E. Vancoille

1.2k total citations
33 papers, 845 citations indexed

About

E. Vancoille is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Mechanics of Materials. According to data from OpenAlex, E. Vancoille has authored 33 papers receiving a total of 845 indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 16 papers in Materials Chemistry and 13 papers in Mechanics of Materials. Recurrent topics in E. Vancoille's work include Metal and Thin Film Mechanics (12 papers), Semiconductor materials and devices (12 papers) and Diamond and Carbon-based Materials Research (10 papers). E. Vancoille is often cited by papers focused on Metal and Thin Film Mechanics (12 papers), Semiconductor materials and devices (12 papers) and Diamond and Carbon-based Materials Research (10 papers). E. Vancoille collaborates with scholars based in Belgium, Singapore and United States. E. Vancoille's co-authors include J.R. Roos, Jean‐Pierre Célis, Ramesh Kuppuswamy, Han Huang, Ling Yin, A.C. Spowage, J. Ebberink, F. Jungblut, Nadine Collaert and Wilfried Vandervorst and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Thin Solid Films.

In The Last Decade

E. Vancoille

32 papers receiving 806 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
E. Vancoille Belgium 14 424 389 344 329 298 33 845
Shozo Inoue Japan 18 358 0.8× 489 1.3× 217 0.6× 182 0.6× 372 1.2× 96 894
L. Chollet Switzerland 14 488 1.2× 393 1.0× 371 1.1× 218 0.7× 170 0.6× 17 837
Chris H. Stoessel United States 6 287 0.7× 324 0.8× 139 0.4× 122 0.4× 259 0.9× 8 647
Hua Gong China 15 170 0.4× 600 1.5× 296 0.9× 795 2.4× 329 1.1× 35 958
T. I. Selinder Sweden 15 433 1.0× 478 1.2× 166 0.5× 82 0.2× 265 0.9× 23 802
A. J. Griffin United States 14 278 0.7× 433 1.1× 212 0.6× 94 0.3× 144 0.5× 30 653
Jon Alkorta Spain 16 406 1.0× 455 1.2× 471 1.4× 224 0.7× 94 0.3× 34 841
Yung-I Chen Taiwan 20 769 1.8× 549 1.4× 431 1.3× 80 0.2× 395 1.3× 81 1.1k
Houfu Dai China 17 207 0.5× 449 1.2× 419 1.2× 657 2.0× 216 0.7× 23 886
J.-D. Kamminga Netherlands 16 472 1.1× 420 1.1× 230 0.7× 85 0.3× 107 0.4× 33 695

Countries citing papers authored by E. Vancoille

Since Specialization
Citations

This map shows the geographic impact of E. Vancoille's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Vancoille with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Vancoille more than expected).

Fields of papers citing papers by E. Vancoille

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. Vancoille. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Vancoille. The network helps show where E. Vancoille may publish in the future.

Co-authorship network of co-authors of E. Vancoille

This figure shows the co-authorship network connecting the top 25 collaborators of E. Vancoille. A scholar is included among the top collaborators of E. Vancoille based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. Vancoille. E. Vancoille is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Simoen, Eddy, Adrian Chasin, Philippe Matagne, et al.. (2020). On the Correlation Between Static and Low-Frequency Noise Parameters of Vertical Nanowire nMOSFETs. ECS Transactions. 97(5). 59–64. 2 indexed citations
2.
Simoen, Eddy, Philippe Matagne, Erik Rosseel, et al.. (2020). On the Correlation Between Static and Low-Frequency Noise Parameters of Vertical Nanowire nMOSFETs. ECS Meeting Abstracts. MA2020-01(24). 1394–1394. 1 indexed citations
3.
Favia, Paola, Olivier Richard, Geert Eneman, et al.. (2019). TEM investigations of gate-all-around nanowire devices. Semiconductor Science and Technology. 34(12). 124003–124003. 8 indexed citations
4.
5.
Kandaswamy, P., Hu Liang, Ming Zhao, et al.. (2014). AlN/AlGaN/GaN buffer optimization on silicon (111): bow and crystal quality control for Si‐CMOS fabs. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 11(3-4). 450–453. 4 indexed citations
6.
Merckling, Clément, Niamh Waldron, Shidong Jiang, et al.. (2014). Heteroepitaxy of InP on Si(001) by selective-area metal organic vapor-phase epitaxy in sub-50 nm width trenches: The role of the nucleation layer and the recess engineering. Journal of Applied Physics. 115(2). 66 indexed citations
7.
Liang, Hu, P. Kandaswamy, E.P. Carlson, et al.. (2014). Growth techniques to reduce V‐defect density in GaN and AlGaN layers grown on 200 mm Si (111) substrate. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 11(3-4). 533–536. 11 indexed citations
8.
Meersschaut, Johan, Marc Schaekers, Bert Brijs, et al.. (2010). Metal-Organic Chemical Vapor Deposition of Ti-Doped NiO Layers for Application in Resistive Switching Memories. ECS Transactions. 33(3). 313–322. 2 indexed citations
9.
Zhao, Chao, Małgorzata Pawlak, M. Popovici, et al.. (2009). Atomic Layer Deposition of Ru and RuO2 for MIMCAP Applications. ECS Transactions. 25(4). 377–387. 12 indexed citations
10.
Yin, Ling, et al.. (2004). Planar nanogrinding of a fine grained WC-Co composite for an optical surface finish. The International Journal of Advanced Manufacturing Technology. 26(7-8). 766–773. 14 indexed citations
11.
Yin, Ling, E. Vancoille, Ramesh Kuppuswamy, & Han Huang. (2004). Surface characterization of 6H-SiC (0001) substrates in indentation and abrasive machining. International Journal of Machine Tools and Manufacture. 44(6). 607–615. 90 indexed citations
12.
Yin, Ling, et al.. (2003). Influence of microstructure on ultraprecision grinding of cemented carbides. International Journal of Machine Tools and Manufacture. 44(5). 533–543. 89 indexed citations
13.
Drees, Dirk, E. Vancoille, Jean‐Pierre Célis, & J.R. Roos. (1994). Structural Characteristics of PVD Ti-Based Coatings in Relation to their Wear and Corrosion Behaviour. Materials science forum. 163-165. 509–526. 1 indexed citations
14.
Vancoille, E., et al.. (1994). Tribo-oxidation of a TiN coating sliding against corundum. Journal of materials research/Pratt's guide to venture capital sources. 9(4). 992–998. 32 indexed citations
15.
Vancoille, E., Jean‐Pierre Célis, & J.R. Roos. (1993). Tribological and structural characterization of a physical vapour deposited TiC/Ti(C,N)/TiN multilayer. Tribology International. 26(2). 115–119. 35 indexed citations
16.
Vancoille, E., Jean‐Pierre Célis, & J.R. Roos. (1993). Mechanical properties of heat treated and worn PVD TiN, (Ti, Al)N, (Ti, Nb)N and Ti(C, N) coatings as measured by nanoindentation. Thin Solid Films. 224(2). 168–176. 58 indexed citations
17.
Célis, Jean‐Pierre, et al.. (1992). TERNARY (TI,AL)N AND (TI,NB)N COATINGS PRODUCED BY STEERED ARC ION PLATING. Metal Finishing. 91(2). 19–22. 3 indexed citations
18.
Vancoille, E., et al.. (1991). Modelling a ball-on-disk experiment for the system 100Cr6 steel vs (Ti,X)N coating. 1 indexed citations
19.
Célis, Jean‐Pierre, et al.. (1990). Investigation of nickel-indium electrodeposits for connectors. 77(2). 60–65. 2 indexed citations
20.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Shozo Inoue Breakdown of academic impact, for papers by L. Chollet Breakdown of academic impact, for papers by Chris H. Stoessel Breakdown of academic impact, for papers by Hua Gong Breakdown of academic impact, for papers by T. I. Selinder Breakdown of academic impact, for papers by A. J. Griffin Breakdown of academic impact, for papers by Jon Alkorta Breakdown of academic impact, for papers by Yung-I Chen Breakdown of academic impact, for papers by Houfu Dai Breakdown of academic impact, for papers by J.-D. Kamminga
Rankless by CCL
2026