P. Zeitzoff
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- Semiconductor materials and devices 70
- Advancements in Semiconductor Devices and Circuit Design 62
- Integrated Circuits and Semiconductor Failure Analysis 34
- Ferroelectric and Negative Capacitance Devices 17
- Silicon and Solar Cell Technologies 12
- Silicon Carbide Semiconductor Technologies 9
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- Semiconductor materials and interfaces 11
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- Copper Interconnects and Reliability 4
- Co-authors
- Ali RazaviehG. BersukerEdward J. NowakGeorge BrownChadwin D. YoungHoward R. HuffM.R. PintoW. Greene
- Cited by
- Electrical and Electronic EngineeringAtomic and Molecular Physics, and OpticsMaterials Chemistry
- Journals
- IEEE Electron Device Letters (5 papers)IEEE Transactions on Electron Devices (5 papers)Japanese Journal of Applied Physics (2 papers)
- Partner nations
- United StatesCanadaGermany
In The Last Decade
P. Zeitzoff
75 papers receiving 1.4k citations
Peers
Comparison fields: 5 of 43
- Electrical and Electronic Engineering 1.4k
- Atomic and Molecular Physics, and Optics 159
- Materials Chemistry 223
- Hardware and Architecture 24
- Biomedical Engineering 132
Countries citing papers authored by P. Zeitzoff
This map shows the geographic impact of P. Zeitzoff's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Zeitzoff with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Zeitzoff more than expected).
Fields of papers citing papers by P. Zeitzoff
This network shows the impact of papers produced by P. Zeitzoff. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Zeitzoff. The network helps show where P. Zeitzoff may publish in the future.
Co-authorship network
The 25 scholars most cited alongside P. Zeitzoff, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2016 | 6 | |
| 2 | 2011 | 6 | |
| 3 | 2006 | 30 | |
| 4 | 2006 | 0 | |
| 5 | 2005 | 15 | |
| 6 | 2005 | 31 | |
| 7 | 2005 | 4 | |
| 8 | 2005 | 32 | |
| 9 | 2004 | 60 | |
| 10 | 2004 | 7 | |
| 11 | 2004 | 18 | |
| 12 | 2004 | 25 | |
| 13 | Charge trapping and electron mobility degradation in MOCVD hafnium silicate gate dielectric stack structures | 2003 | 6 |
| 14 | 2003 | 1 | |
| 15 | 2002 | 1 | |
| 16 | Capacitance Degradation due to Fringing Field in Deep Sub-Micron MOSFETs with High-K Gate Dielectrics | 1999 | 1 |
| 17 | 1999 | 1 | |
| 18 | 1996 | 2 | |
| 19 | 1995 | 9 | |
| 20 | 1990 | 3 |
About P. Zeitzoff
P. Zeitzoff is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Hardware and Architecture and Surfaces, Coatings and Films, having authored 80 papers that have together received 1.5k indexed citations. Recurring topics across this work include Semiconductor materials and devices (70 papers), Advancements in Semiconductor Devices and Circuit Design (62 papers), Integrated Circuits and Semiconductor Failure Analysis (34 papers), Ferroelectric and Negative Capacitance Devices (17 papers), Silicon and Solar Cell Technologies (12 papers), Semiconductor materials and interfaces (11 papers), Silicon Carbide Semiconductor Technologies (9 papers) and Copper Interconnects and Reliability (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.4k citations), Atomic and Molecular Physics, and Optics (159 citations), Materials Chemistry (223 citations), Hardware and Architecture (24 citations) and Biomedical Engineering (132 citations). P. Zeitzoff has collaborated with scholars based in United States, Canada and Germany. Frequent co-authors include Ali Razavieh, G. Bersuker, Edward J. Nowak, George Brown, Chadwin D. Young, Howard R. Huff, M.R. Pinto, W. Greene, J.C.S. Woo and A. Inani. Their work appears in journals such as IEEE Electron Device Letters, IEEE Transactions on Electron Devices, Japanese Journal of Applied Physics, Applied Physics Letters and Materials Today.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.