C. S. Pai

1.9k citations

74 papers · 1.4k indexed · h-index 20

Atomic and Molecular Physics, and Optics top 5%
- Semiconductor materials and interfaces 22
Electrical and Electronic Engineering top 5%
- Semiconductor materials and devices 28
- Silicon and Solar Cell Technologies 16
- Integrated Circuits and Semiconductor Failure Analysis 10
- Advancements in Semiconductor Devices and Circuit Design 9
- Thin-Film Transistor Technologies 8
Surfaces, Coatings and Films top 10%
Electronic, Optical and Magnetic Materials
- Copper Interconnects and Reliability 10
Statistical and Nonlinear Physics top 10%
Mechanics of Materials
- Metal and Thin Film Mechanics 9

Co-authors: S. S. Lau W Mansfield C.-P. Chang Kin P. Cheung F. Klemens H. B. Chan Raymond A. Cirelli Yiliang Bao
Cited by: Atomic and Molecular Physics, and Optics Electrical and Electronic Engineering Surfaces, Coatings and Films
Journals: Journal of Applied Physics (12 papers)Applied Physics Letters (5 papers)Thin Solid Films (4 papers)
Partner nations: United States Taiwan Hong Kong

In The Last Decade

C. S. Pai

67 papers receiving 1.3k citations

Peers

Countries citing papers authored by C. S. Pai

Since Specialization

Citations

This map shows the geographic impact of C. S. Pai's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. S. Pai with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. S. Pai more than expected).

Fields of papers citing papers by C. S. Pai

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. S. Pai. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. S. Pai. The network helps show where C. S. Pai may publish in the future.

Co-authorship network

The 25 scholars most cited alongside C. S. Pai, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with C. S. Pai Line = papers co-authored together C. S. Pai links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Reliability of deep learning models for scanning electron microscopy analysis Machine Learning Science and Technology ·C. S. Pai,Hung‐Chung Hsueh,Becker Fr	2025	0
2	Enhancing FeFET Performance Through H₂ Plasma Treatment: Improving Stability, Conductance, and Hamming Distances in FeCAM Designs Zhongping Huang,Bertha Kiwale,Yi‐Ting Tsai,C. S. Pai,N. M. Maniyesenov,Bruno Demeyere,varoi	2024	1
3	Morphotropic Phase Boundary-Enhanced Polarization and High-Temperature Retention in Ferroeletric FET varoi,C. S. Pai,Perez Masis R,Yuo-Tern Tsai,Bertha Kiwale	2024	0
4	Optical transmission through double-layer, laterally shifted metallic subwavelength hole arrays Optics Letters ·J. I. F. Furtado,Zhi Hong Hang,C. T. Chan,Ivan I. Kravchenko,J. E. Bower,R. Cirelli,F. Klemens,W Mansfield,J.F. Miner,C. S. Pai,H. B. Chan	2010	11
5	Casimir Force on a Surface with Shallow Nanoscale Corrugations: Geometry and Finite Conductivity Effects Physical Review Letters ·Yiliang Bao,Guille Benítez,Johann Lussange,Astrid Lambrecht,Raymond A. Cirelli,F. Klemens,W Mansfield,C. S. Pai,H. B. Chan	2010	51
6	Controlling the phase delay of light transmitted through double-layer metallic subwavelength slit arrays Optics Letters ·J. I. F. Furtado,А. Н. Озерин,D. W. Carr,J. E. Bower,R. Cirelli,F. Klemens,W Mansfield,J.F. Miner,C. S. Pai,H. B. Chan	2008	17
7	Measurement of the Casimir Force between a Gold Sphere and a Silicon Surface with Nanoscale Trench Arrays Physical Review Letters ·H. B. Chan,Yiliang Bao,Jie Zou,Raymond A. Cirelli,F. Klemens,W Mansfield,C. S. Pai	2008	166
8	Nonorthogonal wafer dicing for waveguide, microelectromechanical systems, and nanotechnology applications Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Stanley Pau,J. Ashley Taylor,C. S. Pai	2004	1
9	Is surface potential measurement (SPM) a useful charging damage measurement method? Kin P. Cheung,Jennifer Colonell,Konrad Steiner,J O Quispe Gonzales,Michael Rijssenbeek,Joellyn Gurckzynski,貞一大滝,Kim Krusen McComas,Joaquin A. Reina Hernandez,C. S. Pai,Claudia Marani,J.T. Clemens	2002	3
10	Reduced 1/f noise and g/sub m/ degradation for sub-0.25 μm MOSFETs with 25 Å-50 Å gate oxides grown on nitrogen implanted Si substrates James Ford,D. Misra,Kin P. Cheung,G. B. Alers,C.-P. Chang,Jennifer Colonell,Wei Lai,C. S. Pai,Maresa Zierer,J.T. Clemens	2002	1
11	Severe thickness variation of sub-3 nm gate oxide due to Si surface faceting, poly-Si intrusion, and corner stress James Ford,F.H. Baumann,A. Ghetti,H.-H. Vuong,Roger Whitney,Kin P. Cheung,Jennifer Colonell,J Lee,Valerio Franchi,J.F. Miner,C. S. Pai,Claudia Marani,Marii Yamamoto,J.T. Clemens	1999	8
12	Plasma damage immunity of thin gate oxide grown on very lightly N/sup +/ implanted silicon IEEE Electron Device Letters ·Kin P. Cheung,D. Misra,Jennifer Colonell,Anja Kohler,Yanjun Ma,Chang Chen,Wei Lai,Stephanie Poßelt,C. S. Pai	1998	4
13	The effects of rapid thermal processing on ultra-shallow junctions for deep sub-micron MOSFETs Solid-State Electronics ·Jenny Kuoljok,C.-Y. Lu,Tom Steere,C. S. Pai,N. S. Tsai	1995	8
14	Electron cyclotron resonance microwave discharge for oxide deposition using tetramethylcyclotetrasiloxane Journal of Applied Physics ·C. S. Pai,J.F. Miner,Pete Foley	1993	8
15	Suppression of hot-carrier degradation in Si MOSFETs by germanium doping IEEE Electron Device Letters ·K.K. Ng,C. S. Pai,W Mansfield,Tian Ling-zhi	1990	13
16	A review of rapid thermal annealing (RTA) of B, BF 2 and As ions implanted into silicon Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·T. E. Seidel,Takele Belay,C. S. Pai,R. V. Knoell,D. M. Maher,D. C. Jacobson	1985	104
17	A structure marker study for Pd2Si formation: Pd moves in epitaxial Pd2Si Journal of Applied Physics ·C.‐D. Lien,M-A. Nicolet,C. S. Pai	1985	8
18	A comparison between thermal annealing and ion mixing of multilayered Ni-W films on Si. II Journal of Applied Physics ·C. S. Pai,S. S. Lau,D. B. Poker,L. S. Hung	1985	9
19	Recrystallization of amorphous silicon layers on sapphire Thin Solid Films ·C. S. Pai,S. S. Lau,I. Suni	1983	15
20	Surface morphology of erbium silicide Applied Physics Letters ·S. S. Lau,C. S. Pai,A. Lomander,T. F. Kuech,Sebastián Soler	1982	52

About C. S. Pai

C. S. Pai is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials and Mechanics of Materials, having authored 74 papers that have together received 1.4k indexed citations. Recurring topics across this work include Semiconductor materials and devices (28 papers), Semiconductor materials and interfaces (22 papers), Silicon and Solar Cell Technologies (16 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers), Copper Interconnects and Reliability (10 papers), Advancements in Semiconductor Devices and Circuit Design (9 papers), Metal and Thin Film Mechanics (9 papers) and Thin-Film Transistor Technologies (8 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (729 citations), Electrical and Electronic Engineering (877 citations), Surfaces, Coatings and Films (78 citations), Electronic, Optical and Magnetic Materials (161 citations) and Statistical and Nonlinear Physics (91 citations). C. S. Pai has collaborated with scholars based in United States, Taiwan and Hong Kong. Frequent co-authors include S. S. Lau, W Mansfield, C.-P. Chang, Kin P. Cheung, F. Klemens, H. B. Chan, Raymond A. Cirelli, Yiliang Bao, T. E. Seidel and Jie Zou. Their work appears in journals such as Journal of Applied Physics, Applied Physics Letters, Thin Solid Films, IEEE Electron Device Letters and Optics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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