D.L. Rath

740 total citations
23 papers, 548 citations indexed

About

D.L. Rath is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Materials Chemistry. According to data from OpenAlex, D.L. Rath has authored 23 papers receiving a total of 548 indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 11 papers in Electronic, Optical and Magnetic Materials and 6 papers in Materials Chemistry. Recurrent topics in D.L. Rath's work include Copper Interconnects and Reliability (9 papers), Semiconductor materials and devices (9 papers) and Electron and X-Ray Spectroscopy Techniques (5 papers). D.L. Rath is often cited by papers focused on Copper Interconnects and Reliability (9 papers), Semiconductor materials and devices (9 papers) and Electron and X-Ray Spectroscopy Techniques (5 papers). D.L. Rath collaborates with scholars based in United States and Germany. D.L. Rath's co-authors include D.M. Kolb, Wilford N. Hansen, R.A. Wille, A. Simon, S. Kaldor, Wei‐Tsu Tseng, E. Liniger, L. Gignac, C.‐K. Hu and R. Kötz and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

D.L. Rath

22 papers receiving 523 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
D.L. Rath United States	12	343	183	178	151	101	23	548
M. Kruft Germany	8	349 1.0×	181 1.0×	42 0.2×	158 1.0×	155 1.5×	8	514
I. Preda Spain	12	252 0.7×	28 0.2×	125 0.7×	31 0.2×	358 3.5×	17	580
S. Valızadeh Sweden	14	201 0.6×	39 0.2×	49 0.3×	96 0.6×	258 2.6×	26	465
Minxian Wu China	13	271 0.8×	57 0.3×	70 0.4×	41 0.3×	235 2.3×	30	523
Jonathan J. Mallett United States	16	342 1.0×	78 0.4×	117 0.7×	226 1.5×	199 2.0×	33	565
A.A. Wronkowska Poland	12	232 0.7×	22 0.1×	72 0.4×	120 0.8×	154 1.5×	38	378
R. J. Koestner United States	14	897 2.6×	40 0.2×	69 0.4×	208 1.4×	246 2.4×	30	1.0k
Tiruchirapalli Arunagiri United States	7	501 1.5×	43 0.2×	361 2.0×	129 0.9×	193 1.9×	9	623
Guowei He United States	13	524 1.5×	63 0.3×	118 0.7×	179 1.2×	473 4.7×	21	910
W.D. Ryden United States	7	231 0.7×	22 0.1×	136 0.8×	70 0.5×	248 2.5×	13	461

Countries citing papers authored by D.L. Rath

Since Specialization

Citations

This map shows the geographic impact of D.L. Rath's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D.L. Rath with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D.L. Rath more than expected).

Fields of papers citing papers by D.L. Rath

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D.L. Rath. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D.L. Rath. The network helps show where D.L. Rath may publish in the future.

Co-authorship network of co-authors of D.L. Rath

This figure shows the co-authorship network connecting the top 25 collaborators of D.L. Rath. A scholar is included among the top collaborators of D.L. Rath based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D.L. Rath. D.L. Rath is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Washington, Joseph R., D.L. Rath, Spyridon Skordas, et al.. (2014). Copper-to-dielectric heterogeneous bonding for 3D integration. 6–6.

Rath, D.L., et al.. (2014). Teaching the Past Perfect: A Comparison of Two Approaches. World Journal of English Language. 4(4). 3 indexed citations

Chen, Kuan‐Neng, Anna W. Topol, D.L. Rath, et al.. (2006). Improved manufacturability of Cu bond pads and implementation of seal design in 3D integrated circuits and packages. 5 indexed citations

Canaperi, D., L. Gignac, S. Kaldor, et al.. (2005). Electromigration Cu mass flow in Cu interconnections. Thin Solid Films. 504(1-2). 274–278. 27 indexed citations

Nitta, S., S. Purushothaman, Sharon L. Smith, et al.. (2005). Successful dual damascene integration of extreme low k materials (k > 2.0) using a novel gap fill based integration scheme. 321–324. 7 indexed citations

Hu, Chunhua, D. Canaperi, Lynne Gignac, et al.. (2004). Effects of overlayers on electromigration reliability improvement for Cu/low K interconnects. 222–228. 37 indexed citations

Hu, C.‐K., L. Gignac, E. Liniger, et al.. (2003). Comparison of Cu electromigration lifetime in Cu interconnects coated with various caps. Applied Physics Letters. 83(5). 869–871. 86 indexed citations

Rath, D.L., et al.. (2002). Defect reduction and cost savings through re-inventing RCA cleans. 34. 308–313. 1 indexed citations

Filippi, R. G., M. Gribelyuk, T. Sullivan, et al.. (2001). Electromigration in AlCu lines: comparison of Dual Damascene and metal reactive ion etching. Thin Solid Films. 388(1-2). 303–314. 5 indexed citations

10.

Ravikumar, R.V.S.S.N., D.L. Rath, R. G. Filippi, et al.. (2001). New Aqueous Clean for Aluminum Interconnects: Part II. Applications. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 76-77. 51–54. 1 indexed citations

11.

Gale, Glenn W., et al.. (2001). Enhancement of Semiconductor Wafer Cleaning by Chelating Agent Addition. Journal of The Electrochemical Society. 148(9). G513–G513. 19 indexed citations

12.

Heřman, D., B. E. Argyle, P. L. Trouilloud, et al.. (1988). Study of field-driven wall-configuration conversions for laminated Permalloy in the easy-axis state. Journal of Applied Physics. 63(8). 4036–4038. 11 indexed citations

13.

Herman, David A., P. L. Trouilloud, B. E. Argyle, et al.. (1988). Edge-curling-wall discontinuities and interactions with Bloch walls in easy-axis Permalloy. IEEE Transactions on Magnetics. 24(6). 3066–3068. 9 indexed citations

14.

Rath, D.L. & Wilford N. Hansen. (1984). Electrode resistance in the electrochemical cell; analysis of size effect theory with the specific adsorption of Br− and I− on polycrystalline gold films. Surface Science. 136(1). 195–216. 34 indexed citations

15.

Rath, D.L., et al.. (1983). An ESCA Study on the Electrochemical Double Layer of Emersed Electrodes. Berichte der Bunsengesellschaft für physikalische Chemie. 87(12). 1108–1113. 92 indexed citations

16.

Rath, D.L.. (1983). Studies of electrode resistance in the electrochemical cell. Journal of Electroanalytical Chemistry. 150(1-2). 521–534. 24 indexed citations

17.

Rath, D.L. & D.M. Kolb. (1981). Continuous work function monitoring for electrode emersion. Surface Science. 109(3). 641–647. 68 indexed citations

18.

Frerichs, Hajo, S. Kalbitzer, F.J. Demond, D.L. Rath, & D.M. Kolb. (1981). Analysis of Pb on Ag by Rutherford backscattering. Surface Science. 105(2-3). L271–L276. 9 indexed citations

19.

Hansen, Wilford N., D.M. Kolb, D.L. Rath, & R.A. Wille. (1980). An ESCA study on emersed electrodes. Journal of Electroanalytical Chemistry. 110(1-3). 369–373. 59 indexed citations

20.

Kolb, D.M., R. Kötz, & D.L. Rath. (1980). Structural investigations of metal adsorbates on single crystal surfaces using reflectance spectroscopy. Surface Science. 101(1-3). 490–498. 28 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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