Patrick Lysaght

2.9k total citations
93 papers, 2.0k citations indexed

About

Patrick Lysaght is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Hardware and Architecture. According to data from OpenAlex, Patrick Lysaght has authored 93 papers receiving a total of 2.0k indexed citations (citations by other indexed papers that have themselves been cited), including 81 papers in Electrical and Electronic Engineering, 20 papers in Materials Chemistry and 19 papers in Hardware and Architecture. Recurrent topics in Patrick Lysaght's work include Semiconductor materials and devices (67 papers), Integrated Circuits and Semiconductor Failure Analysis (34 papers) and Advancements in Semiconductor Devices and Circuit Design (28 papers). Patrick Lysaght is often cited by papers focused on Semiconductor materials and devices (67 papers), Integrated Circuits and Semiconductor Failure Analysis (34 papers) and Advancements in Semiconductor Devices and Circuit Design (28 papers). Patrick Lysaght collaborates with scholars based in United States, United Kingdom and Canada. Patrick Lysaght's co-authors include Brandon Blodget, G. Bersuker, Brendan Foran, Joel Barnett, John W. Young, Jeff Mason, Howard R. Huff, Tobias Becker, Pete Sedcole and Jason H. Anderson and has published in prestigious journals such as Nature Communications, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Patrick Lysaght

89 papers receiving 1.9k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Patrick Lysaght United States 26 1.5k 618 559 316 207 93 2.0k
S. V. Hattangady United States 19 974 0.7× 362 0.6× 140 0.3× 131 0.4× 232 1.1× 65 1.3k
M. Bohr United States 28 3.6k 2.5× 478 0.8× 513 0.9× 215 0.7× 344 1.7× 51 4.0k
Chih‐Yuan Lu Taiwan 22 1.8k 1.3× 487 0.8× 105 0.2× 412 1.3× 271 1.3× 166 2.1k
Hang-Ting Lue Taiwan 24 2.0k 1.3× 546 0.9× 180 0.3× 723 2.3× 132 0.6× 168 2.3k
Praveen Raghavan Belgium 19 1.5k 1.0× 199 0.3× 275 0.5× 285 0.9× 138 0.7× 142 1.7k
A. Nitayama Japan 18 1.4k 1.0× 219 0.4× 111 0.2× 436 1.4× 184 0.9× 71 1.7k
Ph. Roussel Belgium 33 3.6k 2.4× 570 0.9× 139 0.2× 86 0.3× 223 1.1× 150 3.8k
Zvonimir Bandić United States 19 512 0.3× 317 0.5× 115 0.2× 268 0.8× 528 2.6× 53 1.3k
A. Driskill-Smith United States 13 931 0.6× 310 0.5× 230 0.4× 302 1.0× 903 4.4× 21 1.5k
M. Ieong United States 27 3.4k 2.3× 508 0.8× 140 0.3× 211 0.7× 557 2.7× 72 3.7k

Countries citing papers authored by Patrick Lysaght

Since Specialization
Citations

This map shows the geographic impact of Patrick Lysaght's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick Lysaght with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick Lysaght more than expected).

Fields of papers citing papers by Patrick Lysaght

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Patrick Lysaght. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick Lysaght. The network helps show where Patrick Lysaght may publish in the future.

Co-authorship network of co-authors of Patrick Lysaght

This figure shows the co-authorship network connecting the top 25 collaborators of Patrick Lysaght. A scholar is included among the top collaborators of Patrick Lysaght based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Patrick Lysaght. Patrick Lysaght is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Ang, D. S., et al.. (2011). Scanning Tunneling Microscopy Study of the Multi-Step Deposited and Annealed HfSiOx Gate Dielectric. Journal of The Electrochemical Society. 158(10). H1021–H1021. 8 indexed citations
2.
Lysaght, Patrick, et al.. (2007). Incipient amorphous-to-crystalline transition in HfO2 as a function of thickness scaling and anneal temperature. Journal of Non-Crystalline Solids. 354(2-9). 399–403. 16 indexed citations
3.
Bersuker, G., Joel Barnett, Patrick Lysaght, et al.. (2006). The effect of interfacial layer properties on the performance of Hf-based gate stack devices. Journal of Applied Physics. 100(9). 121 indexed citations
4.
Lysaght, Patrick, Joel Barnett, J. C. Woicik, et al.. (2006). The Influence of NH3 Anneal on the Crystallization Kinetics of HfO2 Gate Dielectric Films. ECS Transactions. 1(5). 313–322. 4 indexed citations
5.
Lysaght, Patrick, et al.. (2005). Measurement of the silicon dioxide concentration in hafnium silicate gate dielectrics with a total reflection X-ray fluorescence spectroscopy. Powder Diffraction. 20(2). 161–164. 4 indexed citations
6.
Ryan, Jason T., et al.. (2005). Identification of the atomic scale defects involved in radiation damage in HfO/sub 2/ based MOS devices. IEEE Transactions on Nuclear Science. 52(6). 2272–2275. 36 indexed citations
7.
Bersuker, G., Joel Barnett, Brendan Foran, et al.. (2004). Interfacial Layer-Induced Mobility Degradation in High-kTransistors. Japanese Journal of Applied Physics. 43(11B). 7899–7902. 60 indexed citations
8.
Lysaght, Patrick, et al.. (2004). Of gates and wires. 2. 132–137. 6 indexed citations
9.
Bersuker, G., J.H. Sim, Chadwin D. Young, et al.. (2004). Effects of Structural Properties of Hf-Based Gate Stack on Transistor Performance. MRS Proceedings. 811. 25 indexed citations
10.
Foran, Brendan, et al.. (2004). Characterization of advanced gate stacks for Si CMOS by electron energy-loss spectroscopy in scanning transmission electron microscopy. Journal of Electron Spectroscopy and Related Phenomena. 143(2-3). 149–158. 25 indexed citations
11.
Lysaght, Patrick, Jeff J. Peterson, Brendan Foran, et al.. (2004). Physical and electrical characterization of polysilicon vs. TiN gate electrodes for HfO2 transistors. Materials Science in Semiconductor Processing. 7(4-6). 259–263. 16 indexed citations
12.
Lysaght, Patrick. (2003). Future design tools for platform FPGAs. 275–280. 3 indexed citations
13.
Blodget, Brandon, Scott McMillan, & Patrick Lysaght. (2003). A Lightweight Approach for Embedded Reconfiguration of FPGAs. Design, Automation, and Test in Europe. 10399–10401. 77 indexed citations
14.
Stemmer, Susanne, Zhiqiang Chen, Carlos G. Levi, et al.. (2003). Application of Metastable Phase Diagrams to Silicate Thin Films for Alternative Gate Dielectrics. Japanese Journal of Applied Physics. 42(Part 1, No. 6A). 3593–3597. 63 indexed citations
15.
Lysaght, Patrick, Brendan Foran, Susanne Stemmer, et al.. (2003). Thermal response of MOCVD hafnium silicate. Microelectronic Engineering. 69(2-4). 182–189. 21 indexed citations
16.
Lysaght, Patrick. (2003). FPGAs as meta-platforms for embedded systems. 7–12. 5 indexed citations
17.
Lysaght, Patrick, et al.. (2002). A simulation tool for dynamically reconfigurable field programmable gate arrays. 167–170. 1 indexed citations
18.
Lysaght, Patrick, et al.. (2002). Physical and Electrical Characterization of Hafnium Silicate Thin Films. MRS Proceedings. 745. 3 indexed citations
19.
Lysaght, Patrick, et al.. (2001). Dynamically Reconfigurable Cores. 3 indexed citations
20.
Lysaght, Patrick & J. Dunlop. (1994). Dynamic reconfiguration of FPGAs. 82–94. 28 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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