Jeff Gambino

520 total citations
59 papers, 344 citations indexed

About

Jeff Gambino is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Biomedical Engineering. According to data from OpenAlex, Jeff Gambino has authored 59 papers receiving a total of 344 indexed citations (citations by other indexed papers that have themselves been cited), including 57 papers in Electrical and Electronic Engineering, 20 papers in Electronic, Optical and Magnetic Materials and 5 papers in Biomedical Engineering. Recurrent topics in Jeff Gambino's work include Semiconductor materials and devices (40 papers), Copper Interconnects and Reliability (20 papers) and Integrated Circuits and Semiconductor Failure Analysis (20 papers). Jeff Gambino is often cited by papers focused on Semiconductor materials and devices (40 papers), Copper Interconnects and Reliability (20 papers) and Integrated Circuits and Semiconductor Failure Analysis (20 papers). Jeff Gambino collaborates with scholars based in United States, Germany and France. Jeff Gambino's co-authors include Fen Chen, Márcia Carvalho de Abreu Fantini, Micha Tomkiewicz, Chee Lip Gan, C. Parks, Mohammed S. G. Hamed, A. S. Yapsir, J. Gill, R. H. Kastl and Marianella Hernández Santana and has published in prestigious journals such as Journal of Applied Physics, Journal of The Electrochemical Society and Applied Surface Science.

In The Last Decade

Jeff Gambino

52 papers receiving 313 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Jeff Gambino United States 10 310 108 62 60 48 59 344
D. Jawarani United States 10 284 0.9× 139 1.3× 80 1.3× 56 0.9× 67 1.4× 38 336
Thierry Mourier France 9 359 1.2× 112 1.0× 50 0.8× 41 0.7× 94 2.0× 49 405
M. Angyal United States 10 379 1.2× 238 2.2× 72 1.2× 64 1.1× 81 1.7× 28 456
V. Arnal France 11 245 0.8× 192 1.8× 59 1.0× 29 0.5× 38 0.8× 44 297
James G. Ryan United States 10 224 0.7× 142 1.3× 117 1.9× 66 1.1× 68 1.4× 25 352
W. Cote United States 8 334 1.1× 170 1.6× 71 1.1× 49 0.8× 118 2.5× 15 411
R. Augur Netherlands 9 233 0.8× 171 1.6× 49 0.8× 28 0.5× 42 0.9× 27 269
Trace Hurd United States 7 231 0.7× 118 1.1× 67 1.1× 57 0.9× 59 1.2× 16 274
Patrick J. Paniez France 10 240 0.8× 53 0.5× 53 0.9× 47 0.8× 133 2.8× 54 333
Gayle Murdoch Belgium 11 296 1.0× 131 1.2× 69 1.1× 64 1.1× 40 0.8× 39 346

Countries citing papers authored by Jeff Gambino

Since Specialization
Citations

This map shows the geographic impact of Jeff Gambino's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jeff Gambino with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jeff Gambino more than expected).

Fields of papers citing papers by Jeff Gambino

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jeff Gambino. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jeff Gambino. The network helps show where Jeff Gambino may publish in the future.

Co-authorship network of co-authors of Jeff Gambino

This figure shows the co-authorship network connecting the top 25 collaborators of Jeff Gambino. A scholar is included among the top collaborators of Jeff Gambino based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jeff Gambino. Jeff Gambino is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Cook, Michael J., et al.. (2021). Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors. 1–10. 5 indexed citations
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Cook, Michael J., Jeff Gambino, J. Slezák, et al.. (2018). Polysilicon resistor stability under voltage stress for safe-operating area characterization. P–RT.4. 5 indexed citations
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Gambino, Jeff, et al.. (2018). Device reliability for CMOS image sensors with backside through-silicon vias. 6 indexed citations
7.
Gambino, Jeff, et al.. (2018). Fast Power-Temperature Cycling of BEOL Test Structures for Power Devices. 1–4. 1 indexed citations
8.
Price, David, et al.. (2017). PBTI and PBTS testing of 0.25 μm pMOSFET devices for analog circuits. RT–5.1. 1 indexed citations
9.
Gambino, Jeff, He Jing, R. Bolam, et al.. (2011). Interconnect processes and reliability for RF technology. 11. 1–11. 4 indexed citations
10.
Gambino, Jeff. (2011). Process Challenges for Integration of Copper Interconnects with Low-k Dielectrics. ECS Meeting Abstracts. MA2011-01(22). 1405–1405. 1 indexed citations
11.
Gambino, Jeff. (2011). Process Challenges for Integration of Copper Interconnects with Low-k Dielectrics. ECS Transactions. 35(4). 687–699. 4 indexed citations
12.
Gambino, Jeff, et al.. (2009). Reliability of Copper Interconnects: Stress-Induced Voids. ECS Transactions. 18(1). 205–211. 3 indexed citations
13.
Gambino, Jeff, et al.. (2009). Copper interconnect technology for the 32 nm node and beyond. 141–148. 27 indexed citations
14.
Gambino, Jeff, et al.. (2007). Reliability of Cu Interconnects with Ta Implant. 81. 22–24. 2 indexed citations
15.
Gambino, Jeff, Fen Chen, Tom Lee, et al.. (2007). Effect of CoWP Capping Layers on Dielectric Breakdown of SiO<inf>2</inf>. 70. 59–64. 1 indexed citations
16.
Gan, Chee Lip, et al.. (2005). Effect of Current Direction on the Reliability of Different Capped Cu Interconnects. MRS Proceedings. 863. 3 indexed citations
17.
Filippi, R. G., M. Gribelyuk, T. Sullivan, et al.. (2001). Electromigration in AlCu lines: comparison of Dual Damascene and metal reactive ion etching. Thin Solid Films. 388(1-2). 303–314. 5 indexed citations
18.
Schnabel, R., G. Bronner, L. A. Clevenger, et al.. (1999). Slotted vias for dual damascene interconnects in 1 Gb DRAMs. 43–44. 2 indexed citations
19.
Gambino, Jeff, et al.. (1999). Diffusion Barriers for Mobile Ions in 256M DRAMs. MRS Proceedings. 564. 1 indexed citations
20.
Vuillaume, D., et al.. (1989). Deep level transient spectroscopy of metal-oxide-semiconductor capacitors fabricated on CF4 reactive-ion-etched Si. Journal of Applied Physics. 66(1). 230–235. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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