Thomas Trenkler
Impact in
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- Force Microscopy Techniques and Applications
- Surface and Thin Film Phenomena
- Structural Biology top 10%
Papers in
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- Force Microscopy Techniques and Applications 18
- Surface and Thin Film Phenomena 7
- Semiconductor materials and interfaces 2
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- Integrated Circuits and Semiconductor Failure Analysis 13
- Semiconductor materials and devices 4
- Silicon and Solar Cell Technologies 3
- Co-authors
- Wilfried VandervorstThomas HantschelPeter WolfR. J. StephensonTrudo ClaryssePh. NiedermannL. HellemansE. Oesterschulze
- Journals
- Microelectronic Engineering (1 paper)Applied Physics Letters (1 paper)Diamond and Related Materials (1 paper)Journal of Applied Physics (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (5 papers)
- Partner nations
- BelgiumGermanyUnited States
In The Last Decade
Thomas Trenkler
21 papers receiving 441 citations
Peers
Comparison fields: 5 of 28
- Atomic and Molecular Physics, and Optics 355
- Structural Biology 14
- Electrical and Electronic Engineering 338
- Biomedical Engineering 183
- Bioengineering 16
Countries citing papers authored by Thomas Trenkler
This map shows the geographic impact of Thomas Trenkler's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas Trenkler with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas Trenkler more than expected).
Fields of papers citing papers by Thomas Trenkler
This network shows the impact of papers produced by Thomas Trenkler. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas Trenkler. The network helps show where Thomas Trenkler may publish in the future.
Co-authors
The 25 scholars most cited alongside Thomas Trenkler, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 2 | |
| 2 | 2000 | 79 | |
| 3 | 2000 | 153 | |
| 4 | 2000 | 45 | |
| 5 | 2000 | 16 | |
| 6 | 2000 | 16 | |
| 7 | Nanopotentiometry: Data Interpretation and Quantification | 1999 | 0 |
| 8 | 1999 | 8 | |
| 9 | 1999 | 2 | |
| 10 | 1999 | 1 | |
| 11 | 1999 | 18 | |
| 12 | 1998 | 7 | |
| 13 | Dopant/carrier profiling for ULSI | 1998 | 1 |
| 14 | 1998 | 57 | |
| 15 | 1998 | 6 | |
| 16 | 1998 | 2 | |
| 17 | 1996 | 2 | |
| 18 | Local Potential Measurements in Silicon Devices using Atomic Force Microscopy with Conductive Tips | 1995 | 1 |
| 19 | 1995 | 8 | |
| 20 | Carrier Profile Determination in Device Structures using AFM-Based Methods | 1995 | 1 |
About Thomas Trenkler
Thomas Trenkler is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Biomedical Engineering, Computational Mechanics and Materials Chemistry, having authored 23 papers that have together received 452 indexed citations. Recurring topics across this work include Force Microscopy Techniques and Applications (18 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers), Surface and Thin Film Phenomena (7 papers), Near-Field Optical Microscopy (6 papers), Semiconductor materials and devices (4 papers), Silicon and Solar Cell Technologies (3 papers), Silicon Nanostructures and Photoluminescence (2 papers) and Semiconductor materials and interfaces (2 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (355 citations), Structural Biology (14 citations), Electrical and Electronic Engineering (338 citations), Biomedical Engineering (183 citations) and Bioengineering (16 citations). Thomas Trenkler has collaborated with scholars based in Belgium, Germany and United States. Frequent co-authors include Wilfried Vandervorst, Thomas Hantschel, Peter Wolf, R. J. Stephenson, Trudo Clarysse, Ph. Niedermann, L. Hellemans, E. Oesterschulze, A. Malavé and W. Kulisch. Their work appears in journals such as Microelectronic Engineering, Applied Physics Letters, Diamond and Related Materials, Journal of Applied Physics and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.