S.A. Hareland

1.8k total citations
32 papers, 1.3k citations indexed

About

S.A. Hareland is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Hardware and Architecture. According to data from OpenAlex, S.A. Hareland has authored 32 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 28 papers in Electrical and Electronic Engineering, 7 papers in Atomic and Molecular Physics, and Optics and 3 papers in Hardware and Architecture. Recurrent topics in S.A. Hareland's work include Semiconductor materials and devices (27 papers), Advancements in Semiconductor Devices and Circuit Design (23 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). S.A. Hareland is often cited by papers focused on Semiconductor materials and devices (27 papers), Advancements in Semiconductor Devices and Circuit Design (23 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). S.A. Hareland collaborates with scholars based in United States and United Kingdom. S.A. Hareland's co-authors include J. Maiz, Peter R. Armstrong, R. Chau, M. Doczy, Suman Datta, B. Jin, J. Kavalieros, A.F. Tasch, R. Rios and T. Linton and has published in prestigious journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters and Electronics Letters.

In The Last Decade

S.A. Hareland

28 papers receiving 1.2k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
S.A. Hareland United States	15	1.3k	255	197	143	81	32	1.3k
J. Segura Spain	19	1.2k 0.9×	648 2.5×	251 1.3×	86 0.6×	15 0.2×	136	1.3k
Mojtaba Ebrahimi Germany	22	1.1k 0.9×	449 1.8×	26 0.1×	362 2.5×	47 0.6×	61	1.3k
Jiun-Lang Huang Taiwan	12	468 0.4×	375 1.5×	213 1.1×	97 0.7×	32 0.4×	59	571
F. Masuoka Japan	21	1.5k 1.2×	129 0.5×	211 1.1×	90 0.6×	207 2.6×	115	1.7k
Kerry Bernstein United States	9	867 0.7×	267 1.0×	97 0.5×	102 0.7×	81 1.0×	11	969
J. DeBrosse United States	11	457 0.4×	128 0.5×	41 0.2×	249 1.7×	59 0.7×	22	602
P.K. Chatterjee United States	19	1.2k 0.9×	131 0.5×	106 0.5×	184 1.3×	190 2.3×	68	1.3k
Dimitri Linten Belgium	20	1.4k 1.0×	108 0.4×	84 0.4×	68 0.5×	88 1.1×	154	1.4k
Rajendra Bishnoi Germany	18	909 0.7×	259 1.0×	36 0.2×	436 3.0×	57 0.7×	62	1.1k
Harish M. Kittur India	11	498 0.4×	137 0.5×	165 0.8×	88 0.6×	91 1.1×	66	656

Countries citing papers authored by S.A. Hareland

Since Specialization

Citations

This map shows the geographic impact of S.A. Hareland's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S.A. Hareland with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S.A. Hareland more than expected).

Fields of papers citing papers by S.A. Hareland

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S.A. Hareland. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S.A. Hareland. The network helps show where S.A. Hareland may publish in the future.

Co-authorship network of co-authors of S.A. Hareland

This figure shows the co-authorship network connecting the top 25 collaborators of S.A. Hareland. A scholar is included among the top collaborators of S.A. Hareland based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S.A. Hareland. S.A. Hareland is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Amundson, Isaac, et al.. (2014). Practical aspects of building a constrained random test framework for safety-critical embedded systems. 17–25. 2 indexed citations

Hareland, S.A., et al.. (2013). Prognostic opportunities and limitations in implantable medical devices. 335. 1–7.

Hareland, S.A., et al.. (2008). Reliability considerations for implantable medical ICs. 516–523. 9 indexed citations

Maiz, J., S.A. Hareland, Kedong Zhang, & Peter R. Armstrong. (2004). Characterization of multi-bit soft error events in advanced SRAMs. 21.4.1–21.4.4. 186 indexed citations

Emeny, M. T., S.A. Hareland, L. Haworth, et al.. (2004). Ultra high speed, very low power InSbb-based quantum well FETs for logic applications. 196–197. 3 indexed citations

Doyle, Barry M., B. I. Boyanov, Suman Datta, et al.. (2004). Tri-Gate fully-depleted CMOS transistors: fabrication, design and layout. 133–134. 163 indexed citations

Chau, R., Barry M. Doyle, M. Doczy, et al.. (2004). Silicon nano-transistors and breaking the 10 nm physical gate length barrier. 123–126. 35 indexed citations

Doyle, B.S., Suman Datta, M. Doczy, et al.. (2003). High performance fully-depleted tri-gate CMOS transistors. IEEE Electron Device Letters. 24(4). 263–265. 324 indexed citations

Hareland, S.A., et al.. (2002). An accurate preprocessor for Monte Carlo study of electron transport in inversion layers of silicon nMOSFETs. 28–29.

10.

Hareland, S.A., et al.. (2002). Impact of CMOS process scaling and SOI on the soft error rates of logic processes. 73–74. 93 indexed citations

11.

Chindalore, G., W.-K. Shih, S. Jallepalli, et al.. (2000). An experimental study of the effect of quantization on the effective electrical oxide thickness in MOS electron and hole accumulation layers in heavily doped Si. IEEE Transactions on Electron Devices. 47(3). 643–645. 6 indexed citations

12.

Dai, Changhong, et al.. (1999). Alpha-SER modeling and simulation for sub-0.25 /spl mu/m CMOS technology. 81–82. 12 indexed citations

13.

Hareland, S.A., S. Jallepalli, Haihong Wang, et al.. (1998). A physically-based model for quantization effects in hole inversion layers. IEEE Transactions on Electron Devices. 45(1). 179–186. 13 indexed citations

14.

Chindalore, G., S. Mudanai, S.A. Hareland, et al.. (1998). An improved technique and experimental results for the extraction of electron and hole mobilities in MOS accumulation layers. IEEE Transactions on Electron Devices. 45(2). 502–511. 9 indexed citations

15.

Hareland, S.A., W.-K. Shih, S. Jallepalli, et al.. (1998). Computationally efficient models for quantization effects in MOS electron and hole accumulation layers. IEEE Transactions on Electron Devices. 45(7). 1487–1493. 27 indexed citations

16.

Chindalore, G., S.A. Hareland, W.-K. Shih, et al.. (1997). Experimental determination of electron and hole mobilities in MOS accumulation layers. IEEE Electron Device Letters. 18(5). 200–202. 14 indexed citations

17.

Hareland, S.A., et al.. (1997). A simple model for quantum mechanical effects in hole inversion layers in silicon PMOS devices. IEEE Transactions on Electron Devices. 44(7). 1172–1173. 17 indexed citations

18.

Hareland, S.A., et al.. (1996). Manufacturing sensitivity analysis of a 0.18-micron NMOSFET. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2875. 136–136. 2 indexed citations

19.

Jallepalli, S., et al.. (1996). A pseudo-lucky electron model for simulation of electron gate current in submicron NMOSFET's. IEEE Transactions on Electron Devices. 43(8). 1264–1273. 55 indexed citations

20.

Hareland, S.A., A.F. Tasch, & C.M. Maziar. (1993). New structural approach for reducing punchthrough current in deep submicrometre MOSFETs and extending MOSFET scaling. Electronics Letters. 29(21). 1894–1896. 21 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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