5714. 12 indexed citations

Misra, D., et al.. (2017). Flicker Noise Performance on Thick and Thin Oxide FinFETs. IEEE Transactions on Electron Devices. 64(5). 2321–2325. 14 indexed citations

Yuan, Rui, Paul A. Taylor, Tara L. Alvarez, D. Misra, & Bharat B. Biswal. (2017). MAPBOT: Meta-analytic parcellation based on text, and its application to the human thalamus. NeuroImage. 157. 716–732. 4 indexed citations

Misra, D., Kandabara Tapily, Robert D. Clark, et al.. (2015). Interface state density engineering in Hf1-xZrxO2/SiON/Si gate stack. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 34(1).

10.

Misra, D.. (2012). Interface engineering of high-K and high-mobility substrate interface. 173. 1–4. 2 indexed citations

11.

Misra, D., Hiroshi Iwai, Yaw S. Obeng, Toyohiro Chikyow, & Jan Vanhellemont. (2008). Dielectrics for nanosystems 3: materials science, processing, reliability, and manufacturing. 6 indexed citations

12.

Misra, D., et al.. (2008). TiN/HfO[sub 2]/SiO[sub 2]/Si Gate Stack Breakdown: Contribution of HfO[sub 2] and Interfacial SiO[sub 2] Layer. Journal of The Electrochemical Society. 155(10). G194–G194. 4 indexed citations

13.

Misra, D., et al.. (2008). Breakdown Characteristics of High-k Gate Dielectrics with Metal Gates. ECS Transactions. 13(2). 91–97. 1 indexed citations

14.

Misra, D., et al.. (2007). Charge Trapping at Deep States in Hf–Silicate Based High-κ Gate Dielectrics. Journal of The Electrochemical Society. 154(2). G30–G30. 49 indexed citations

15.

Brukh, Roman, et al.. (2006). Design and fabrication of heated microchannels. Sensors and Materials. 18(1). 35–48. 4 indexed citations

16.

Misra, D., et al.. (2006). Effect of Ge Surface Nitridation on the Ge/HfO 2 /Al MOS Devices. 2 indexed citations

17.

Srinivasan, P., et al.. (2006). Trapping in deep defects under substrate hot electron stress in TiN/Hf-silicate based gate stacks. Solid-State Electronics. 51(1). 102–110. 5 indexed citations

18.

Srinivasan, P., et al.. (2006). Gate electrode effects on low-frequency (1/f) noise in p-MOSFETs with high-κ dielectrics. Solid-State Electronics. 50(6). 992–998. 25 indexed citations

19.

Misra, D., Hiroshi Iwai, & Hei Wong. (2005). High-k gate dielectrics. The Electrochemical Society Interface. 14(2). 30–34. 13 indexed citations

20.

Misra, D. & T.R. Viswanathan. (1986). CIRCUIT DESIGN FOR A CMOS MAGNETIC FIELD SENSOR.. International Symposium on Circuits and Systems. 1183–1185. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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