A. Andreini

414 total citations
38 papers, 276 citations indexed

About

A. Andreini is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Biomedical Engineering. According to data from OpenAlex, A. Andreini has authored 38 papers receiving a total of 276 indexed citations (citations by other indexed papers that have themselves been cited), including 37 papers in Electrical and Electronic Engineering, 4 papers in Mechanics of Materials and 2 papers in Biomedical Engineering. Recurrent topics in A. Andreini's work include Electrostatic Discharge in Electronics (31 papers), Integrated Circuits and Semiconductor Failure Analysis (19 papers) and Semiconductor materials and devices (17 papers). A. Andreini is often cited by papers focused on Electrostatic Discharge in Electronics (31 papers), Integrated Circuits and Semiconductor Failure Analysis (19 papers) and Semiconductor materials and devices (17 papers). A. Andreini collaborates with scholars based in Italy, Switzerland and Germany. A. Andreini's co-authors include C. Contiero, P. Galbiati, Horst Gieser, Heinrich Wolf, Joost Willemen, W. Wilkening, Gaudenzio Meneghesso, D. Pogány, E. Gornik and Wolfgang Stadler and has published in prestigious journals such as IEEE Transactions on Electron Devices, Journal of Micromechanics and Microengineering and Microelectronics Reliability.

In The Last Decade

A. Andreini

33 papers receiving 249 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
A. Andreini Italy 9 270 21 10 7 5 38 276
T. Efland United States 13 416 1.5× 24 1.1× 12 1.2× 6 0.9× 11 2.2× 31 417
K. Petrarca United States 5 210 0.8× 43 2.0× 5 0.5× 8 1.1× 1 0.2× 6 212
N. Sadachika Japan 9 303 1.1× 21 1.0× 14 1.4× 4 0.6× 7 1.4× 38 310
Zhaonian Yang China 7 324 1.2× 65 3.1× 7 0.7× 4 0.6× 3 0.6× 40 331
J. Lutze United States 7 178 0.7× 28 1.3× 16 1.6× 11 1.6× 2 0.4× 13 183
M.Y. Lau United States 8 219 0.8× 23 1.1× 23 2.3× 4 0.6× 9 1.8× 24 236
Hun-Hsien Chang Taiwan 6 241 0.9× 12 0.6× 7 0.7× 2 0.3× 2 0.4× 14 241
Jan Hoentschel Germany 8 142 0.5× 27 1.3× 7 0.7× 2 0.3× 4 0.8× 26 148
Norio Chujo Japan 12 389 1.4× 42 2.0× 15 1.5× 8 1.1× 49 402
A. Bajolet France 10 280 1.0× 21 1.0× 23 2.3× 13 1.9× 2 0.4× 19 288

Countries citing papers authored by A. Andreini

Since Specialization
Citations

This map shows the geographic impact of A. Andreini's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Andreini with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Andreini more than expected).

Fields of papers citing papers by A. Andreini

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Andreini. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Andreini. The network helps show where A. Andreini may publish in the future.

Co-authorship network of co-authors of A. Andreini

This figure shows the co-authorship network connecting the top 25 collaborators of A. Andreini. A scholar is included among the top collaborators of A. Andreini based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Andreini. A. Andreini is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
2.
Wolf, Heinrich, et al.. (2020). Impact of Alternative CDM Methods on HV ESD Protections Behavior. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 2 indexed citations
3.
Martino, Anthony J., et al.. (2020). Transmission Line Pulse (TLP) Statistical Characterization Approach.
4.
Gastaldi, Dario, et al.. (2018). Identification of traction-separation parameters by means of peel testing and in situ confocal microscopy. Journal of Micromechanics and Microengineering. 29(3). 34001–34001. 3 indexed citations
5.
Gastaldi, Dario, et al.. (2018). Mechanical reliability of microelectronics packaging: Small scale adhesion measurements and in-situ imaging. Virtual Community of Pathological Anatomy (University of Castilla La Mancha). 1–9. 1 indexed citations
6.
Andreini, A., et al.. (2016). HV ESD diodes investigation under vf-TLP stresses: TCAD approach. 1–10. 4 indexed citations
8.
Andreini, A., et al.. (2015). Thin-Copper-Metal Interconnection Thermomigration Analysis in ESD Regime. IEEE Transactions on Device and Materials Reliability. 15(3). 280–288. 2 indexed citations
9.
Andreini, A., et al.. (2014). Thin copper metal interconnections thermomigration analysis in ESD regime. 1–10. 2 indexed citations
10.
Andreini, A., et al.. (2013). Power-to-failure investigation for PNP-based ESD protections: From ns to ms. 1–10. 5 indexed citations
11.
Andreini, A., et al.. (2013). HBM ESD EDA check method applied to complete smart power IC's — Functional initialization and implementation. 1–10. 6 indexed citations
12.
Andreini, A., et al.. (2008). Novel 190V LIGBT-based ESD protection for 0.35μm Smart Power technology realized on SOI substrate. Research Padua Archive (University of Padua). 211–220. 2 indexed citations
13.
Bychikhin, S., D. Pogány, E. Gornik, et al.. (2006). Analysis of the triggering behavior of low voltage BCD single and multi-finger gc-NMOS ESD protection devices. Research Padua Archive (University of Padua). 275–284. 8 indexed citations
14.
Andreini, A., et al.. (2006). Novel technique to reduce latch-up risk due to ESD protection devices in Smart Power technologies. 32–38. 5 indexed citations
15.
Blaho, M., Heinrich Wolf, A. Andreini, et al.. (2004). Internal behavior of BCD ESD protection devices under TLP and very-fast TLP stress. IEEE Transactions on Device and Materials Reliability. 4(3). 535–541. 4 indexed citations
16.
Qu, Ningsong, Joost Willemen, W. Wilkening, et al.. (2004). Study of CDM specific effects for a smart power input protection structure. Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft). 1–10. 6 indexed citations
17.
Contiero, C., A. Andreini, & P. Galbiati. (2002). Roadmap Differentiation and Emerging Trends in BCD Technology. 35 indexed citations
18.
Andreini, A., et al.. (2001). Experimental analysis and electro-thermal simulation of low- and high-voltage ESD protection bipolar devices in a Silicon-On-Insulator Bipolar-CMOS-DMOS technology. Electrical Overstress/Electrostatic Discharge Symposium. 101–108. 2 indexed citations
19.
Contiero, C., A. Andreini, P. Galbiati, & Silvia Francesca Storti. (1987). Design of a high side driver in multipower-BCD and VIPower technologies. 766–769. 5 indexed citations
20.
Andreini, A., C. Contiero, & P. Galbiati. (1986). A new integrated silicon gate technology combining bipolar linear, CMOS logic, and DMOS power parts. IEEE Transactions on Electron Devices. 33(12). 2025–2030. 71 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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