S. Tougaard

11.3k total citations · 3 hit papers
242 papers, 9.7k citations indexed

About

S. Tougaard is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Radiation. According to data from OpenAlex, S. Tougaard has authored 242 papers receiving a total of 9.7k indexed citations (citations by other indexed papers that have themselves been cited), including 216 papers in Surfaces, Coatings and Films, 135 papers in Electrical and Electronic Engineering and 106 papers in Radiation. Recurrent topics in S. Tougaard's work include Electron and X-Ray Spectroscopy Techniques (215 papers), X-ray Spectroscopy and Fluorescence Analysis (106 papers) and Semiconductor materials and devices (63 papers). S. Tougaard is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (215 papers), X-ray Spectroscopy and Fluorescence Analysis (106 papers) and Semiconductor materials and devices (63 papers). S. Tougaard collaborates with scholars based in Denmark, Belgium and Spain. S. Tougaard's co-authors include F. Yubero, Dahlang Tahir, Nicolas Pauly, A. Jabłoński, Peter Sigmund, Ib Chorkendorff, Henrik Hansen, C. Jansson, John Walton and Neal Fairley and has published in prestigious journals such as SHILAP Revista de lepidopterología, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

S. Tougaard

241 papers receiving 9.4k citations

Hit Papers

Systematic and collaborat... 1982 2026 1996 2011 2021 1988 1982 250 500 750

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
S. Tougaard 6.0k 5.0k 3.3k 3.0k 2.1k 242 9.7k
Shigeo Tanuma 5.0k 0.8× 4.6k 0.9× 3.8k 1.2× 2.0k 0.7× 2.2k 1.0× 150 9.3k
W. A. Dench 2.2k 0.4× 2.0k 0.4× 2.0k 0.6× 564 0.2× 1.5k 0.7× 14 5.0k
G. Beamson 2.2k 0.4× 2.8k 0.6× 3.5k 1.0× 364 0.1× 702 0.3× 115 7.9k
Raynald Gauvin 1.3k 0.2× 2.3k 0.5× 2.3k 0.7× 619 0.2× 572 0.3× 353 6.7k
Mark B. H. Breese 600 0.1× 3.3k 0.7× 3.1k 0.9× 672 0.2× 876 0.4× 324 6.7k
K.A.R. Mitchell 1.2k 0.2× 1.6k 0.3× 2.7k 0.8× 388 0.1× 2.4k 1.1× 172 5.5k
Agustín R. González‐Elipe 2.3k 0.4× 6.2k 1.2× 9.1k 2.7× 268 0.1× 1.6k 0.8× 521 15.9k
J. M. Gibson 1.1k 0.2× 6.0k 1.2× 9.0k 2.7× 313 0.1× 5.2k 2.4× 283 15.1k
J. C. Woicik 770 0.1× 2.9k 0.6× 4.0k 1.2× 552 0.2× 1.3k 0.6× 225 6.7k
Ferdinand Hofer 1.0k 0.2× 2.4k 0.5× 3.2k 1.0× 219 0.1× 1.1k 0.5× 264 7.3k

Countries citing papers authored by S. Tougaard

Since Specialization
Citations

This map shows the geographic impact of S. Tougaard's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Tougaard with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Tougaard more than expected).

Fields of papers citing papers by S. Tougaard

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Tougaard. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Tougaard. The network helps show where S. Tougaard may publish in the future.

Co-authorship network of co-authors of S. Tougaard

This figure shows the co-authorship network connecting the top 25 collaborators of S. Tougaard. A scholar is included among the top collaborators of S. Tougaard based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Tougaard. S. Tougaard is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Baer, Donald R., David J. H. Cant, Scott A. Chambers, et al.. (2025). What more can be done with XPS? Highly informative but underused approaches to XPS data collection and analysis. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 43(4). 3 indexed citations
2.
Pauly, Nicolas, F. Yubero, & S. Tougaard. (2023). Determination of the Primary Excitation Spectra in XPS and AES. Nanomaterials. 13(2). 339–339. 6 indexed citations
3.
Tougaard, S., Nicolas Pauly, & F. Yubero. (2022). QUEELS: Software to calculate the energy loss processes in TEELS, REELS, XPS and AES including effects of the core hole. Surface and Interface Analysis. 54(7). 820–833. 4 indexed citations
4.
Hauschild, Dirk, Ralph Steininger, Dimitrios Hariskos, et al.. (2021). Using the inelastic background in hard x-ray photoelectron spectroscopy for a depth-resolved analysis of the CdS/Cu(In,Ga)Se2 interface. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 39(6). 7 indexed citations
5.
Tougaard, S., et al.. (2019). Theoretical study toward rationalizing inelastic background analysis of buried layers in XPS and HAXPES. Surface and Interface Analysis. 51(8). 857–873. 24 indexed citations
6.
7.
Hajati, Shaaker, John Walton, & S. Tougaard. (2013). Three-Dimensional X-Ray Photoelectron Tomography on the Nanoscale: Limits of Data Processing by Principal Component Analysis. Microscopy and Microanalysis. 19(3). 751–760. 3 indexed citations
8.
Tahir, Dahlang & S. Tougaard. (2012). Electronic and optical properties of Cu, CuO and Cu2O studied by electron spectroscopy. Journal of Physics Condensed Matter. 24(17). 175002–175002. 443 indexed citations
9.
Cattin, L., et al.. (2011). On the ultrathin gold film used as buffer layer at the transparent conductive anode/organic electron donor interface. Gold bulletin. 44(4). 199–205. 16 indexed citations
10.
Hajati, Shaaker & S. Tougaard. (2010). XPS for non-destructive depth profiling and 3D imaging of surface nanostructures. Analytical and Bioanalytical Chemistry. 396(8). 2741–2755. 37 indexed citations
11.
Pauly, Nicolas & S. Tougaard. (2010). Model for Monte Carlo simulations of reflection electron energy loss spectra applied to Silicon at energies between 300 and 2000 eV. Surface and Interface Analysis. 42(6-7). 1100–1104. 6 indexed citations
12.
Yoshikawa, Hideki, et al.. (2009). Angular and Energy Dependences of Reflection Electron Energy Loss Spectra of Si. e-Journal of Surface Science and Nanotechnology. 7. 199–202. 3 indexed citations
13.
Hajati, Shaaker & S. Tougaard. (2006). What nano-physical properties can be determined by analysis of elastic peak accompanied by its inelastic background tail in XPS and AES spectra? (Special Issue on Quantitative Surface Chemical Analysis in honor of Kazuhiro Yoshihara). Journal of Surface Analysis. 13(2). 148–155. 2 indexed citations
14.
Hajati, Shaaker & S. Tougaard. (2006). What nano-physical properties can be determined by analysis of elastic peak accompanied by its inelastic background tail in XPS and AES spectra?. University of Southern Denmark Research Portal (University of Southern Denmark). 1 indexed citations
15.
Tougaard, S.. (2005). Algorithm for automatic x-ray photoelectron spectroscopy data processing and x-ray photoelectron spectroscopy imaging. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 23(4). 741–745. 20 indexed citations
16.
Pauly, Nicolas, S. Tougaard, & F. Yubero. (2005). Theoretical study of the surface excitation parameter from reflection‐electron‐energy‐loss spectra. Surface and Interface Analysis. 37(13). 1151–1157. 18 indexed citations
17.
Tougaard, S.. (1996). Quantitative XPS: non-destructive analysis of surface nano-structures. Applied Surface Science. 100-101. 1–10. 48 indexed citations
18.
Tougaard, S., et al.. (1995). Study of electron backscattering within the approximation of discrete flows. Surface and Interface Analysis. 23(10). 689–695. 10 indexed citations
19.
Yubero, F., J. M. Sanz, J.F. Trigo, E. Elizalde, & S. Tougaard. (1994). Quantitative analysis of REELS spectra of ZrO 2 : Determination of the dielectric loss function and inelastic mean free paths. Surface and Interface Analysis. 22(1-12). 124–128. 43 indexed citations
20.
Tougaard, S. & Henrik Hansen. (1989). Non‐destructive depth profiling through quantitative analysis of surface electron spectra. Surface and Interface Analysis. 14(11). 730–738. 82 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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