S. G. Malhotra

564 total citations
18 papers, 367 citations indexed

About

S. G. Malhotra is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Mechanics of Materials. According to data from OpenAlex, S. G. Malhotra has authored 18 papers receiving a total of 367 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Electrical and Electronic Engineering, 11 papers in Electronic, Optical and Magnetic Materials and 8 papers in Mechanics of Materials. Recurrent topics in S. G. Malhotra's work include Copper Interconnects and Reliability (11 papers), Semiconductor materials and devices (6 papers) and Metal and Thin Film Mechanics (6 papers). S. G. Malhotra is often cited by papers focused on Copper Interconnects and Reliability (11 papers), Semiconductor materials and devices (6 papers) and Metal and Thin Film Mechanics (6 papers). S. G. Malhotra collaborates with scholars based in United States. S. G. Malhotra's co-authors include S. M. Yalisove, Z. U. Rek, J. C. Bilello, James Harper, Humphrey J. Maris, G. A. Antonelli, L. Gignac, R. Rosenberg, A. Simon and C. Cabral and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Thin Solid Films.

In The Last Decade

S. G. Malhotra

16 papers receiving 349 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
S. G. Malhotra United States	8	230	194	129	103	85	18	367
Jing‐Cheng Lin Taiwan	10	308 1.3×	171 0.9×	177 1.4×	102 1.0×	42 0.5×	17	402
T. Nitta Japan	7	307 1.3×	226 1.2×	94 0.7×	67 0.7×	112 1.3×	26	390
Changsup Ryu United States	10	413 1.8×	334 1.7×	156 1.2×	120 1.2×	80 0.9×	16	518
K. Hieber Germany	9	253 1.1×	123 0.6×	148 1.1×	65 0.6×	98 1.2×	25	345
N. Owada Japan	9	214 0.9×	140 0.7×	65 0.5×	77 0.7×	60 0.7×	24	306
W. Robl Germany	11	172 0.7×	111 0.6×	159 1.2×	138 1.3×	67 0.8×	26	345
Yoshimi Shioya Japan	12	273 1.2×	176 0.9×	141 1.1×	57 0.6×	123 1.4×	26	350
D. P. Tracy United States	8	287 1.2×	353 1.8×	230 1.8×	115 1.1×	48 0.6×	14	436
Hideki Sako Japan	12	337 1.5×	187 1.0×	51 0.4×	103 1.0×	47 0.6×	32	422
H. Rathore United States	7	323 1.4×	244 1.3×	62 0.5×	43 0.4×	46 0.5×	15	367

Countries citing papers authored by S. G. Malhotra

Since Specialization

Citations

This map shows the geographic impact of S. G. Malhotra's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. G. Malhotra with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. G. Malhotra more than expected).

Fields of papers citing papers by S. G. Malhotra

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. G. Malhotra. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. G. Malhotra. The network helps show where S. G. Malhotra may publish in the future.

Co-authorship network of co-authors of S. G. Malhotra

This figure shows the co-authorship network connecting the top 25 collaborators of S. G. Malhotra. A scholar is included among the top collaborators of S. G. Malhotra based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. G. Malhotra. S. G. Malhotra is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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18 of 18 papers shown

Kuse, Ronald, et al.. (2009). High-Productivity Combinatorial PVD and ALD Workflows for Semiconductor Logic & Memory Applications. MRS Proceedings. 1159. 1 indexed citations

Canaperi, D., L. Gignac, S. Kaldor, et al.. (2005). Electromigration Cu mass flow in Cu interconnections. Thin Solid Films. 504(1-2). 274–278. 27 indexed citations

Hu, C.‐K., L. Gignac, E. Liniger, et al.. (2005). Effect of metal liner on electromigration in Cu Damascene lines. Journal of Applied Physics. 98(12). 9 indexed citations

Moon, Bum Ki, Takashi Iijima, S. G. Malhotra, et al.. (2005). Integration of ALD-TaN Liners on Nanoporous Dielectrics. MRS Proceedings. 863. 2 indexed citations

Gribelyuk, M., et al.. (2002). Microstructure evolution of electroplated Cu during room temperature transient. 188–190. 1 indexed citations

Kozaczek, K. J., et al.. (2002). Crystallographic Texture and Phase Metrology During Damascene Copper Processing. MRS Proceedings. 721. 2 indexed citations

Antonelli, G. A., Humphrey J. Maris, S. G. Malhotra, & James Harper. (2002). A study of the vibrational modes of a nanostructure with picosecond ultrasonics. Physica B Condensed Matter. 316-317. 434–437. 1 indexed citations

Antonelli, G. A., Humphrey J. Maris, S. G. Malhotra, & James Harper. (2002). Picosecond ultrasonics study of the vibrational modes of a nanostructure. Journal of Applied Physics. 91(5). 3261–3267. 81 indexed citations

Edelstein, D., Cyprian Uzoh, C. Cabral, et al.. (2001). A high performance liner for copper damascene interconnects. 9–11. 62 indexed citations

10.

Gignac, L., et al.. (2001). Mechanisms for very long electromigration lifetime in dual-damascene Cu interconnections. Applied Physics Letters. 78(7). 904–906. 73 indexed citations

11.

Harper, James, et al.. (2000). Microstructural Analysis of Copper Interconnections Using Picosecond Ultrasonics. MRS Proceedings. 612. 1 indexed citations

12.

Malhotra, S. G., Z. U. Rek, S. M. Yalisove, & J. C. Bilello. (1997). Strain gradients and normal stresses in textured Mo thin films. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 15(2). 345–352. 26 indexed citations

13.

Malhotra, S. G., Z. U. Rek, S. M. Yalisove, & J. C. Bilello. (1997). Depth-sensitive strain analysis of a W–Ta–W trilayer. Thin Solid Films. 301(1-2). 55–61. 6 indexed citations

14.

Malhotra, S. G., Z. U. Rek, S. M. Yalisove, & J. C. Bilello. (1997). Analysis of thin film stress measurement techniques. Thin Solid Films. 301(1-2). 45–54. 46 indexed citations

15.

Malhotra, S. G., Z. U. Rek, S. M. Yalisove, & J. C. Bilello. (1996). Depth dependence of residual strains in polycrystalline Mo thin films using high-resolution x-ray diffraction. Journal of Applied Physics. 79(9). 6872–6879. 26 indexed citations

16.

Aken, David C. Van, et al.. (1993). An electron microscopy study of the precipitation of rhenium in the B2 nickel aluminide. Journal of materials research/Pratt's guide to venture capital sources. 8(10). 2524–2533. 3 indexed citations

17.

Malhotra, S. G., et al.. (1993). Texture in Sputtered MO Films. MRS Proceedings. 317.

18.

Malhotra, S. G., et al.. (1993). White-Beam Transmission Characterization of Texture in Mo Thin Films and Mo/W Multilayers. MRS Proceedings. 317.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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