Yu. Matveyev

1.4k total citations
36 papers, 1.0k citations indexed

About

Yu. Matveyev is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Yu. Matveyev has authored 36 papers receiving a total of 1.0k indexed citations (citations by other indexed papers that have themselves been cited), including 24 papers in Materials Chemistry, 22 papers in Electrical and Electronic Engineering and 7 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Yu. Matveyev's work include Semiconductor materials and devices (13 papers), Ferroelectric and Negative Capacitance Devices (11 papers) and Electronic and Structural Properties of Oxides (11 papers). Yu. Matveyev is often cited by papers focused on Semiconductor materials and devices (13 papers), Ferroelectric and Negative Capacitance Devices (11 papers) and Electronic and Structural Properties of Oxides (11 papers). Yu. Matveyev collaborates with scholars based in Germany, Russia and Switzerland. Yu. Matveyev's co-authors include A. Zenkevich, Ksenia Maksimova, А. Л. Толстихина, R. V. Gaynutdinov, V. M. Fridkin, Andrey M. Markeev, Yu. Yu. Lebedinskiǐ, W. Drube, Konstantin Egorov and A. Gloskovskii and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Physical Review B.

In The Last Decade

Yu. Matveyev

36 papers receiving 1.0k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Yu. Matveyev Germany 17 657 626 238 137 108 36 1.0k
Timofey V. Perevalov Russia 24 1.5k 2.3× 1.2k 1.9× 184 0.8× 134 1.0× 81 0.8× 88 1.8k
L. Y. Chen China 16 435 0.7× 492 0.8× 245 1.0× 194 1.4× 37 0.3× 48 955
A. Zenkevich Russia 24 1.6k 2.4× 1.3k 2.0× 370 1.6× 262 1.9× 160 1.5× 97 2.0k
Chao Zhao Belgium 22 1.5k 2.2× 790 1.3× 228 1.0× 306 2.2× 56 0.5× 115 1.7k
Tore Niermann Germany 20 546 0.8× 408 0.7× 152 0.6× 322 2.4× 54 0.5× 69 990
Junyoung Kwon South Korea 18 465 0.7× 734 1.2× 120 0.5× 82 0.6× 41 0.4× 39 953
Philipp Komissinskiy Germany 20 507 0.8× 495 0.8× 431 1.8× 144 1.1× 48 0.4× 69 984
S. Jakschik Germany 14 772 1.2× 353 0.6× 108 0.5× 117 0.9× 23 0.2× 39 866
S. Dueñas Spain 19 1.3k 1.9× 498 0.8× 135 0.6× 305 2.2× 105 1.0× 146 1.4k
Cécile Carrétéro France 12 816 1.2× 593 0.9× 433 1.8× 217 1.6× 152 1.4× 22 1.2k

Countries citing papers authored by Yu. Matveyev

Since Specialization
Citations

This map shows the geographic impact of Yu. Matveyev's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yu. Matveyev with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yu. Matveyev more than expected).

Fields of papers citing papers by Yu. Matveyev

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Yu. Matveyev. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yu. Matveyev. The network helps show where Yu. Matveyev may publish in the future.

Co-authorship network of co-authors of Yu. Matveyev

This figure shows the co-authorship network connecting the top 25 collaborators of Yu. Matveyev. A scholar is included among the top collaborators of Yu. Matveyev based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yu. Matveyev. Yu. Matveyev is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kalläne, M., Christoph Schlueter, Yu. Matveyev, et al.. (2023). Trap‐Assisted Memristive Switching in HfO2‐Based Devices Studied by In Situ Soft and Hard X‐Ray Photoelectron Spectroscopy. Advanced Electronic Materials. 9(6). 6 indexed citations
2.
Bandyopadhyay, A., et al.. (2022). X-ray photoemission and absorption study of the pyrochlore iridates (Eu 1−x Bi x )2Ir2O7, 0  ⩽ x  ⩽  1. Journal of Physics Condensed Matter. 34(39). 395601–395601. 2 indexed citations
3.
Yu, Tianlun, John Wright, Guru Khalsa, et al.. (2021). Momentum-resolved electronic structure and band offsets in an epitaxial NbN/GaN superconductor/semiconductor heterojunction. Science Advances. 7(52). eabi5833–eabi5833. 9 indexed citations
4.
Schmitt, M., S. V. Chernov, S. Babenkov, et al.. (2021). Bulk spin polarization of magnetite from spin-resolved hard x-ray photoelectron spectroscopy. Physical review. B.. 104(4). 9 indexed citations
5.
Szyjka, Thomas, Lutz Baumgarten, Terence Mittmann, et al.. (2021). Chemical Stability of IrO2 Top Electrodes in Ferroelectric Hf0.5Zr0.5O2‐Based Metal–Insulator–Metal Structures: The Impact of Annealing Gas. physica status solidi (RRL) - Rapid Research Letters. 15(5). 14 indexed citations
6.
Ágústsson, Steinn Ýmir, S. V. Chernov, K. Medjanik, et al.. (2021). Temperature-dependent change of the electronic structure in the Kondo lattice system YbRh 2 Si 2. Journal of Physics Condensed Matter. 33(20). 205601–205601. 5 indexed citations
7.
Baumgarten, Lutz, Thomas Szyjka, Terence Mittmann, et al.. (2021). Impact of vacancies and impurities on ferroelectricity in PVD- and ALD-grown HfO2 films. Applied Physics Letters. 118(3). 62 indexed citations
8.
Chouprik, Anastasia, Vitalii Mikheev, Yu. Matveyev, et al.. (2020). Origin of the retention loss in ferroelectric Hf0.5Zr0.5O2-based memory devices. Acta Materialia. 204. 116515–116515. 51 indexed citations
9.
Fedchenko, O., Aimo Winkelmann, K. Medjanik, et al.. (2019). High-resolution hard-x-ray photoelectron diffraction in a momentum microscope—the model case of graphite. New Journal of Physics. 21(11). 113031–113031. 16 indexed citations
10.
Schlueter, Christoph, A. Gloskovskii, S. Piec, et al.. (2019). The new dedicated HAXPES beamline P22 at PETRAIII. AIP conference proceedings. 2054. 40010–40010. 85 indexed citations
11.
Medjanik, K., S. Babenkov, D. Vasilyev, et al.. (2019). Progress in HAXPES performance combining full-field k-imaging with time-of-flight recording. Journal of Synchrotron Radiation. 26(6). 1996–2012. 34 indexed citations
12.
Babenkov, S., K. Medjanik, D. Vasilyev, et al.. (2019). High-accuracy bulk electronic bandmapping with eliminated diffraction effects using hard X-ray photoelectron momentum microscopy. Communications Physics. 2(1). 25 indexed citations
13.
Gunnlaugsson, H. P., K. Johnston, R. Mantovan, et al.. (2017). Charge states and lattice sites of dilute implanted Sn in ZnO. Journal of Physics Condensed Matter. 29(15). 155701–155701. 5 indexed citations
14.
Gunnlaugsson, H. P., K. Nomura, K. Johnston, et al.. (2016). 5 7 Fe Emission Mössbauer Study on Gd 3 Ga 5 O 1 2 implanted with dilute 5 7 Mn. Hyperfine Interactions. 237(1). 15 indexed citations
15.
Johnston, K., H. P. Gunnlaugsson, K. Nomura, et al.. (2016). 57Fe emission Mössbauer spectroscopy following dilute implantation of 57Mn into In 2O3. Hyperfine Interactions. 237(1). 3 indexed citations
16.
Kirtaev, Roman V., et al.. (2015). Combined optical/e-beam lithography approach for the development of HfO2-based memristors in crossbars. 12. 1–2. 2 indexed citations
17.
Matveyev, Yu., Andrey M. Markeev, Yu. Yu. Lebedinskiǐ, et al.. (2014). Resistive switching effect in HfxAl1−xOy with a graded Al depth profile studied by hard X-ray photoelectron spectroscopy. Thin Solid Films. 563. 20–23. 11 indexed citations
18.
Zenkevich, A., et al.. (2013). Electronic and electrical properties of functional interfaces studied by hard X-ray photoemission. Journal of Electron Spectroscopy and Related Phenomena. 190. 302–308. 8 indexed citations
19.
Chouprik, Anastasia, S.A. Gudkova, Andrey M. Markeev, et al.. (2011). Structural and electrical properties of TixAl1−xOy thin films grown by atomic layer deposition. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 29(1). 01A302–01A302. 23 indexed citations
20.
Zenkevich, A., Yu. Yu. Lebedinskiǐ, Yu. Matveyev, et al.. (2009). Effect of heat treatments on electric dipole at metal/high-k dielectric interfaces measured by in situ XPS. Microelectronic Engineering. 86(7-9). 1777–1779. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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