W. Cote

794 total citations
15 papers, 411 citations indexed

About

W. Cote is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, W. Cote has authored 15 papers receiving a total of 411 indexed citations (citations by other indexed papers that have themselves been cited), including 13 papers in Electrical and Electronic Engineering, 5 papers in Hardware and Architecture and 5 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in W. Cote's work include Integrated Circuits and Semiconductor Failure Analysis (7 papers), Semiconductor materials and devices (7 papers) and Copper Interconnects and Reliability (5 papers). W. Cote is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (7 papers), Semiconductor materials and devices (7 papers) and Copper Interconnects and Reliability (5 papers). W. Cote collaborates with scholars based in United States and Switzerland. W. Cote's co-authors include Cyprian Uzoh, N. Lustig, R. Wachnik, H. Rathore, R. Goldblatt, S. Luce, A. Simon, John Dukovic, P. Roper and T.L. McDevitt and has published in prestigious journals such as IEEE Journal of Solid-State Circuits, Thin Solid Films and IBM Journal of Research and Development.

In The Last Decade

W. Cote

14 papers receiving 382 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
W. Cote United States 8 334 170 118 71 49 15 411
S. Kadomura Japan 11 499 1.5× 170 1.0× 79 0.7× 75 1.1× 34 0.7× 43 542
M. Fayolle France 13 356 1.1× 165 1.0× 130 1.1× 214 3.0× 68 1.4× 41 505
Hideki Kitada Japan 12 469 1.4× 96 0.6× 141 1.2× 44 0.6× 67 1.4× 61 534
Jeff Gambino United States 10 310 0.9× 108 0.6× 48 0.4× 62 0.9× 60 1.2× 59 344
D. Canaperi United States 13 599 1.8× 235 1.4× 151 1.3× 85 1.2× 116 2.4× 45 677
Thierry Mourier France 9 359 1.1× 112 0.7× 94 0.8× 50 0.7× 41 0.8× 49 405
M. Angyal United States 10 379 1.1× 238 1.4× 81 0.7× 72 1.0× 64 1.3× 28 456
Alvin L. S. Loke United States 14 625 1.9× 350 2.1× 103 0.9× 129 1.8× 65 1.3× 38 680
Leonardus H. A. Leunissen Belgium 15 538 1.6× 79 0.5× 240 2.0× 127 1.8× 60 1.2× 55 660
T. Spooner United States 13 412 1.2× 312 1.8× 64 0.5× 83 1.2× 109 2.2× 49 472

Countries citing papers authored by W. Cote

Since Specialization
Citations

This map shows the geographic impact of W. Cote's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. Cote with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. Cote more than expected).

Fields of papers citing papers by W. Cote

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by W. Cote. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. Cote. The network helps show where W. Cote may publish in the future.

Co-authorship network of co-authors of W. Cote

This figure shows the co-authorship network connecting the top 25 collaborators of W. Cote. A scholar is included among the top collaborators of W. Cote based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with W. Cote. W. Cote is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

15 of 15 papers shown
1.
Carver, Gary E., et al.. (2022). Lithographically patterned fiber bundles for in-vivo Raman spectroscopy. 1 indexed citations
2.
Cote, W., et al.. (2020). Hyperspectral imaging using a Linear Variable Filter (LVF) based ultra-compact camera. 41–41. 4 indexed citations
3.
Fox, Stephen R., W. Cote, Greg Yeric, et al.. (2008). A 65-nm Random and Systematic Yield Ramp Infrastructure Utilizing a Specialized Addressable Array With Integrated Analysis Software. IEEE Transactions on Semiconductor Manufacturing. 21(2). 161–168. 7 indexed citations
4.
Cote, W., et al.. (2008). Short-flow test chip utilizing fast testing for defect density monitoring in 45nm. 56–61. 5 indexed citations
5.
Fox, Stephen R., W. Cote, Greg Yeric, et al.. (2006). A 65nm random and systematic yield ramp infrastructure utilizing a specialized addressable array with integrated analysis software. 104–109. 14 indexed citations
6.
Parries, P., Paihung Pan, W. Cote, et al.. (2003). A buried-plate trench cell for a 64-Mb DRAM. 14–15.
7.
Cote, W., et al.. (2003). Submicron wiring technology with tungsten and planarization. 5. 21–28. 7 indexed citations
8.
Cote, W., et al.. (2002). Dual Damascene: a ULSI wiring technology. 144–152. 36 indexed citations
9.
Edelstein, D., J. Heidenreich, R. Goldblatt, et al.. (2002). Full copper wiring in a sub-0.25 μm CMOS ULSI technology. 773–776. 196 indexed citations
10.
Heidenreich, J., D. Edelstein, R. Goldblatt, et al.. (2002). Copper dual damascene wiring for sub-0.25 μm CMOS technology. 11. 151–153. 3 indexed citations
11.
Cote, W., et al.. (2002). An evaluation of Cu wiring in a production 64 Mb DRAM. 24–25. 2 indexed citations
12.
Nguyen, S., et al.. (1995). Low-temperature chemical vapor deposition processes and dielectrics for microelectronic circuit manufacturing at IBM. IBM Journal of Research and Development. 39(4). 437–464. 26 indexed citations
13.
Burke, Peter J., et al.. (1992). Integration of chemical-mechanical polishing into CMOS integrated circuit manufacturing. Thin Solid Films. 220(1-2). 1–7. 78 indexed citations
14.
Henkels, W.H., R. Franch, T. Bucelot, et al.. (1991). A 4-Mb low-temperature DRAM. IEEE Journal of Solid-State Circuits. 26(11). 1519–1529. 13 indexed citations
15.
Cote, W., et al.. (1987). Submicron wiring technology with tungsten and planarization. 209–212. 19 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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