J. Jopling
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Ferroelectric and Negative Capacitance Devices
- Low-power high-performance VLSI design
- Radio Frequency Integrated Circuit Design
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- Nanowire Synthesis and Applications
Papers in
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- Semiconductor materials and devices 4
- Integrated Circuits and Semiconductor Failure Analysis 4
- Advancements in Semiconductor Devices and Circuit Design 3
- Electronic Packaging and Soldering Technologies 2
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- Engineering Diagnostics and Reliability 1
- Co-authors
- Wilfried Haensch (2 shared papers)P. Ronsheim (2 shared papers)O. Dokumaci (2 shared papers)D.J. Frank (2 shared papers)P. M. Solomon (2 shared papers)C. D'Emic (1 shared paper)J. Hicks (2 shared papers)K. Mistry (1 shared paper)
- Journals
- Journal of Applied Physics (1 paper)
- Partner nations
- United States
In The Last Decade
J. Jopling
5 papers receiving 108 citations
Peers
Comparison fields: 5 of 10
- Electrical and Electronic Engineering 113
- Biomedical Engineering 27
- Hardware and Architecture 2
- Instrumentation 1
- Atomic and Molecular Physics, and Optics 6
Countries citing papers authored by J. Jopling
This map shows the geographic impact of J. Jopling's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Jopling with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Jopling more than expected).
Fields of papers citing papers by J. Jopling
This network shows the impact of papers produced by J. Jopling. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Jopling. The network helps show where J. Jopling may publish in the future.
Co-authors
The 19 scholars most cited alongside J. Jopling, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 90 | |
| 2 | 2009 | 10 | |
| 3 | 2004 | 7 | |
| 4 | 2009 | 5 | |
| 5 | 2023 | 2 | |
| 6 | 2024 | 0 |
About J. Jopling
J. Jopling is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials, Safety, Risk, Reliability and Quality, Mechanical Engineering and Statistics, Probability and Uncertainty, having authored 6 papers that have together received 114 indexed citations. Recurring topics across this work include Semiconductor materials and devices (4 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers), Electronic Packaging and Soldering Technologies (2 papers), Engineering Diagnostics and Reliability (1 paper), Material Properties and Failure Mechanisms (1 paper), Reliability and Maintenance Optimization (1 paper) and Probabilistic and Robust Engineering Design (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (113 citations), Biomedical Engineering (27 citations), Hardware and Architecture (2 citations), Instrumentation (1 citation) and Atomic and Molecular Physics, and Optics (6 citations). J. Jopling has collaborated with scholars based in United States. Frequent co-authors include Wilfried Haensch, P. Ronsheim, O. Dokumaci, D.J. Frank, P. M. Solomon, C. D'Emic, J. Hicks, K. Mistry, C. Prasad and Jami Wiedemer. Their work appears in journals such as Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.