D. Misra

1.4k citations

132 papers · 1.0k indexed · h-index 17

Impact in

Electrical and Electronic Engineering top 5%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Advanced Memory and Neural Computing
- Thin-Film Transistor Technologies
Materials Chemistry
- Electronic and Structural Properties of Oxides

Papers in ⓘ

Electrical and Electronic Engineering 121
- Semiconductor materials and devices 98
- Advancements in Semiconductor Devices and Circuit Design 68
- Ferroelectric and Negative Capacitance Devices 39
- Integrated Circuits and Semiconductor Failure Analysis 27
- Advanced Memory and Neural Computing 22
- Silicon and Solar Cell Technologies 6
Atomic and Molecular Physics, and Optics 18
- Semiconductor materials and interfaces 16

Co-authors: P. Srinivasan (19 shared papers)Cor Claeys (6 shared papers)Hiroshi Iwai (4 shared papers)Eddy Simoen (6 shared papers)E.L. Heasell (3 shared papers)L. Pantisano (5 shared papers)Hei Wong (2 shared papers)Chadwin D. Young (3 shared papers)
Journals: Journal of The Electrochemical Society (10 papers)Applied Physics Letters (8 papers)IEEE Transactions on Device and Materials Reliability (7 papers)IEEE Transactions on Electron Devices (7 papers)Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (6 papers)
Partner nations: United States Belgium India

In The Last Decade

D. Misra

125 papers receiving 985 citations

Peers

Countries citing papers authored by D. Misra

Since Specialization

Citations

This map shows the geographic impact of D. Misra's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Misra with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Misra more than expected).

Fields of papers citing papers by D. Misra

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. Misra. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Misra. The network helps show where D. Misra may publish in the future.

Co-authors

The 25 scholars most cited alongside D. Misra, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with D. Misra Line = papers co-authored together D. Misra links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 132 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Detection of cancer antigens (CA-125) using gold nano particles on interdigitated electrode-based microfluidic biosensor Nano Convergence ·Bharath Babu Nunna, Debdyuti Mandal, Joo Un Lee, Harsimranjit Singh, Shiqiang Zhuang, D. Misra, Md Nasir Uddin Bhuyian, Eon Soo Lee	2019	57
2	Charge Trapping at Deep States in Hf–Silicate Based High-κ Gate Dielectrics Journal of The Electrochemical Society ·N. A. Chowdhury, D. Misra	2007	49
3	Impact of the interfacial layer on the low-frequency noise (1/f) behavior of MOSFETs with advanced gate stacks IEEE Electron Device Letters ·Felice Crupi, P. Srinivasan, Paolo Magnone, Eddy Simoen, C. Nick Pace, D. Misra, Cor Claeys	2006	49
4	Impact of high-k gate stack material with metal gates on LF noise in n- and p-MOSFETs Microelectronic Engineering ·P. Srinivasan, Eddy Simoen, L. Pantisano, Cor Claeys, D. Misra	2005	34
5	High-k Gate Dielectrics The Electrochemical Society Interface ·D. Misra, Hiroshi Iwai, Hei Wong	2005	27
6	Charge trapping and interface characteristics of thermally evaporated HfO2 Applied Physics Letters ·N. A. Chowdhury, Reenu Garg, D. Misra	2004	27
7	Progressive Breakdown Characteristics of High-K/Metal Gate Stacks G. Bersuker, Nabil Chowdhury, Chadwin D. Young, Dawei Heh, D. Misra, Rino Choi	2007	27
8	Gate electrode effects on low-frequency (1/f) noise in p-MOSFETs with high-κ dielectrics Solid-State Electronics ·P. Srinivasan, E. Simôen, R. Singanamalla, H.Y. Yu, C. Claeys, D. Misra	2006	25
9	Controlling color emission of InGaN/AlGaN nanowire light-emitting diodes grown by molecular beam epitaxy Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ·Moab Rajan Philip, Dipayan Choudhary, Mehrdad Djavid, Md Nasiruddin Bhuyian, J. Piao, Phạm Thị, D. Misra, Hieu Pham Trung Nguyen	2017	24
10	Low-Frequency (1∕f) Noise Performance of n- and p-MOSFETs with Poly-Si∕Hf-Based Gate Dielectrics Journal of The Electrochemical Society ·P. Srinivasan, E. Simoen, L. Pantisano, C Claeys, D. Misra	2006	21
11	Interface characterization of high-k dielectrics on Ge substrates Materials Science in Semiconductor Processing ·D. Misra, Reenu Garg, P. Srinivasan, Nilufa Rahim, N. A. Chowdhury	2006	20
12	Improved dielectric properties and their temperature insensitivity in multilayered Ba0.8Sr0.2TiO3/ZrO2 thin films Journal of Applied Physics ·Santosh K. Sahoo, D. Misra, Manjulata Sahoo, Carolyn A. MacDonald, H. Bakhru, D. C. Agrawal, Y. N. Mohapatra, S. B. Majumder, Ram S. Katiyar	2011	19
13	A novel high gain MOS magnetic field sensor Sensors and Actuators ·D. Misra, T.R. Viswanathan, E.L. Heasell	1986	17
14	Breakdown characteristics of nFETs in inversion with metal/HfO2 gate stacks Microelectronic Engineering ·N. A. Chowdhury, G. Bersuker, Chadwin D. Young, Rino Choi, S. Krishnan, D. Misra	2007	17
15	Self-Heating Assessment on Bulk FinFET Devices Through Characterization and Predictive Simulation IEEE Transactions on Device and Materials Reliability ·P. Paliwoda, Prashanth Paramahans Manik, Dhruv Singh, Z. Chbili, A. Kerber, Jeffrey B. Johnson, D. Misra	2018	17
16	Self-Heating Effects on Hot Carrier Degradation and Its Impact on Logic Circuit Reliability IEEE Transactions on Device and Materials Reliability ·P. Paliwoda, Z. Chbili, A. Kerber, Tanya Nigam, K. Nagahiro, S. Cimino, M. Toledano-Luque, L. Pantisano, B. Min, D. Misra	2019	16
17	Electrical Characteristics of Thermally Evaporated HfO[sub 2] Journal of The Electrochemical Society ·Reenu Garg, N. A. Chowdhury, Madhu Bhaskaran, P.K. Swain, D. Misra	2004	16
18	Temperature Effects on Breakdown Characteristics of High-$\kappa$ Gate Dielectrics With Metal Gates IEEE Transactions on Device and Materials Reliability ·Nilufa Rahim, D. Misra	2008	16
19	Charge trapping in ultrathin hafnium silicate/metal gate stacks IEEE Electron Device Letters ·P. Srinivasan, N. A. Chowdhury, D. Misra	2005	16
20	Electrical damage to silicon devices due to reactive ion etching Semiconductor Science and Technology ·D. Misra, E.L. Heasell	1990	16

About D. Misra

D. Misra is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Electronic, Optical and Magnetic Materials and Computer Networks and Communications, having authored 132 papers that have together received 1.0k indexed citations. Recurring topics across this work include Semiconductor materials and devices (98 papers), Advancements in Semiconductor Devices and Circuit Design (68 papers), Ferroelectric and Negative Capacitance Devices (39 papers), Integrated Circuits and Semiconductor Failure Analysis (27 papers), Advanced Memory and Neural Computing (22 papers), Semiconductor materials and interfaces (16 papers), Copper Interconnects and Reliability (7 papers) and Silicon and Solar Cell Technologies (6 papers). The work is most often cited by research in Electrical and Electronic Engineering (906 citations), Materials Chemistry (252 citations), Electronic, Optical and Magnetic Materials (94 citations), Atomic and Molecular Physics, and Optics (134 citations) and Condensed Matter Physics (45 citations). D. Misra has collaborated with scholars based in United States, Belgium and India. Frequent co-authors include P. Srinivasan, Cor Claeys, Hiroshi Iwai, Eddy Simoen, E.L. Heasell, L. Pantisano, Hei Wong, Chadwin D. Young, T.R. Viswanathan and G. Bersuker. Their work appears in journals such as Journal of The Electrochemical Society, Applied Physics Letters, IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Electron Devices and Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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