R. Wachnik

1.8k total citations
41 papers, 1.1k citations indexed

About

R. Wachnik is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, R. Wachnik has authored 41 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 39 papers in Electrical and Electronic Engineering, 12 papers in Atomic and Molecular Physics, and Optics and 8 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in R. Wachnik's work include Semiconductor materials and devices (23 papers), Advancements in Semiconductor Devices and Circuit Design (20 papers) and Semiconductor materials and interfaces (10 papers). R. Wachnik is often cited by papers focused on Semiconductor materials and devices (23 papers), Advancements in Semiconductor Devices and Circuit Design (20 papers) and Semiconductor materials and interfaces (10 papers). R. Wachnik collaborates with scholars based in United States, France and Switzerland. R. Wachnik's co-authors include N. Zamdmer, Xuejue Huang, Jean‐Olivier Plouchart, R. Groves, Tsu‐Jae King, Yu Cao, R. G. Filippi, Chenming Hu, G.P. Li and T. Bucelot and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Journal of Solid-State Circuits.

In The Last Decade

R. Wachnik

37 papers receiving 1.0k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
R. Wachnik United States 15 964 291 117 110 102 41 1.1k
A. K. Stamper United States 13 457 0.5× 279 1.0× 69 0.6× 123 1.1× 70 0.7× 30 590
M. Hoshino Japan 13 672 0.7× 109 0.4× 236 2.0× 131 1.2× 122 1.2× 36 762
P. Fazan United States 17 1.2k 1.3× 123 0.4× 188 1.6× 282 2.6× 186 1.8× 115 1.3k
Hirohito Watanabe Japan 14 393 0.4× 129 0.4× 112 1.0× 255 2.3× 129 1.3× 44 584
M. Traving Germany 11 636 0.7× 311 1.1× 151 1.3× 390 3.5× 102 1.0× 25 832
S. Sriram United States 14 606 0.6× 63 0.2× 180 1.5× 85 0.8× 52 0.5× 53 670
S. Mertens Belgium 17 532 0.6× 190 0.7× 436 3.7× 236 2.1× 75 0.7× 57 779
P.K. Vasudev United States 12 575 0.6× 132 0.5× 195 1.7× 126 1.1× 80 0.8× 57 667
M. Demand Belgium 16 550 0.6× 221 0.8× 406 3.5× 347 3.2× 206 2.0× 51 972
L. Manchanda United States 15 828 0.9× 146 0.5× 150 1.3× 370 3.4× 37 0.4× 31 912

Countries citing papers authored by R. Wachnik

Since Specialization
Citations

This map shows the geographic impact of R. Wachnik's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Wachnik with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Wachnik more than expected).

Fields of papers citing papers by R. Wachnik

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. Wachnik. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Wachnik. The network helps show where R. Wachnik may publish in the future.

Co-authorship network of co-authors of R. Wachnik

This figure shows the co-authorship network connecting the top 25 collaborators of R. Wachnik. A scholar is included among the top collaborators of R. Wachnik based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. Wachnik. R. Wachnik is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Wachnik, R., et al.. (2025). Analysis of Local Layout Effects in Field-Effect Transistors Using Neural Networks. IEEE Transactions on Electron Devices. 72(8). 4347–4361.
2.
Lu, Ning & R. Wachnik. (2015). Modeling of Resistance in FinFET Local Interconnect. IEEE Transactions on Circuits and Systems I Regular Papers. 62(8). 1899–1907. 2 indexed citations
3.
Miao, Xin, Ruqiang Bao, U. Kwon, et al.. (2015). An Analytical Metal Resistance Model and Its Application for Sub-22-nm Metal-Gate CMOS. IEEE Electron Device Letters. 36(4). 384–386. 8 indexed citations
4.
Li, Hongmei, R. Wachnik, Sungjae Lee, et al.. (2014). Virtual de-embedding study for the accurate extraction of Fin FET gate resistance. 1–4. 1 indexed citations
5.
Lu, Ning, et al.. (2014). Modeling of resistance in FinFET local interconnect. 2. 1–4. 6 indexed citations
6.
Wachnik, R., L. Wagner, J. Johnson, et al.. (2013). Experimental analysis and modeling of self heating effect in dielectric isolated planar and fin devices. Symposium on VLSI Technology. 30 indexed citations
7.
Randall, Marcus E., et al.. (2012). A Fully Automated Method to Create Monte-Carlo MOSFET Model Libraries for Statistical Circuit Simulations. TechConnect Briefs. 2(2012). 826–828. 1 indexed citations
8.
Groves, R., et al.. (2009). RF Modeling of 45nm Low-Power CMOS Technology. TechConnect Briefs. 3(2009). 628–631. 2 indexed citations
9.
Hu, Jenny, Jae-Eun Park, G. Freeman, R. Wachnik, & Philip Wong. (2008). Effective Drive Current in CMOS Inverters for Sub-45nm Technologies. TechConnect Briefs. 3(2008). 829–832. 6 indexed citations
10.
Cao, Yu, R. Groves, N. Zamdmer, et al.. (2003). Frequency-independent equivalent circuit model for on-chip spiral inductors. 217–220. 54 indexed citations
11.
Linder, B.P., J. H. Stathis, R. Wachnik, et al.. (2002). Gate oxide breakdown under Current Limited Constant Voltage Stress. 214–215. 66 indexed citations
12.
Filippi, R. G., et al.. (1996). Line length effects on lifetime measurements and resistance saturation during electromigration testing. AIP conference proceedings. 373. 224–239. 1 indexed citations
13.
Filippi, R. G., et al.. (1995). Paradoxical predictions and a minimum failure time in electromigration. Applied Physics Letters. 66(15). 1897–1899. 10 indexed citations
14.
Filippi, R. G., et al.. (1995). The electromigration short-length effect in Ti-AlCu-Ti metallization with tungsten studs. Journal of Applied Physics. 78(6). 3756–3768. 56 indexed citations
15.
Rathore, H., et al.. (1994). Electromigration reliability of AlCu interconnects with W studs. AIP conference proceedings. 305. 165–178. 5 indexed citations
16.
Filippi, R. G., et al.. (1993). <title>Electromigration and current-carrying implications for aluminum-based metallurgy with tungsten stud via interconnections</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1805. 251–262. 6 indexed citations
17.
Hsia, L. C., et al.. (1991). X-ray radiation damage and a reliability study on bipolar devices. Applied Physics Letters. 58(23). 2687–2689.
18.
Wachnik, R., et al.. (1990). Observation of recombination center-assisted tunneling current in Al(Cu)-penetrated PtSi Schottky barrier diodes. Journal of Applied Physics. 68(12). 6259–6262. 5 indexed citations
19.
Liehr, M., et al.. (1987). Dopant redistribution at Si surfaces during vacuum anneal. Journal of Applied Physics. 61(9). 4619–4625. 39 indexed citations
20.
Wachnik, R.. (1986). The use of charge pumping to characterize generation by interface traps. IEEE Transactions on Electron Devices. 33(7). 1054–1061. 13 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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