Z. U. Rek

1.5k total citations
74 papers, 1.2k citations indexed

About

Z. U. Rek is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Radiation. According to data from OpenAlex, Z. U. Rek has authored 74 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 33 papers in Materials Chemistry, 25 papers in Electrical and Electronic Engineering and 22 papers in Radiation. Recurrent topics in Z. U. Rek's work include Metal and Thin Film Mechanics (19 papers), X-ray Spectroscopy and Fluorescence Analysis (17 papers) and Copper Interconnects and Reliability (13 papers). Z. U. Rek is often cited by papers focused on Metal and Thin Film Mechanics (19 papers), X-ray Spectroscopy and Fluorescence Analysis (17 papers) and Copper Interconnects and Reliability (13 papers). Z. U. Rek collaborates with scholars based in United States, Japan and United Kingdom. Z. U. Rek's co-authors include J. C. Bilello, S. M. Yalisove, M. Kamińska, E. R. Weber, Rosa León, Z. Liliental‐Weber, Joe Wong, S. G. Malhotra, M. Rowen and J. Chaudhuri and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of Materials Science.

In The Last Decade

Z. U. Rek

71 papers receiving 1.1k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Z. U. Rek United States 21 525 449 301 298 239 74 1.2k
K. Hojou Japan 24 1.1k 2.0× 501 1.1× 191 0.6× 233 0.8× 218 0.9× 140 1.7k
L. Ortéga France 22 738 1.4× 438 1.0× 183 0.6× 404 1.4× 329 1.4× 89 1.4k
A. Kazimirov United States 20 745 1.4× 690 1.5× 92 0.3× 476 1.6× 262 1.1× 104 1.6k
H. Göbel Germany 20 985 1.9× 571 1.3× 230 0.8× 296 1.0× 650 2.7× 70 1.9k
Azusa N. Hattori Japan 20 718 1.4× 711 1.6× 214 0.7× 361 1.2× 242 1.0× 129 1.5k
D. J. H. Cockayne Australia 22 906 1.7× 600 1.3× 211 0.7× 577 1.9× 147 0.6× 72 1.6k
K. L. Tsang Taiwan 19 606 1.2× 352 0.8× 77 0.3× 303 1.0× 149 0.6× 62 1.1k
Wei‐Kan Chu United States 17 417 0.8× 467 1.0× 100 0.3× 140 0.5× 162 0.7× 79 1.0k
H. D. Carstanjen Germany 20 560 1.1× 313 0.7× 145 0.5× 204 0.7× 104 0.4× 72 1.1k
Tomoyuki Takeuchi Japan 22 915 1.7× 153 0.3× 302 1.0× 297 1.0× 342 1.4× 93 1.5k

Countries citing papers authored by Z. U. Rek

Since Specialization
Citations

This map shows the geographic impact of Z. U. Rek's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Z. U. Rek with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Z. U. Rek more than expected).

Fields of papers citing papers by Z. U. Rek

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Z. U. Rek. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Z. U. Rek. The network helps show where Z. U. Rek may publish in the future.

Co-authorship network of co-authors of Z. U. Rek

This figure shows the co-authorship network connecting the top 25 collaborators of Z. U. Rek. A scholar is included among the top collaborators of Z. U. Rek based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Z. U. Rek. Z. U. Rek is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Rek, Z. U., et al.. (2004). Nanostructured chromium nitride films with a valley of residual stress. Thin Solid Films. 472(1-2). 96–104. 38 indexed citations
2.
Rek, Z. U., et al.. (2004). In situ x-ray diffraction observation of multiple texture turnovers in sputtered Cr films. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 22(6). 2365–2372. 1 indexed citations
3.
Zhuang, Danping, et al.. (2003). Defect-selective etching of bulk AlN single crystals in molten KOH/NaOH eutectic alloy. Journal of Crystal Growth. 262(1-4). 89–94. 59 indexed citations
5.
Edgar, James H., et al.. (2000). A Comparison of Aluminum Nitride Freely Nucleated and Seeded on 6H-Silicon Carbide. Materials science forum. 338-342. 1599–1602. 10 indexed citations
7.
Wong, Joe, et al.. (1999). YB66– a new soft X-ray monochromator for synchrotron radiation. II. Characterization. Journal of Synchrotron Radiation. 6(6). 1086–1095. 26 indexed citations
8.
Tsuruta, Hiro, et al.. (1998). A Wide-Bandpass Multilayer Monochromator for Biological Small-Angle Scattering and Fiber Diffraction Studies. Journal of Applied Crystallography. 31(5). 672–682. 48 indexed citations
9.
Freund, Andreas K., A. Munkholm, Stuart R. Stock, & Z. U. Rek. (1997). <title>X-ray diffraction studies of the performance of Si-TaSi2 single crystals as monochromators for synchrotron radiation</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3151. 287–297.
10.
Malhotra, S. G., Z. U. Rek, S. M. Yalisove, & J. C. Bilello. (1997). Strain gradients and normal stresses in textured Mo thin films. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 15(2). 345–352. 26 indexed citations
11.
Tanaka, Takaaki, Tetsuya Aizawa, M. Rowen, et al.. (1997). Nature of the 1385.6 and 1438 eV Positive Glitches in the Transmission Function of the YB66Soft-X-ray Monochromator. Journal of Applied Crystallography. 30(2). 87–91. 7 indexed citations
12.
Stock, Stuart R., Z. U. Rek, & Mark S. Goorsky. (1996). Characterization of TaSi2–Si composites for use as wide-bandpass optical elements for synchrotron radiation. Journal of Applied Physics. 79(9). 6803–6810. 4 indexed citations
13.
Rek, Z. U., et al.. (1995). Growth textures of thick sputtered films and multilayers assessed via synchrotron transmission Laue. Journal of Applied Physics. 78(6). 3812–3819. 3 indexed citations
14.
Fröba, Michael, et al.. (1995). Al and Si K absorption edges of Al2SiO5 polymorphs using the new YB66 soft X-ray monochromator. Physica B Condensed Matter. 208-209. 555–556. 9 indexed citations
15.
Tanaka, Takaho, Yoshio Ishizawa, Joe Wong, et al.. (1994). Development of a YB_ Soft X-ray Monochromator for Synchrotron Radiation :. 10. 110–113. 4 indexed citations
16.
Rek, Z. U., M. Rowen, Joe Wong, & T. Tanaka. (1993). Characterization of YB66crystals for use as a new soft X-ray monochromator with synchrotron radiation. Acta Crystallographica Section A Foundations of Crystallography. 49(s1). c374–c374. 1 indexed citations
17.
Rek, Z. U., T. Tanaka, Franz Schaefers, et al.. (1993). <title>Characterization of YB<formula><inf><roman>66</roman></inf></formula> for use as a soft x-ray monochromator crystal</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1740. 173–180. 5 indexed citations
18.
Hahn, S., et al.. (1988). Effects of high carbon concentration upon oxygen precipitation and related phenomena in CzSi. Journal of Applied Physics. 64(2). 849–855. 14 indexed citations
19.
Bilello, J. C., et al.. (1986). Energetics of dislocation relaxation associated with cleavage in cadmium-doped zinc crystals as probed by synchrotron topography. Materials Science and Engineering. 81. 293–304. 4 indexed citations
20.
Rek, Z. U.. (1980). X-ray studies of boron implanted germanium single crystals. physica status solidi (a). 61(2). 693–700. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Rankless by CCL
2026