Patrick W. DeHaven

507 total citations
33 papers, 391 citations indexed

About

Patrick W. DeHaven is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Mechanics of Materials. According to data from OpenAlex, Patrick W. DeHaven has authored 33 papers receiving a total of 391 indexed citations (citations by other indexed papers that have themselves been cited), including 24 papers in Electrical and Electronic Engineering, 13 papers in Electronic, Optical and Magnetic Materials and 7 papers in Mechanics of Materials. Recurrent topics in Patrick W. DeHaven's work include Copper Interconnects and Reliability (13 papers), Electronic Packaging and Soldering Technologies (10 papers) and Semiconductor materials and devices (9 papers). Patrick W. DeHaven is often cited by papers focused on Copper Interconnects and Reliability (13 papers), Electronic Packaging and Soldering Technologies (10 papers) and Semiconductor materials and devices (9 papers). Patrick W. DeHaven collaborates with scholars based in United States, Germany and Switzerland. Patrick W. DeHaven's co-authors include Ronald Lovett, Frank P. Buff, Virgil L. Goedken, David R. Medeiros, David B. Mitzi, Kenneth P. Rodbell, Marvin C. Weiss, Robert A. Jacobson, Philip Warner and L. A. Clevenger and has published in prestigious journals such as Journal of the American Chemical Society, The Journal of Chemical Physics and Journal of Applied Physics.

In The Last Decade

Patrick W. DeHaven

31 papers receiving 368 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Patrick W. DeHaven United States 12 177 131 105 84 80 33 391
С. А. Гуревич Russia 12 189 1.1× 203 1.5× 118 1.1× 56 0.7× 129 1.6× 68 434
Natalia Bedoya‐Martínez Austria 12 143 0.8× 234 1.8× 41 0.4× 69 0.8× 78 1.0× 22 380
D. Romeu Mexico 11 68 0.4× 318 2.4× 55 0.5× 47 0.6× 47 0.6× 39 403
L. F. Magaña Mexico 14 211 1.2× 273 2.1× 45 0.4× 82 1.0× 240 3.0× 78 570
Jannis Erhard Germany 7 87 0.5× 257 2.0× 88 0.8× 37 0.4× 106 1.3× 12 437
M. R. Srinivasan India 12 72 0.4× 244 1.9× 67 0.6× 159 1.9× 77 1.0× 25 378
D. H. Linares Argentina 12 50 0.3× 303 2.3× 47 0.4× 77 0.9× 100 1.3× 26 431
Philipp Schapotschnikow Netherlands 12 270 1.5× 508 3.9× 91 0.9× 172 2.0× 111 1.4× 16 682
Yang Jinlong China 14 84 0.5× 355 2.7× 47 0.4× 78 0.9× 273 3.4× 35 554
Stefan Torbrügge Germany 14 187 1.1× 546 4.2× 81 0.8× 64 0.8× 244 3.0× 14 760

Countries citing papers authored by Patrick W. DeHaven

Since Specialization
Citations

This map shows the geographic impact of Patrick W. DeHaven's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick W. DeHaven with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick W. DeHaven more than expected).

Fields of papers citing papers by Patrick W. DeHaven

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Patrick W. DeHaven. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick W. DeHaven. The network helps show where Patrick W. DeHaven may publish in the future.

Co-authorship network of co-authors of Patrick W. DeHaven

This figure shows the co-authorship network connecting the top 25 collaborators of Patrick W. DeHaven. A scholar is included among the top collaborators of Patrick W. DeHaven based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Patrick W. DeHaven. Patrick W. DeHaven is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Bao, Ruqiang, B. Greene, U. Kwon, et al.. (2015). Replacement metal gate resistance in FinFET architecture modelling, validation and extendibility. 1 indexed citations
2.
Kelly, James J., T. Nogami, O. van der Straten, et al.. (2014). Electrodeposited Cu Film Morphology on Thin PVD Cu Seed Layers. ECS Transactions. 58(17). 17–28. 2 indexed citations
3.
Kelly, James J., T. Nogami, O. van der Straten, et al.. (2012). Electrolyte Additive Chemistry and Feature Size-Dependent Impurity Incorporation for Cu Interconnects. Journal of The Electrochemical Society. 159(10). D563–D569. 15 indexed citations
4.
Kelly, James J., T. Nogami, O. van der Straten, et al.. (2012). Electrolyte Additive Chemistry and Feature Size-Dependent Impurity Incorporation for Cu Interconnects. ECS Transactions. 41(43). 23–33. 2 indexed citations
5.
Yau, Jeng-Bang, Michael S. Gordon, Kenneth P. Rodbell, et al.. (2011). FDSOI radiation dosimeters. 1–2. 7 indexed citations
6.
Simon, A., F.H. Baumann, T. Bolom, et al.. (2010). Effect of TaN Stoichiometry on Barrier Oxidation and Defect Density in 32nm Cu/Ultra-Low K Interconnects. MRS Proceedings. 1249. 1 indexed citations
7.
Sikka, Kamal, David L. Edwards, Gaetano Messina, et al.. (2006). Multi-Chip Package Thermal Management of IBM z-Server Systems. 48. 537–544. 2 indexed citations
8.
Sikka, Kamal, et al.. (2003). Gap-reduced thermal paste package design for cooling single flip-chip electronic modules. 651–657. 5 indexed citations
9.
Mitzi, David B., David R. Medeiros, & Patrick W. DeHaven. (2002). Low-Temperature Melt Processing of Organic−Inorganic Hybrid Films. Chemistry of Materials. 14(7). 2839–2841. 56 indexed citations
10.
Gribelyuk, M., et al.. (2002). Microstructure evolution of electroplated Cu during room temperature transient. 188–190. 1 indexed citations
11.
DeHaven, Patrick W., K. P. Rodbell, & L. Gignac. (1999). In-Situ Study of Ti/TiN Stability under Nitrogen Anneal. MRS Proceedings. 564. 1 indexed citations
12.
Rodbell, Kenneth P., et al.. (1996). Film Crystallographic Texture and Substrate Urface Roughness in Layered Aluminum Metallization. MRS Proceedings. 428. 8 indexed citations
13.
Clevenger, L. A., R. Roy, C. Cabral, et al.. (1995). A comparison of C54-TiSi2 formation in blanket and submicron gate structures using in situ x-ray diffraction during rapid thermal annealing. Journal of materials research/Pratt's guide to venture capital sources. 10(9). 2355–2359. 18 indexed citations
14.
DeHaven, Patrick W. & C. C. Goldsmith. (1993). Stress Mapping Near Simulated Defects in Thin Film Wiring Using X-ray Microbeam Diffraction. MRS Proceedings. 309. 3 indexed citations
15.
Barmak, Katayun, L. A. Clevenger, P. Agnello, et al.. (1991). Effect of an Interfacial Ti Layer on the Formation of CoSi2 on Si. MRS Proceedings. 238. 15 indexed citations
16.
17.
DeHaven, Patrick W. & Virgil L. Goedken. (1979). Crystal and molecular structure of dicarbonyl(2,4-pentanediimine)rhodium(I) tetrafluoroborate, a structure having extended rhodium-rhodium interactions. Inorganic Chemistry. 18(3). 827–831. 29 indexed citations
18.
DeHaven, Patrick W., et al.. (1978). Metal-metal interactions in binuclear rhodium(I) complexes derived from the 7,16-dihydro-6,8,15,17-tetramethyldibenzo[b,i][1,4,8,11]tetraazacyclotetradecinato macrocyclic ligand. Journal of the American Chemical Society. 100(3). 1003–1005. 22 indexed citations
19.
Warner, Philip, et al.. (1977). Propellanes. 17. Bridgehead olefins via solvolysis of 10,10-dibromo[4.3.1]propellanes. Journal of the American Chemical Society. 99(15). 5102–5118. 14 indexed citations
20.
Lovett, Ronald, et al.. (1973). Generalized van der Waals theories for surface tension and interfacial width. The Journal of Chemical Physics. 58(5). 1880–1885. 98 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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