H. Rathore
Impact in
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- Copper Interconnects and Reliability
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- Semiconductor materials and devices
- Electronic Packaging and Soldering Technologies
- 3D IC and TSV technologies
- Electrodeposition and Electroless Coatings
- Integrated Circuits and Semiconductor Failure Analysis
Papers in
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- Electronic Packaging and Soldering Technologies 13
- 3D IC and TSV technologies 4
- Semiconductor materials and devices 3
- Integrated Circuits and Semiconductor Failure Analysis 2
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- Copper Interconnects and Reliability 12
- Co-authors
- A. Simon (3 shared papers)D. Edelstein (3 shared papers)Cyprian Uzoh (3 shared papers)R. Wachnik (3 shared papers)W. Cote (2 shared papers)John M. Slattery (2 shared papers)P. Roper (1 shared paper)John Dukovic (2 shared papers)
- Journals
- Journal of Applied Physics (1 paper)Microelectronics Reliability (1 paper)AIP conference proceedings (2 papers)
- Partner nations
- United States
In The Last Decade
H. Rathore
14 papers receiving 349 citations
Peers
Comparison fields: 5 of 32
- Electronic, Optical and Magnetic Materials 245
- Electrical and Electronic Engineering 323
- Mechanics of Materials 62
- Hardware and Architecture 14
- Atomic and Molecular Physics, and Optics 46
Countries citing papers authored by H. Rathore
This map shows the geographic impact of H. Rathore's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Rathore with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Rathore more than expected).
Fields of papers citing papers by H. Rathore
This network shows the impact of papers produced by H. Rathore. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Rathore. The network helps show where H. Rathore may publish in the future.
Co-authors
The 25 scholars most cited alongside H. Rathore, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 196 | |
| 2 | 2001 | 63 | |
| 3 | 2003 | 33 | |
| 4 | 1992 | 19 | |
| 5 | 2004 | 18 | |
| 6 | 2005 | 8 | |
| 7 | 2002 | 7 | |
| 8 | 1994 | 5 | |
| 9 | 2002 | 5 | |
| 10 | 1991 | 5 | |
| 11 | 1994 | 4 | |
| 12 | 2002 | 3 | |
| 13 | 2002 | 2 | |
| 14 | 2002 | 1 | |
| 15 | 2005 | 0 |
About H. Rathore
H. Rathore is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Mechanical Engineering, Hardware and Architecture and Atomic and Molecular Physics, and Optics, having authored 15 papers that have together received 369 indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (13 papers), Copper Interconnects and Reliability (12 papers), 3D IC and TSV technologies (4 papers), Aluminum Alloys Composites Properties (3 papers), Semiconductor materials and devices (3 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers), VLSI and Analog Circuit Testing (2 papers) and Aluminum Alloy Microstructure Properties (1 paper). The work is most often cited by research in Electronic, Optical and Magnetic Materials (245 citations), Electrical and Electronic Engineering (323 citations), Mechanics of Materials (62 citations), Hardware and Architecture (14 citations) and Atomic and Molecular Physics, and Optics (46 citations). H. Rathore has collaborated with scholars based in United States. Frequent co-authors include A. Simon, D. Edelstein, Cyprian Uzoh, R. Wachnik, W. Cote, John M. Slattery, P. Roper, John Dukovic, L.T. Su and N. Lustig. Their work appears in journals such as Journal of Applied Physics, Microelectronics Reliability and AIP conference proceedings.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.