H.E. Maes

1.3k citations

58 papers · 972 indexed · h-index 20

Impact in

Electrical and Electronic Engineering top 5%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon and Solar Cell Technologies
- Ferroelectric and Negative Capacitance Devices
Cognitive Neuroscience top 10%
- Visual perception and processing mechanisms
- Neural dynamics and brain function

Papers in

Electrical and Electronic Engineering 49
- Semiconductor materials and devices 28
- Advancements in Semiconductor Devices and Circuit Design 24
- Integrated Circuits and Semiconductor Failure Analysis 16
- Silicon and Solar Cell Technologies 11
- Thin-Film Transistor Technologies 4
Atomic and Molecular Physics, and Optics 16
- Semiconductor materials and interfaces 9
- Force Microscopy Techniques and Applications 5

Co-authors: G. Groeseneken Guy A. Orban Jan Vanhellemont Paul Heremans N. S. Saks Henry Kennedy J.A. Croon Willy Sansen
Journals: Microelectronic Engineering (4 papers)Microelectronics Reliability (4 papers)Applied Surface Science (3 papers)Journal of Applied Physics (3 papers)IEEE Transactions on Electron Devices (3 papers)
Partner nations: Belgium United States Netherlands

In The Last Decade

H.E. Maes

56 papers receiving 913 citations

Peers

Countries citing papers authored by H.E. Maes

Since Specialization

Citations

This map shows the geographic impact of H.E. Maes's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H.E. Maes with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H.E. Maes more than expected).

Fields of papers citing papers by H.E. Maes

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H.E. Maes. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H.E. Maes. The network helps show where H.E. Maes may publish in the future.

Co-authorship network

The 25 scholars most cited alongside H.E. Maes, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with H.E. Maes Line = papers co-authored together H.E. Maes links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	A 5v/3.3v-compatible Flash E/sup 2/PROM Cell With A 400ns/70μm Programming Time For Embedded Memory Applications Jan Van Houdt, D. Wellekens, L. Haspeslagh, L. Deferm, G. Groeseneken, H.E. Maes	2005	1
2	Charge trapping in SiO2/HfO2 gate dielectrics: Comparison between charge-pumping and pulsed ID–VG Microelectronic Engineering ·A. Kerber, E. Cartier, L. Pantisano, R. Degraeve, G. Groeseneken, H.E. Maes, Udo Schwalke	2004	33
3	Physical modeling and prediction of the matching properties of MOSFETs J.A. Croon, Stefaan Decoutere, Willy Sansen, H.E. Maes	2004	24
4	A comparison of extraction techniques for threshold voltage mismatch J.A. Croon, Hans Tuinhout, Santamaría Rodríguez, Wai Ki Yiu, Dedeh Kurniawati, Stefaan Decoutere, H.E. Maes, Willy Sansen	2003	30
5	A simple characterization method for MOS transistor matching in deep submicron technologies J.A. Croon, M. Rosmeulen, Stefaan Decoutere, Willy Sansen, H.E. Maes	2002	6
6	A new quantitative model to predict SILC-related disturb characteristics in flash E/sup 2/PROM devices J. De Blauwe, Jan Van Houdt, D. Wellekens, R. Degraeve, Philippe Roussel, L. Haspeslagh, N R Gnana Prakash, G. Groeseneken, H.E. Maes	2002	12
7	A reliability study of titanium silicide lines using micro-Raman spectroscopy and emission microscopy Ingrid De Wolf, David Howard, Mahmoud Rasras, A. Lauwers, Karen Maex, G. Groeseneken, H.E. Maes	1998	2
8	A reliability study of titanium silicide lines using micro-Raman spectroscopy and emission microscopy Microelectronics Reliability ·Ingrid De Wolf, David Howard, Mahmoud Rasras, A. Lauwers, Karen Maex, G. Groeseneken, H.E. Maes	1997	7
9	Local identification and mapping of the C49 and C54 titanium phases in submicron structures by micro-Raman spectroscopy Applied Physics Letters ·Ingrid De Wolf, David Howard, A. Lauwers, Karen Maex, H.E. Maes	1997	29
10	A review of recent work on stresses and strains in semiconductor heterostructures Physica Scripta ·S.C. Jain, M. Willander, K. Pinardi, H.E. Maes	1997	11
11	Defects in high-dose oxygen implanted silicon: a TEM study Vacuum ·James L. Blevins, J. van Landuyt, Jan Vanhellemont, H.E. Maes, (unknown)	1991	4
12	Spectroscopic ellipsometry for depth profiling of ion implanted materials Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·Jan Vanhellemont, Ph. Roussel, H.E. Maes	1991	28
13	Selectivity of cat area 18 neurons for direction and speed in depth Journal of Neurophysiology ·Werner Spileers, Guy A. Orban, Balázs Gulyás, H.E. Maes	1990	19
14	Spectroscopic Ellipsometry Studies of Silicon on Insulator Structures Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Jan Vanhellemont, H.E. Maes	1989	3
15	Analysis of hot carrier degradation in ac stressed n-channel mos-transistors using the charge pumping technique Springer Link (Chiba Institute of Technology) ·R. Bellens, Paul Heremans, G. Groeseneken, H.E. Maes	1988	2
16	Investigation of cross‐contamination during Si‐implantion in GaAs with SIMS Surface and Interface Analysis ·Marc Meuris, Wilfried Vandervorst, H.E. Maes	1988	1
17	Observation of hot-hole injection in NMOS transistors using a modified floating-gate technique IEEE Transactions on Electron Devices ·N. S. Saks, Paul Heremans, Luc Van den hove, H.E. Maes, R. F. De Keersmaecker, G. Declerck	1986	63
18	A model for the breakdown characteristics of p-channel MOS transistor protection devices Solid-State Electronics ·H.E. Maes, P. Six, Willy Sansen	1981	0
19	Response to movement of neurons in areas 17 and 18 of the cat: direction selectivity. Journal of Neurophysiology ·Guy A. Orban, Henry Kennedy, H.E. Maes	1981	100
20	Application of the equivalent circuit model for semiconductors to the study of Au-doped p-n junctions under forward bias IEEE Transactions on Electron Devices ·H.E. Maes, Chih‐Tang Sah	1976	22

About H.E. Maes

H.E. Maes is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Hardware and Architecture and Biomedical Engineering, having authored 58 papers that have together received 972 indexed citations. Recurring topics across this work include Semiconductor materials and devices (28 papers), Advancements in Semiconductor Devices and Circuit Design (24 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers), Silicon and Solar Cell Technologies (11 papers), Semiconductor materials and interfaces (9 papers), Force Microscopy Techniques and Applications (5 papers), Ion-surface interactions and analysis (5 papers) and Thin-Film Transistor Technologies (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (755 citations), Cognitive Neuroscience (132 citations), Atomic and Molecular Physics, and Optics (168 citations), Hardware and Architecture (34 citations) and Surfaces, Coatings and Films (33 citations). H.E. Maes has collaborated with scholars based in Belgium, United States and Netherlands. Frequent co-authors include G. Groeseneken, Guy A. Orban, Jan Vanhellemont, Paul Heremans, N. S. Saks, Henry Kennedy, J.A. Croon, Willy Sansen, Stefaan Decoutere and Wilfried Vandervorst. Their work appears in journals such as Microelectronic Engineering, Microelectronics Reliability, Applied Surface Science, Journal of Applied Physics and IEEE Transactions on Electron Devices.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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