B. Keppens
Impact in
-
- Electrostatic Discharge in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Electromagnetic Compatibility and Noise Suppression
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Silicon Carbide Semiconductor Technologies
- Radio Frequency Integrated Circuit Design
-
- Physical Unclonable Functions (PUFs) and Hardware Security
Papers in ⓘ
-
- Electrostatic Discharge in Electronics 22
- Integrated Circuits and Semiconductor Failure Analysis 19
- Semiconductor materials and devices 10
- Electromagnetic Compatibility and Noise Suppression 9
- Advancements in Semiconductor Devices and Circuit Design 8
- Silicon Carbide Semiconductor Technologies 3
-
- Nanowire Synthesis and Applications 1
- Co-authors
- K. Verhaege (9 shared papers)M. Mergens (8 shared papers)J. Armer (6 shared papers)P. Jozwiak (6 shared papers)C. Russ (5 shared papers)Benjamin Van Camp (9 shared papers)V. De Heyn (7 shared papers)G. Groeseneken (7 shared papers)
- Journals
- Microelectronics Reliability (5 papers)IEEE Transactions on Device and Materials Reliability (1 paper)Electrical Overstress/Electrostatic Discharge Symposium (6 papers)
- Partner nations
- BelgiumGermanyUnited States
In The Last Decade
B. Keppens
23 papers receiving 393 citations
Peers
Comparison fields: 5 of 5
- Electrical and Electronic Engineering 429
- Hardware and Architecture 9
- Materials Chemistry 4
- Control and Systems Engineering 1
- Biomedical Engineering 1
Countries citing papers authored by B. Keppens
This map shows the geographic impact of B. Keppens's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Keppens with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Keppens more than expected).
Fields of papers citing papers by B. Keppens
This network shows the impact of papers produced by B. Keppens. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Keppens. The network helps show where B. Keppens may publish in the future.
Co-authors
The 21 scholars most cited alongside B. Keppens, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 24 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 84 | |
| 2 | 2005 | 82 | |
| 3 | 2004 | 59 | |
| 4 | 2002 | 36 | |
| 5 | 2005 | 20 | |
| 6 | 2003 | 19 | |
| 7 | Active-area-segmentation (AAS) technique for compact, ESD robust, fully silicided NMOS design | 2003 | 17 |
| 8 | Contributions to standardization of Transmission Line Pulse testing methodology | 2001 | 14 |
| 9 | 2005 | 14 | |
| 10 | 2004 | 12 | |
| 11 | 2007 | 11 | |
| 12 | 2003 | 10 | |
| 13 | Concept for body coupling in SOI MOS transistors to improve multi-finger triggering | 2006 | 8 |
| 14 | 2001 | 8 | |
| 15 | ESD reliability issues in RF CMOS circuits | 2002 | 7 |
| 16 | On-chip ESD protection with improved high holding current SCR (HHISCR) achieving IEC 8kV contact system level | 2010 | 5 |
| 17 | 2002 | 5 | |
| 18 | Current detection trigger scheme for SCR based ESD protection of output drivers in CMOS technologies avoiding competitive triggering | 2005 | 4 |
| 19 | CDM analysis on 65nm CMOS: Pitfalls when correlating results between IO test chips and product level | 2008 | 4 |
| 20 | 2000 | 4 |
About B. Keppens
B. Keppens is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Infectious Diseases, Organic Chemistry and Surgery, having authored 24 papers that have together received 429 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (22 papers), Integrated Circuits and Semiconductor Failure Analysis (19 papers), Semiconductor materials and devices (10 papers), Electromagnetic Compatibility and Noise Suppression (9 papers), Advancements in Semiconductor Devices and Circuit Design (8 papers), Silicon Carbide Semiconductor Technologies (3 papers) and Nanowire Synthesis and Applications (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (429 citations), Hardware and Architecture (9 citations), Materials Chemistry (4 citations), Control and Systems Engineering (1 citation) and Biomedical Engineering (1 citation). B. Keppens has collaborated with scholars based in Belgium, Germany and United States. Frequent co-authors include K. Verhaege, M. Mergens, J. Armer, P. Jozwiak, C. Russ, Benjamin Van Camp, V. De Heyn, G. Groeseneken, Christian Russ and M. Natarajan. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability and Electrical Overstress/Electrostatic Discharge Symposium.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.