H.-H. Vuong
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- Semiconductor materials and devices 15
- Integrated Circuits and Semiconductor Failure Analysis 14
- Silicon and Solar Cell Technologies 11
- Advancements in Semiconductor Devices and Circuit Design 9
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- Semiconductor materials and interfaces 3
- Semiconductor Quantum Structures and Devices 2
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- Ion-surface interactions and analysis 2
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- Engineering Applied Research 1
- Co-authors
- C.S. RaffertyS.J. HilleniusM.R. PintoP. ZeitzoffJennifer McKinleyH.-J. GossmannC. L. ReynoldsF. A. Stevie
- Cited by
- Structural BiologyElectrical and Electronic EngineeringAtomic and Molecular Physics, and Optics
- Journals
- IEEE Transactions on Electron Devices (3 papers)Applied Physics Letters (2 papers)IEEE Electron Device Letters (1 paper)
- Partner nations
- United StatesAustriaSpain
In The Last Decade
H.-H. Vuong
18 papers receiving 162 citations
Peers
Comparison fields: 5 of 17
- Structural Biology 8
- Electrical and Electronic Engineering 176
- Atomic and Molecular Physics, and Optics 49
- Surfaces, Coatings and Films 8
- Computational Mechanics 20
Countries citing papers authored by H.-H. Vuong
This map shows the geographic impact of H.-H. Vuong's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H.-H. Vuong with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H.-H. Vuong more than expected).
Fields of papers citing papers by H.-H. Vuong
This network shows the impact of papers produced by H.-H. Vuong. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H.-H. Vuong. The network helps show where H.-H. Vuong may publish in the future.
Co-authorship network
The 25 scholars most cited alongside H.-H. Vuong, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2005 | 0 | |
| 2 | 2002 | 3 | |
| 3 | 2002 | 8 | |
| 4 | 2002 | 7 | |
| 5 | 2002 | 0 | |
| 6 | 2002 | 8 | |
| 7 | 2002 | 4 | |
| 8 | 2002 | 3 | |
| 9 | 2002 | 18 | |
| 10 | 2000 | 5 | |
| 11 | 2000 | 33 | |
| 12 | 1999 | 8 | |
| 13 | 1999 | 4 | |
| 14 | 1999 | 17 | |
| 15 | 1996 | 22 | |
| 16 | 1995 | 3 | |
| 17 | 1995 | 23 | |
| 18 | 1994 | 1 | |
| 19 | 1992 | 11 | |
| 20 | 1992 | 3 |
About H.-H. Vuong
H.-H. Vuong is a scholar working on Structural Biology, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films and Computational Mechanics, having authored 22 papers that have together received 186 indexed citations. Recurring topics across this work include Semiconductor materials and devices (15 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers), Silicon and Solar Cell Technologies (11 papers), Advancements in Semiconductor Devices and Circuit Design (9 papers), Semiconductor materials and interfaces (3 papers), Ion-surface interactions and analysis (2 papers), Semiconductor Quantum Structures and Devices (2 papers) and Engineering Applied Research (1 paper). The work is most often cited by research in Structural Biology (8 citations), Electrical and Electronic Engineering (176 citations), Atomic and Molecular Physics, and Optics (49 citations), Surfaces, Coatings and Films (8 citations) and Computational Mechanics (20 citations). H.-H. Vuong has collaborated with scholars based in United States, Austria and Spain. Frequent co-authors include C.S. Rafferty, S.J. Hillenius, M.R. Pinto, P. Zeitzoff, Jennifer McKinley, H.-J. Gossmann, C. L. Reynolds, F. A. Stevie, D. C. Jacobson and L. J. Peticolas. Their work appears in journals such as IEEE Transactions on Electron Devices, Applied Physics Letters, IEEE Electron Device Letters, Journal of Applied Physics and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.