N. Rochat
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- Semiconductor materials and devices 68
- Advancements in Semiconductor Devices and Circuit Design 14
- Integrated Circuits and Semiconductor Failure Analysis 12
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- Copper Interconnects and Reliability 20
- Surfaces, Coatings and Films top 5%
- Structural Biology top 10%
- Condensed Matter Physics top 10%
- GaN-based semiconductor devices and materials 20
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- Semiconductor Quantum Structures and Devices 14
- Semiconductor materials and interfaces 13
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- Metal and Thin Film Mechanics 13
- Co-authors
- Christophe LicitraAmal ChabliJérôme Le PerchecMichel OlivierR. Espiau de LamaëstreP. MurF. BertinE. Martínez
- Cited by
- Electrical and Electronic EngineeringElectronic, Optical and Magnetic MaterialsSurfaces, Coatings and Films
- Journals
- Journal of Applied Physics (10 papers)Microelectronic Engineering (8 papers)Thin Solid Films (5 papers)
- Partner nations
- FranceSwitzerlandUnited States
In The Last Decade
N. Rochat
118 papers receiving 1.3k citations
Peers
Comparison fields: 5 of 55
- Electrical and Electronic Engineering 1.0k
- Electronic, Optical and Magnetic Materials 301
- Surfaces, Coatings and Films 90
- Structural Biology 18
- Condensed Matter Physics 131
Countries citing papers authored by N. Rochat
This map shows the geographic impact of N. Rochat's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Rochat with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Rochat more than expected).
Fields of papers citing papers by N. Rochat
This network shows the impact of papers produced by N. Rochat. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Rochat. The network helps show where N. Rochat may publish in the future.
Co-authorship network
The 25 scholars most cited alongside N. Rochat, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 0 | |
| 2 | 2024 | 4 | |
| 3 | 2024 | 3 | |
| 4 | 2024 | 1 | |
| 5 | 2024 | 2 | |
| 6 | 2024 | 0 | |
| 7 | 2024 | 1 | |
| 8 | 2024 | 1 | |
| 9 | 2023 | 1 | |
| 10 | 2023 | 4 | |
| 11 | 2021 | 7 | |
| 12 | 2021 | 6 | |
| 13 | 2020 | 3 | |
| 14 | Hydrogen passivation of silicon/silicon oxide interface by atomic layer deposited hafnium oxide and impact of silicon oxide underlayer | 2018 | 1 |
| 15 | 2015 | 20 | |
| 16 | 2011 | 17 | |
| 17 | 2011 | 9 | |
| 18 | 2007 | 3 | |
| 19 | 2007 | 2 | |
| 20 | 2002 | 28 |
About N. Rochat
N. Rochat is a scholar working on Condensed Matter Physics, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, having authored 121 papers that have together received 1.3k indexed citations. Recurring topics across this work include Semiconductor materials and devices (68 papers), GaN-based semiconductor devices and materials (20 papers), Copper Interconnects and Reliability (20 papers), Semiconductor Quantum Structures and Devices (14 papers), Advancements in Semiconductor Devices and Circuit Design (14 papers), Semiconductor materials and interfaces (13 papers), Metal and Thin Film Mechanics (13 papers) and Integrated Circuits and Semiconductor Failure Analysis (12 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.0k citations), Electronic, Optical and Magnetic Materials (301 citations) and Surfaces, Coatings and Films (90 citations). N. Rochat has collaborated with scholars based in France, Switzerland and United States. Frequent co-authors include Christophe Licitra, Amal Chabli, Jérôme Le Perchec, Michel Olivier, R. Espiau de Lamaëstre, P. Mur, F. Bertin, E. Martínez, Yohan Désières and Jean‐Paul Barnes. Their work appears in journals such as Journal of Applied Physics, Microelectronic Engineering, Thin Solid Films, Applied Physics Letters and Nanotechnology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.