Steven Verhaverbeke

788 total citations
50 papers, 558 citations indexed

About

Steven Verhaverbeke is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, Steven Verhaverbeke has authored 50 papers receiving a total of 558 indexed citations (citations by other indexed papers that have themselves been cited), including 40 papers in Electrical and Electronic Engineering, 14 papers in Biomedical Engineering and 13 papers in Materials Chemistry. Recurrent topics in Steven Verhaverbeke's work include Semiconductor materials and devices (22 papers), Silicon and Solar Cell Technologies (8 papers) and Integrated Circuits and Semiconductor Failure Analysis (7 papers). Steven Verhaverbeke is often cited by papers focused on Semiconductor materials and devices (22 papers), Silicon and Solar Cell Technologies (8 papers) and Integrated Circuits and Semiconductor Failure Analysis (7 papers). Steven Verhaverbeke collaborates with scholars based in United States, Belgium and Germany. Steven Verhaverbeke's co-authors include Marc Heyns, M. M. Heyns, Ivo Teerlinck, R. Cartuyvels, Chris Vinckier, Manish Keswani, J. R. Barnes, M. P. Murrell, Mark E. Welland and S. J. O’Shea and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

Steven Verhaverbeke

43 papers receiving 532 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Steven Verhaverbeke United States	12	412	208	155	141	62	50	558
Guanghua Cheng China	14	253 0.6×	215 1.0×	94 0.6×	131 0.9×	66 1.1×	37	514
M. Pasquinelli France	14	532 1.3×	311 1.5×	87 0.6×	126 0.9×	19 0.3×	72	682
Cathal Cassidy Japan	13	221 0.5×	259 1.2×	113 0.7×	52 0.4×	121 2.0×	35	558
Pāvels Onufrijevs Latvia	14	211 0.5×	246 1.2×	146 0.9×	85 0.6×	25 0.4×	64	455
A. Axelevitch Israel	11	403 1.0×	321 1.5×	171 1.1×	85 0.6×	138 2.2×	48	630
S. I. Pavlov Russia	11	195 0.5×	244 1.2×	176 1.1×	69 0.5×	95 1.5×	64	464
S. Hopfe Germany	10	320 0.8×	246 1.2×	103 0.7×	77 0.5×	54 0.9×	28	551
J.T. Lue Taiwan	14	190 0.5×	205 1.0×	130 0.8×	147 1.0×	94 1.5×	46	425
Jonathan T. Goldstein United States	16	479 1.2×	392 1.9×	88 0.6×	195 1.4×	158 2.5×	63	762
Artūrs Medvids Latvia	13	302 0.7×	313 1.5×	103 0.7×	94 0.7×	33 0.5×	57	547

Countries citing papers authored by Steven Verhaverbeke

Since Specialization

Citations

This map shows the geographic impact of Steven Verhaverbeke's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Steven Verhaverbeke with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Steven Verhaverbeke more than expected).

Fields of papers citing papers by Steven Verhaverbeke

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Steven Verhaverbeke. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Steven Verhaverbeke. The network helps show where Steven Verhaverbeke may publish in the future.

Co-authorship network of co-authors of Steven Verhaverbeke

This figure shows the co-authorship network connecting the top 25 collaborators of Steven Verhaverbeke. A scholar is included among the top collaborators of Steven Verhaverbeke based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Steven Verhaverbeke. Steven Verhaverbeke is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Verhaverbeke, Steven, et al.. (2024). Signal & Power Integrity Optimization Utilizing Silicon Core Substrate. 279–284.

Zheng, Kai, et al.. (2024). Fine Pitch (≤ 10μm) Die to Wafer Cu-Cu TCB on Organic Polymer Build Up Films. 2178–2183. 3 indexed citations

Chakraborty, Tapash, et al.. (2020). New and Unique CMP Material Solution for the Enablement of High Removal Rate Polymer CMP and other Advanced Packaging Applications. 41–43. 5 indexed citations

Liu, Demin, et al.. (2020). Low Temperature Cu/SiO2 Hybrid Bonding with Metal Passivation. 1–2. 12 indexed citations

Zhao, M., et al.. (2015). Contactless bottom-up electrodeposition of nickel for 3D integrated circuits. RSC Advances. 5(56). 45291–45299. 8 indexed citations

Weber, C. W., et al.. (2014). Investigations of solution variables in a contactless copper electrodeposition process for 3D packaging applications. Materials Science in Semiconductor Processing. 30. 578–584. 4 indexed citations

Zeng, Jie, Sunzida Ferdous, Steven Verhaverbeke, et al.. (2010). Facile Synthesis of Bimetallic Ag/Ni Core/Sheath Nanowires and Their Magnetic and Electrical Properties. Small. 6(17). 1927–1934. 28 indexed citations

Keswani, Manish, S. Raghavan, Pierre A. Deymier, & Steven Verhaverbeke. (2008). Megasonic cleaning of wafers in electrolyte solutions: Possible role of electro-acoustic and cavitation effects. Microelectronic Engineering. 86(2). 132–139. 34 indexed citations

Verhaverbeke, Steven, et al.. (2007). Mechanism and Principles of Post Etch Al Cleaning with Inorganic Acids. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 134. 363–366. 1 indexed citations

10.

Papanu, J. S., et al.. (2007). Surface modification and contamination characterization of ion-enhanced, implanted photoresist removal. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 25(2). 459–463. 1 indexed citations

11.

Verhaverbeke, Steven, et al.. (2003). Metallic Contamination Removal Evaluation for Single Wafer Processing. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 92. 49–52. 4 indexed citations

12.

Verhaverbeke, Steven, Marc Meuris, Marc Schaekers, et al.. (2003). A new modified HF-last cleaning process for high-performance gate dielectrics. 22–23.

13.

Verhaverbeke, Steven, et al.. (1996). A Model for the Electrochemical Deposition and Removal of Metallic Impurities on Si Surfaces (Special Issue on Scientific ULSI Manufacturing Technology). IEICE Transactions on Electronics. 79(3). 343–362. 7 indexed citations

14.

Verhaverbeke, Steven, et al.. (1996). A Model for the Electrochemical Deposition and Removal of Metallic Impurities on Si Surfaces. IEICE Transactions on Electronics. 343–362. 4 indexed citations

15.

Verhaverbeke, Steven, et al.. (1994). The Etching Mechanisms of SiO2 in Hydrofluoric Acid. Journal of The Electrochemical Society. 141(10). 2852–2857. 107 indexed citations

16.

Meuris, Marc, Steven Verhaverbeke, P. Mertens, et al.. (1993). Cleaning technology for improved gate oxide integrity. Microelectronic Engineering. 22(1-4). 21–28. 14 indexed citations

17.

Murrell, M. P., Mark E. Welland, S. J. O’Shea, et al.. (1993). Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy. Applied Physics Letters. 62(7). 786–788. 92 indexed citations

18.

Verhaverbeke, Steven, H. Bender, Marc Meuris, et al.. (1993). HF-last cleanings: a study of the properties with respect to the different variables. MRS Proceedings. 315(1). 457–466. 5 indexed citations

19.

Alay, J. L., Steven Verhaverbeke, W. Vandervorst, & Marc Heyns. (1992). Critical Parameters for Obtaining Low Particle Densities in an HF-Last Process.

20.

Meuris, Marc, Steven Verhaverbeke, Paul Mertens, et al.. (1992). The Relationship of the Silicon Surface Roughness and Gate Oxide Integrity in NH₄OH/H₂O₂ Mixtures. Japanese Journal of Applied Physics. 31(11A). L1514–L1514. 31 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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