J. Bennett

6.3k total citations · 1 hit paper
76 papers, 1.7k citations indexed

About

J. Bennett is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, J. Bennett has authored 76 papers receiving a total of 1.7k indexed citations (citations by other indexed papers that have themselves been cited), including 56 papers in Electrical and Electronic Engineering, 41 papers in Computational Mechanics and 19 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in J. Bennett's work include Ion-surface interactions and analysis (39 papers), Integrated Circuits and Semiconductor Failure Analysis (36 papers) and Semiconductor materials and devices (28 papers). J. Bennett is often cited by papers focused on Ion-surface interactions and analysis (39 papers), Integrated Circuits and Semiconductor Failure Analysis (36 papers) and Semiconductor materials and devices (28 papers). J. Bennett collaborates with scholars based in United States, Belgium and Italy. J. Bennett's co-authors include John A. Dagata, J. Schneir, H. H. Harary, C. J. Evans, Michael T. Postek, Greg Gillen, W. F. Tseng, Michael J. Tarlov, R. T. Lareau and Philip E. Thompson and has published in prestigious journals such as Nature Communications, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

J. Bennett

70 papers receiving 1.6k citations

Hit Papers

Modification of hydrogen-passivated silicon by a scanning... 1990 2026 2002 2014 1990 100 200 300 400 500
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Modification of hydrogen-passivated silicon by a scanning tunneling microscope operating in air
    1990 570 citations John A. Dagata, J. Schneir et al. Applied Physics Letters profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
J. Bennett United States 19 968 759 575 389 376 76 1.7k
Nobuyuki Takeyasu Japan 16 301 0.3× 273 0.4× 888 1.5× 337 0.9× 234 0.6× 52 1.3k
R. A. Synowicki United States 20 881 0.9× 357 0.5× 436 0.8× 594 1.5× 131 0.3× 58 1.5k
Peter van de Weijer Netherlands 20 859 0.9× 131 0.2× 282 0.5× 205 0.5× 63 0.2× 58 1.2k
Armin Kriele Germany 22 725 0.7× 494 0.7× 367 0.6× 672 1.7× 66 0.2× 50 1.6k
Krister Svensson Sweden 24 676 0.7× 755 1.0× 614 1.1× 700 1.8× 58 0.2× 69 1.9k
Iain D. Baikie United Kingdom 20 1.0k 1.0× 455 0.6× 271 0.5× 708 1.8× 104 0.3× 52 1.6k
Erik Einarsson Japan 28 646 0.7× 558 0.7× 819 1.4× 2.1k 5.3× 75 0.2× 83 2.6k
Yuichi Utsumi Japan 17 462 0.5× 107 0.1× 612 1.1× 231 0.6× 101 0.3× 158 1.2k
W. M. Paulson United States 14 991 1.0× 337 0.4× 326 0.6× 617 1.6× 172 0.5× 54 1.5k
Olaf Stenzel Germany 19 576 0.6× 223 0.3× 290 0.5× 416 1.1× 259 0.7× 79 1.1k

Countries citing papers authored by J. Bennett

Since Specialization
Citations

This map shows the geographic impact of J. Bennett's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Bennett with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Bennett more than expected).

Fields of papers citing papers by J. Bennett

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Bennett. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Bennett. The network helps show where J. Bennett may publish in the future.

Co-authorship network of co-authors of J. Bennett

This figure shows the co-authorship network connecting the top 25 collaborators of J. Bennett. A scholar is included among the top collaborators of J. Bennett based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Bennett. J. Bennett is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Li, Shunran, Chenyu Zhou, Yanyan Li, et al.. (2024). Large exchange-driven intrinsic circular dichroism of a chiral 2D hybrid perovskite. Nature Communications. 15(1). 2573–2573. 19 indexed citations
2.
3.
Gumpinger, Johannes, Ana D. Brandão, T. Ghidini, et al.. (2024). A Study of Microstructural Tensile and Fatigue Properties Coupled with Digital Image Correlation of Hybrid Manufactured Inconel 718 Parts by Extrusion and Powder Bed Fusion. Advanced Engineering Materials. 26(13). 1 indexed citations
4.
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Bennett, J.. (2017). Measuring UV curing parameters of commercial photopolymers used in additive manufacturing. Additive manufacturing. 18. 203–212. 158 indexed citations
7.
Nonaka, Hidehiko, Yoshikazu Homma, Atsushi Murase, et al.. (2015). Final report on VAMAS round‐robin study to evaluate a correction method for saturation effects in DSIMS. Surface and Interface Analysis. 47(6). 681–700.
8.
Gu, Chungang, F. A. Stevie, J. Bennett, R. Garcia, & D. P. Griffis. (2006). Back side SIMS analysis of hafnium silicate. Applied Surface Science. 252(19). 7179–7181. 7 indexed citations
9.
Darne, Chinmay, D. Radhakrishnan, Paul van der Heide, et al.. (2004). Applications of metallic borides for gate electrodes in CMOS integrated circuits. REVIEWS ON ADVANCED MATERIALS SCIENCE. 8(2). 185–194. 17 indexed citations
10.
Bennett, J., et al.. (2004). Sputter rate variations in silicon under high-k dielectric films. Applied Surface Science. 231-232. 565–568. 7 indexed citations
11.
Bennett, J., et al.. (2004). Quantifying residual and surface carbon using polyencapsulation SIMS. Applied Surface Science. 231-232. 716–719. 2 indexed citations
12.
Lysaght, Patrick, Brendan Foran, Susanne Stemmer, et al.. (2003). Thermal response of MOCVD hafnium silicate. Microelectronic Engineering. 69(2-4). 182–189. 21 indexed citations
13.
Young, Chadwin D., A. Kerber, Tuo‐Hung Hou, et al.. (2003). Charge trapping and electron mobility degradation in MOCVD hafnium silicate gate dielectric stack structures. 347–359. 6 indexed citations
14.
Shao, Lin, Philip E. Thompson, J. Bennett, et al.. (2003). Using point-defect engineering to increase stability of highly doped ultrashallow junctions formed by molecular-beam-epitaxy growth. Applied Physics Letters. 83(14). 2823–2825. 5 indexed citations
15.
Jones, K. S., et al.. (2003). Fluorine-enhanced boron diffusion in amorphous silicon. Applied Physics Letters. 82(20). 3469–3471. 37 indexed citations
16.
Bennett, J., et al.. (2002). Adhesion of Cu and low-k Dielectric Thin Films with Tungsten Carbide. Journal of materials research/Pratt's guide to venture capital sources. 17(6). 1320–1328. 4 indexed citations
17.
Thompson, Philip E. & J. Bennett. (2002). Thermal stability of ultra-shallow junctions in silicon formed by molecular-beam epitaxy using boron delta doping. Materials Science and Engineering B. 89(1-3). 211–215. 4 indexed citations
18.
Bennett, J.. (1997). Profiling Shallow As Implants with Low-energy Cs Bombardment on a Modified Cameca IMS-4f. Surface and Interface Analysis. 25(6). 454–457. 2 indexed citations
19.
Dagata, John A., W. F. Tseng, J. Bennett, et al.. (1992). Integration of scanning tunneling microscope nanolithography and electronics device processing. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 10(4). 2105–2113. 28 indexed citations
20.
Vaeck, Luc Van, J. Bennett, E. A. Schweikert, et al.. (1989). Structural characterization of organic molecules by negative ions in laser microprobe mass spectrometry. Part 1—Neutral compounds. Organic Mass Spectrometry. 24(9). 782–796. 10 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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