J. C. Bilello

1.5k citations

105 papers · 1.2k indexed · h-index 20

Mechanics of Materials top 2%
- Metal and Thin Film Mechanics 46
Ceramics and Composites top 10%
Materials Chemistry top 10%
- Microstructure and mechanical properties 30
- High-Velocity Impact and Material Behavior 10
- Quasicrystal Structures and Properties 9
- X-ray Diffraction in Crystallography 6
Electronic, Optical and Magnetic Materials top 10%
- Copper Interconnects and Reliability 27
Surfaces, Coatings and Films top 10%
Electrical and Electronic Engineering
- Semiconductor materials and devices 15
Biomedical Engineering
- Advanced Surface Polishing Techniques 8

Co-authors: S. M. Yalisove Z. U. Rek S. G. Malhotra David P. Adams G. Caglioti D. Dew‐Hughes Tao Jia Riccardo Rebonato
Cited by: Mechanics of Materials Ceramics and Composites Materials Chemistry
Partner nations: United States United Kingdom Italy

In The Last Decade

J. C. Bilello

98 papers receiving 1.1k citations

Peers

Countries citing papers authored by J. C. Bilello

Since Specialization

Citations

This map shows the geographic impact of J. C. Bilello's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. C. Bilello with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. C. Bilello more than expected).

Fields of papers citing papers by J. C. Bilello

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. C. Bilello. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. C. Bilello. The network helps show where J. C. Bilello may publish in the future.

Co-authorship network

The 25 scholars most cited alongside J. C. Bilello, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. C. Bilello Line = papers co-authored together J. C. Bilello links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Structure and properties of Ni60(Nb100−Ta )34Sn6 bulk metallic glass alloys Haein Choi‐Yim,Michelle L. Tokarz,J. C. Bilello,William L. Johnson	2006	7
2	Investigation of the fracture toughness of radio frequency magnetron sputtered Al–Cu–Fe films via white-beam synchrotron radiography/topography Benjamin French,M.J. Daniels,J. C. Bilello	2005	2
3	Nanostructured chromium nitride films with a valley of residual stress Z. B. Zhao,Z. U. Rek,S. M. Yalisove,J. C. Bilello	2004	38
4	In situ x-ray diffraction observation of multiple texture turnovers in sputtered Cr films Z. B. Zhao,Z. U. Rek,S. M. Yalisove,J. C. Bilello	2004	1
5	In situ observations of the real-time stress-evolution and delamination of thin Ta films on Si(100) Benjamin French,J. C. Bilello	2003	16
6	On the Structural Characterization of a Series of Novel Ni-Nb-Sn Refractory Alloy Glasses Michelle L. Tokarz,J. C. Bilello	2003	2
7	Intermediate Annealing Behavior And Grain Growth Of Al-Cu-Fe Quasicrystalline Coatings M.J. Daniels,David King,J.S. Zabinski,J. C. Bilello	2002	0
8	Growth anisotropy and self-shadowing: A model for the development of in-plane texture during polycrystalline thin-film growth O. P. Karpenko,J. C. Bilello,S. M. Yalisove	1997	64
9	Strain gradients and normal stresses in textured Mo thin films S. G. Malhotra,Z. U. Rek,S. M. Yalisove,J. C. Bilello	1997	26
10	Growth textures of thick sputtered films and multilayers assessed via synchrotron transmission Laue M. Vill,Z. U. Rek,S. M. Yalisove,J. C. Bilello	1995	3
11	Combined transmission electron microscopy and x-ray study of the microstructure and texture in sputtered Mo films O. P. Karpenko,J. C. Bilello,S. M. Yalisove	1994	30
12	Non-destructive evaluation of residual stresses in thin films via x-ray diffraction topography methods Tao Jia,L. H. Lee,J. C. Bilello	1991	23
13	Nucleation and propagation of cracks at grain boundaries in zinc bicrystals H. A. Schmitz,D. Dew‐Hughes,J. C. Bilello	1989	11
14	High-resolution microdiffraction study of notch-tip deformation in Mo single crystals using X-ray synchrotron radiation Riccardo Rebonato,Gene E. Ice,A. Habenschuss,J. C. Bilello	1989	7
15	Synchrotron X-Ray Topography of Dislocation Arrays J. C. Bilello	1986	2
16	Residual strains in amorphous silicon films measured by x-ray double crystal topography C KUO,P. E. Vanier,J. C. Bilello	1984	25
17	Effect of prior deformation on the cleavage of zinc single crystals C. Messmer,D. Dew‐Hughes,J. C. Bilello	1983	1
18	Interaction of cleavage cracks with forest dislocations in zinc C. Messmer,J. C. Bilello,D. Dew‐Hughes	1981	4
19	Temperature dependence of dislocation structure at the crack tip of fractured single crystals of molybdenum J. Liu,J. C. Bilello	1978	9
20	Quantitative etch-pit distribution in crystals J. Pridans,J. C. Bilello	1970	1

About J. C. Bilello

J. C. Bilello is a scholar working on Mechanics of Materials, Electronic, Optical and Magnetic Materials and Ceramics and Composites, having authored 105 papers that have together received 1.2k indexed citations. Recurring topics across this work include Metal and Thin Film Mechanics (46 papers), Microstructure and mechanical properties (30 papers), Copper Interconnects and Reliability (27 papers), Semiconductor materials and devices (15 papers), High-Velocity Impact and Material Behavior (10 papers), Quasicrystal Structures and Properties (9 papers), Advanced Surface Polishing Techniques (8 papers) and X-ray Diffraction in Crystallography (6 papers). The work is most often cited by research in Mechanics of Materials (531 citations), Ceramics and Composites (79 citations) and Materials Chemistry (633 citations). J. C. Bilello has collaborated with scholars based in United States, United Kingdom and Italy. Frequent co-authors include S. M. Yalisove, Z. U. Rek, S. G. Malhotra, David P. Adams, G. Caglioti, D. Dew‐Hughes, Tao Jia, Riccardo Rebonato, Gian Andrea Rizzi and Jay Whitacre.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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