M. Radhakrishnan

1.6k citations

87 papers · 1.1k indexed · h-index 19

Impact in

Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
Mechanical Engineering top 5%
- Additive Manufacturing Materials and Processes
- High Entropy Alloys Studies
- Aluminum Alloys Composites Properties

Papers in ⓘ

Electrical and Electronic Engineering 52
- Semiconductor materials and devices 35
- Integrated Circuits and Semiconductor Failure Analysis 20
- Advancements in Semiconductor Devices and Circuit Design 18
Electronic, Optical and Magnetic Materials 16
- Copper Interconnects and Reliability 10

Co-authors: K. L. Pey (19 shared papers)C. Balasubramanian (24 shared papers)Jacob George (2 shared papers)Narendra B. Dahotre (18 shared papers)Ching‐Hsuan Tung (12 shared papers)Weiyuan Lin (10 shared papers)Shashank Sharma (12 shared papers)Sameehan S. Joshi (13 shared papers)
Journals: Thin Solid Films (11 papers)Journal of Materials Science (5 papers)Journal of Non-Crystalline Solids (3 papers)Applied Physics Letters (3 papers)Additive manufacturing (3 papers)
Partner nations: India United States Singapore

In The Last Decade

M. Radhakrishnan

84 papers receiving 1.1k citations

Peers

Countries citing papers authored by M. Radhakrishnan

Since Specialization

Citations

This map shows the geographic impact of M. Radhakrishnan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Radhakrishnan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Radhakrishnan more than expected).

Fields of papers citing papers by M. Radhakrishnan

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Radhakrishnan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Radhakrishnan. The network helps show where M. Radhakrishnan may publish in the future.

Co-authors

The 25 scholars most cited alongside M. Radhakrishnan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M. Radhakrishnan Line = papers co-authored together M. Radhakrishnan links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 87 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Electrical conduction in coevaporated antimony trisulphide films Solid State Communications ·Jacob George, M. Radhakrishnan	1980	91
2	Percolation path and dielectric-breakdown-induced-epitaxy evolution during ultrathin gate dielectric breakdown transient Applied Physics Letters ·Chih Hang Tung, K. L. Pey, Lei Tang, M. Radhakrishnan, Wen H. Lin, Félix Palumbo, S. Lombardo	2003	82
3	Polarity-dependent dielectric breakdown-induced epitaxy (DBIE) in Si MOSFETs IEEE Electron Device Letters ·Ching‐Hsuan Tung, K. L. Pey, Weiyuan Lin, M. Radhakrishnan	2002	59
4	Microstructures and properties of Ti/TiC composites fabricated by laser-directed energy deposition Additive manufacturing ·M. Radhakrishnan, Md Mehadi Hassan, BE Long, David Otazu, TJ Lienert, O. Anderoglu	2021	55
5	Effect of current direction on the lifetime of different levels of Cu dual-damascene metallization Applied Physics Letters ·Chee Lip Gan, Carl V. Thompson, K. L. Pey, W. K. Choi, Huay Ling Tay, Bo Yu, M. Radhakrishnan	2001	52
6	Multiphysics multi-scale computational framework for linking process–structure–property relationships in metal additive manufacturing: a critical review International Materials Reviews ·Shashank Sharma, Sameehan S. Joshi, Mangesh V. Pantawane, M. Radhakrishnan, Sangram Mazumder, Narendra B. Dahotre	2023	47
7	Dielectric behaviour of lanthanum oxide thin film capacitors Thin Solid Films ·T. Mahalingam, M. Radhakrishnan, C. Palasubramanian	1981	46
8	Laser based additive manufacturing of tungsten: Multi-scale thermo-kinetic and thermo-mechanical computational model and experiments Acta Materialia ·Shashank Sharma, K.V. Mani Krishna, Sameehan S. Joshi, M. Radhakrishnan, Selvamurugan Palaniappan, Saikumar Dussa, Rajarshi Banerjee, Narendra B. Dahotre	2023	43
9	A pseudo thermo-mechanical model linking process parameters to microstructural evolution in multilayer additive friction stir deposition of magnesium alloy Materials & Design ·Shashank Sharma, K.V. Mani Krishna, M. Radhakrishnan, Mangesh V. Pantawane, Shreyash M. Patil, Sameehan S. Joshi, Rajarshi Banerjee, Narendra B. Dahotre	2022	43
10	A multi modal approach to microstructure evolution and mechanical response of additive friction stir deposited AZ31B Mg alloy Scientific Reports ·Sameehan S. Joshi, Shashank Sharma, M. Radhakrishnan, Mangesh V. Pantawane, Shreyash M. Patil, Yuqi Jin, Teng Yang, Daniel A. Riley, Rajarshi Banerjee, Narendra B. Dahotre	2022	38
11	Gate Dielectric-Breakdown-Induced Microstructural Damage in MOSFETs IEEE Transactions on Device and Materials Reliability ·Lei Tang, K. L. Pey, Ching‐Hsuan Tung, M. Radhakrishnan, W.H. Lin	2004	27
12	Thermo-mechanical process variables driven microstructure evolution during additive friction stir deposition of IN625 Additive manufacturing ·Shreyash M. Patil, K.V. Mani Krishna, Shashank Sharma, Sameehan S. Joshi, M. Radhakrishnan, Rajarshi Banerjee, Narendra B. Dahotre	2024	25
13	Dielectric of properties of lanthanum fluoride thin films Thin Solid Films ·T. Mahalingam, M. Radhakrishnan, C. Balasubramanian	1979	24
14	Dielectric breakdown induced epitaxy in ultrathin gate oxide - a reliability concern K. L. Pey, Ching‐Hsuan Tung, M. Radhakrishnan, L.J. Tang, Weiyuan Lin	2003	24
15	Influence of sprayed nanocrystalline Zn-doped TiO2 photoelectrode with the dye extracted from Hibiscus Surattensis as sensitizer in dye-sensitized solar cell Ceramics International ·A. Arunachalam, S. Dhanapandian, C. Manoharan, M. Bououdina, G. Ramalingam, M. Pallikonda Rajasekaran, M. Radhakrishnan, A. Mohamed Ibraheem	2016	21
16	Gate dielectric degradation mechanism associated with DBIE evolution K. L. Pey, Rakesh Ranjan, Ching‐Hsuan Tung, L.J. Tang, Weiyuan Lin, M. Radhakrishnan	2004	20
17	Size difference in dielectric-breakdown-induced epitaxy in narrow n- and p-metal oxide semiconductor field effect transistors Applied Physics Letters ·K. L. Pey, C. H. Tung, Lei Tang, Weiyuan Lin, M. Radhakrishnan	2003	19
18	Magnetic and mechanical properties of additively manufactured Alx(CoFeNi) complex concentrated alloys Scripta Materialia ·Varun Chaudhary, Mohan Sai Kiran Kumar Yadav Nartu, Sriswaroop Dasari, S.M. Varahabhatla, Abhishek Sharma, M. Radhakrishnan, S.A. Mantri, Stéphane Gorsse, Narendra B. Dahotre, R.V. Ramanujan, Rajarshi Banerjee	2022	19
19	Thickness dependence of defect density in silver films Thin Solid Films ·K. Narayandas, M. Radhakrishnan, C. Balasubramanian	1980	18
20	Dielectric properties of ion plated titanium oxide thin films Journal of Non-Crystalline Solids ·Bellan Babuji, C. Balasubramanian, M. Radhakrishnan	1983	18

About M. Radhakrishnan

M. Radhakrishnan is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry, Mechanical Engineering and Ceramics and Composites, having authored 87 papers that have together received 1.1k indexed citations. Recurring topics across this work include Semiconductor materials and devices (35 papers), Integrated Circuits and Semiconductor Failure Analysis (20 papers), Advancements in Semiconductor Devices and Circuit Design (18 papers), Additive Manufacturing Materials and Processes (15 papers), High Entropy Alloys Studies (11 papers), Copper Interconnects and Reliability (10 papers), Inorganic Fluorides and Related Compounds (7 papers) and Advanced materials and composites (5 papers). The work is most often cited by research in Electrical and Electronic Engineering (603 citations), Mechanical Engineering (386 citations), Electronic, Optical and Magnetic Materials (156 citations), Materials Chemistry (377 citations) and Automotive Engineering (93 citations). M. Radhakrishnan has collaborated with scholars based in India, United States and Singapore. Frequent co-authors include K. L. Pey, C. Balasubramanian, Jacob George, Narendra B. Dahotre, Ching‐Hsuan Tung, Weiyuan Lin, Shashank Sharma, Sameehan S. Joshi, T. Mahalingam and Lei Tang. Their work appears in journals such as Thin Solid Films, Journal of Materials Science, Journal of Non-Crystalline Solids, Applied Physics Letters and Additive manufacturing.

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