C. S. Pai

1.9k total citations
74 papers, 1.4k citations indexed

About

C. S. Pai is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Mechanics of Materials. According to data from OpenAlex, C. S. Pai has authored 74 papers receiving a total of 1.4k indexed citations (citations by other indexed papers that have themselves been cited), including 54 papers in Electrical and Electronic Engineering, 31 papers in Atomic and Molecular Physics, and Optics and 10 papers in Mechanics of Materials. Recurrent topics in C. S. Pai's work include Semiconductor materials and devices (28 papers), Semiconductor materials and interfaces (22 papers) and Silicon and Solar Cell Technologies (16 papers). C. S. Pai is often cited by papers focused on Semiconductor materials and devices (28 papers), Semiconductor materials and interfaces (22 papers) and Silicon and Solar Cell Technologies (16 papers). C. S. Pai collaborates with scholars based in United States, Taiwan and Hong Kong. C. S. Pai's co-authors include S. S. Lau, W Mansfield, C.-P. Chang, Kin P. Cheung, F. Klemens, H. B. Chan, Raymond A. Cirelli, Yiliang Bao, T. E. Seidel and Jie Zou and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

C. S. Pai

67 papers receiving 1.3k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
C. S. Pai United States 20 877 729 285 161 146 74 1.4k
Hal Edwards United States 17 537 0.6× 667 0.9× 405 1.4× 145 0.9× 75 0.5× 63 1.4k
N. M. Miskovsky United States 25 846 1.0× 716 1.0× 792 2.8× 99 0.6× 154 1.1× 113 1.7k
Albert Feldman United States 16 422 0.5× 406 0.6× 621 2.2× 91 0.6× 92 0.6× 54 1.1k
Robert G. Hunsperger United States 23 1.7k 1.9× 1.2k 1.7× 251 0.9× 94 0.6× 201 1.4× 74 2.1k
P. A. Barnes United States 19 772 0.9× 599 0.8× 213 0.7× 32 0.2× 89 0.6× 50 1.1k
D. Ebling Germany 22 718 0.8× 508 0.7× 659 2.3× 98 0.6× 23 0.2× 57 1.4k
Kazumi Wada Japan 22 1.4k 1.6× 961 1.3× 532 1.9× 58 0.4× 62 0.4× 106 1.8k
Joseph J. Talghader United States 17 523 0.6× 268 0.4× 273 1.0× 110 0.7× 73 0.5× 118 985
F. Klemens United States 19 1.1k 1.2× 574 0.8× 201 0.7× 185 1.1× 118 0.8× 81 1.6k
Tom Larsen United States 14 332 0.4× 951 1.3× 348 1.2× 142 0.9× 95 0.7× 36 1.3k

Countries citing papers authored by C. S. Pai

Since Specialization
Citations

This map shows the geographic impact of C. S. Pai's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. S. Pai with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. S. Pai more than expected).

Fields of papers citing papers by C. S. Pai

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. S. Pai. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. S. Pai. The network helps show where C. S. Pai may publish in the future.

Co-authorship network of co-authors of C. S. Pai

This figure shows the co-authorship network connecting the top 25 collaborators of C. S. Pai. A scholar is included among the top collaborators of C. S. Pai based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. S. Pai. C. S. Pai is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Pai, C. S., et al.. (2025). Reliability of deep learning models for scanning electron microscopy analysis. Machine Learning Science and Technology. 6(4). 45008–45008.
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Hang, Zhi Hong, C. T. Chan, Ivan I. Kravchenko, et al.. (2010). Optical transmission through double-layer, laterally shifted metallic subwavelength hole arrays. Optics Letters. 35(13). 2124–2124. 11 indexed citations
5.
Bao, Yiliang, Johann Lussange, Astrid Lambrecht, et al.. (2010). Casimir Force on a Surface with Shallow Nanoscale Corrugations: Geometry and Finite Conductivity Effects. Physical Review Letters. 105(25). 250402–250402. 51 indexed citations
6.
Carr, D. W., J. E. Bower, R. Cirelli, et al.. (2008). Controlling the phase delay of light transmitted through double-layer metallic subwavelength slit arrays. Optics Letters. 33(13). 1410–1410. 17 indexed citations
7.
Chan, H. B., Yiliang Bao, Jie Zou, et al.. (2008). Measurement of the Casimir Force between a Gold Sphere and a Silicon Surface with Nanoscale Trench Arrays. Physical Review Letters. 101(3). 30401–30401. 166 indexed citations
8.
Pau, Stanley, J. Ashley Taylor, & C. S. Pai. (2004). Nonorthogonal wafer dicing for waveguide, microelectromechanical systems, and nanotechnology applications. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 22(4). L15–L16. 1 indexed citations
9.
Cheung, Kin P., et al.. (2002). Is surface potential measurement (SPM) a useful charging damage measurement method?. 18–21. 3 indexed citations
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Baumann, F.H., A. Ghetti, H.-H. Vuong, et al.. (1999). Severe thickness variation of sub-3 nm gate oxide due to Si surface faceting, poly-Si intrusion, and corner stress. 75–76. 8 indexed citations
12.
Cheung, Kin P., D. Misra, Jennifer Colonell, et al.. (1998). Plasma damage immunity of thin gate oxide grown on very lightly N/sup +/ implanted silicon. IEEE Electron Device Letters. 19(7). 231–233. 4 indexed citations
13.
Lu, C.-Y., et al.. (1995). The effects of rapid thermal processing on ultra-shallow junctions for deep sub-micron MOSFETs. Solid-State Electronics. 38(8). 1473–1477. 8 indexed citations
14.
Pai, C. S., et al.. (1993). Electron cyclotron resonance microwave discharge for oxide deposition using tetramethylcyclotetrasiloxane. Journal of Applied Physics. 73(7). 3531–3538. 8 indexed citations
15.
Ng, K.K., et al.. (1990). Suppression of hot-carrier degradation in Si MOSFETs by germanium doping. IEEE Electron Device Letters. 11(1). 45–47. 13 indexed citations
16.
Seidel, T. E., et al.. (1985). A review of rapid thermal annealing (RTA) of B, BF 2 and As ions implanted into silicon. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 7-8. 251–260. 104 indexed citations
17.
Lien, C.‐D., M-A. Nicolet, & C. S. Pai. (1985). A structure marker study for Pd2Si formation: Pd moves in epitaxial Pd2Si. Journal of Applied Physics. 57(2). 224–226. 8 indexed citations
18.
Pai, C. S., S. S. Lau, D. B. Poker, & L. S. Hung. (1985). A comparison between thermal annealing and ion mixing of multilayered Ni-W films on Si. II. Journal of Applied Physics. 58(11). 4178–4185. 9 indexed citations
19.
Pai, C. S., S. S. Lau, & I. Suni. (1983). Recrystallization of amorphous silicon layers on sapphire. Thin Solid Films. 109(3). 263–281. 15 indexed citations
20.
Lau, S. S., et al.. (1982). Surface morphology of erbium silicide. Applied Physics Letters. 41(1). 77–80. 52 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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