C. Lavoie
Impact in
-
- Semiconductor materials and interfaces
- Surface and Thin Film Phenomena
- Structural Biology top 2%
Papers in
-
- Semiconductor materials and devices 80
- Silicon and Solar Cell Technologies 33
- Integrated Circuits and Semiconductor Failure Analysis 19
-
- Semiconductor materials and interfaces 110
- Surface and Thin Film Phenomena 29
- Co-authors
- Christophe Detavernier (52 shared papers)C. Cabral (49 shared papers)Jean Jordan‐Sweet (59 shared papers)F. M. d’Heurle (13 shared papers)R.L. Van Meirhaeghe (19 shared papers)J. Tersoff (2 shared papers)Simon Gaudet (11 shared papers)P. Desjardins (17 shared papers)
- Journals
- Journal of Applied Physics (42 papers)Applied Physics Letters (15 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (10 papers)Thin Solid Films (9 papers)Microelectronic Engineering (8 papers)
- Partner nations
- United StatesBelgiumCanada
In The Last Decade
C. Lavoie
190 papers receiving 4.8k citations
C. Lavoie's Hit Papers
Peers
Comparison fields: 5 of 104
- Atomic and Molecular Physics, and Optics 2.7k
- Structural Biology 80
- Electrical and Electronic Engineering 3.2k
- Materials Chemistry 1.7k
- Electronic, Optical and Magnetic Materials 548
Countries citing papers authored by C. Lavoie
This map shows the geographic impact of C. Lavoie's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Lavoie with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Lavoie more than expected).
Fields of papers citing papers by C. Lavoie
This network shows the impact of papers produced by C. Lavoie. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Lavoie. The network helps show where C. Lavoie may publish in the future.
Co-authors
The 25 scholars most cited alongside C. Lavoie, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 197 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | Ambipolar Electrical Transport in Semiconducting Single-Wall Carbon Nanotubes Hit paper breakdown → | 2001 | 594 |
| 2 | 2003 | 340 | |
| 3 | 2006 | 196 | |
| 4 | 2003 | 167 | |
| 5 | 1995 | 140 | |
| 6 | 2007 | 128 | |
| 7 | 2006 | 118 | |
| 8 | 2005 | 105 | |
| 9 | 2009 | 103 | |
| 10 | 2002 | 102 | |
| 11 | 2010 | 90 | |
| 12 | 2009 | 88 | |
| 13 | 2004 | 86 | |
| 14 | 2011 | 86 | |
| 15 | 2003 | 68 | |
| 16 | 2010 | 67 | |
| 17 | 1993 | 60 | |
| 18 | 2003 | 59 | |
| 19 | 2006 | 59 | |
| 20 | 1997 | 56 |
About C. Lavoie
C. Lavoie is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Mechanical Engineering and Electronic, Optical and Magnetic Materials, having authored 197 papers that have together received 5.0k indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (110 papers), Semiconductor materials and devices (80 papers), Silicon and Solar Cell Technologies (33 papers), Surface and Thin Film Phenomena (29 papers), Intermetallics and Advanced Alloy Properties (22 papers), Copper Interconnects and Reliability (22 papers), Metal and Thin Film Mechanics (19 papers) and Integrated Circuits and Semiconductor Failure Analysis (19 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (2.7k citations), Structural Biology (80 citations), Electrical and Electronic Engineering (3.2k citations), Materials Chemistry (1.7k citations) and Electronic, Optical and Magnetic Materials (548 citations). C. Lavoie has collaborated with scholars based in United States, Belgium and Canada. Frequent co-authors include Christophe Detavernier, C. Cabral, Jean Jordan‐Sweet, F. M. d’Heurle, R.L. Van Meirhaeghe, J. Tersoff, Simon Gaudet, P. Desjardins, K. Chan and J. M. E. Harper. Their work appears in journals such as Journal of Applied Physics, Applied Physics Letters, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Thin Solid Films and Microelectronic Engineering.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.