J. C. Bilello

1.5k total citations
105 papers, 1.2k citations indexed

About

J. C. Bilello is a scholar working on Materials Chemistry, Mechanics of Materials and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, J. C. Bilello has authored 105 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 53 papers in Materials Chemistry, 52 papers in Mechanics of Materials and 29 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in J. C. Bilello's work include Metal and Thin Film Mechanics (46 papers), Microstructure and mechanical properties (30 papers) and Copper Interconnects and Reliability (27 papers). J. C. Bilello is often cited by papers focused on Metal and Thin Film Mechanics (46 papers), Microstructure and mechanical properties (30 papers) and Copper Interconnects and Reliability (27 papers). J. C. Bilello collaborates with scholars based in United States, United Kingdom and Italy. J. C. Bilello's co-authors include S. M. Yalisove, Z. U. Rek, S. G. Malhotra, David P. Adams, G. Caglioti, D. Dew‐Hughes, Tao Jia, Riccardo Rebonato, Gian Andrea Rizzi and Jay Whitacre and has published in prestigious journals such as Physical review. B, Condensed matter, Journal of Applied Physics and Journal of Dental Research.

In The Last Decade

J. C. Bilello

98 papers receiving 1.1k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
J. C. Bilello United States	20	633	531	369	280	236	105	1.2k
P.B. Barna Hungary	20	864 1.4×	590 1.1×	468 1.3×	238 0.8×	266 1.1×	94	1.4k
M. Adamik Hungary	14	662 1.0×	552 1.0×	413 1.1×	177 0.6×	131 0.6×	31	1.1k
B. Z. Weiss Israel	21	751 1.2×	519 1.0×	361 1.0×	476 1.7×	211 0.9×	65	1.2k
H. Mizubayashi Japan	19	730 1.2×	272 0.5×	301 0.8×	630 2.3×	132 0.6×	128	1.2k
Pirouz Pirouz United States	18	543 0.9×	295 0.6×	674 1.8×	220 0.8×	196 0.8×	31	1.2k
W.D. Nix United States	19	973 1.5×	658 1.2×	208 0.6×	622 2.2×	190 0.8×	42	1.6k
Z. H. Barber United Kingdom	14	547 0.9×	356 0.7×	245 0.7×	201 0.7×	113 0.5×	30	871
M. Nastasi United States	16	720 1.1×	456 0.9×	132 0.4×	522 1.9×	123 0.5×	28	1.0k
T. Girardeau France	20	622 1.0×	362 0.7×	413 1.1×	97 0.3×	127 0.5×	60	1.1k
K. F. Badawi France	19	507 0.8×	557 1.0×	187 0.5×	245 0.9×	189 0.8×	55	969

Countries citing papers authored by J. C. Bilello

Since Specialization

Citations

This map shows the geographic impact of J. C. Bilello's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. C. Bilello with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. C. Bilello more than expected).

Fields of papers citing papers by J. C. Bilello

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. C. Bilello. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. C. Bilello. The network helps show where J. C. Bilello may publish in the future.

Co-authorship network of co-authors of J. C. Bilello

This figure shows the co-authorship network connecting the top 25 collaborators of J. C. Bilello. A scholar is included among the top collaborators of J. C. Bilello based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. C. Bilello. J. C. Bilello is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Choi‐Yim, Haein, et al.. (2006). Structure and properties of Ni60(Nb100−Ta )34Sn6 bulk metallic glass alloys. Journal of Non-Crystalline Solids. 352(8). 747–755. 7 indexed citations

French, Benjamin, et al.. (2005). Investigation of the fracture toughness of radio frequency magnetron sputtered Al–Cu–Fe films via white-beam synchrotron radiography/topography. Journal of Physics D Applied Physics. 38(10A). A44–A49. 2 indexed citations

Rek, Z. U., et al.. (2004). Nanostructured chromium nitride films with a valley of residual stress. Thin Solid Films. 472(1-2). 96–104. 38 indexed citations

Rek, Z. U., et al.. (2004). In situ x-ray diffraction observation of multiple texture turnovers in sputtered Cr films. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 22(6). 2365–2372. 1 indexed citations

French, Benjamin & J. C. Bilello. (2003). In situ observations of the real-time stress-evolution and delamination of thin Ta films on Si(100). Thin Solid Films. 446(1). 91–98. 16 indexed citations

Bilello, J. C., et al.. (2003). On the Structural Characterization of a Series of Novel Ni-Nb-Sn Refractory Alloy Glasses. MRS Proceedings. 806. 2 indexed citations

King, David, et al.. (2002). Intermediate Annealing Behavior And Grain Growth Of Al-Cu-Fe Quasicrystalline Coatings. MRS Proceedings. 749.

Bilello, J. C., et al.. (1997). Growth anisotropy and self-shadowing: A model for the development of in-plane texture during polycrystalline thin-film growth. Journal of Applied Physics. 82(3). 1397–1403. 64 indexed citations

Malhotra, S. G., Z. U. Rek, S. M. Yalisove, & J. C. Bilello. (1997). Strain gradients and normal stresses in textured Mo thin films. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 15(2). 345–352. 26 indexed citations

10.

Rek, Z. U., et al.. (1995). Growth textures of thick sputtered films and multilayers assessed via synchrotron transmission Laue. Journal of Applied Physics. 78(6). 3812–3819. 3 indexed citations

11.

Bilello, J. C., et al.. (1994). Combined transmission electron microscopy and x-ray study of the microstructure and texture in sputtered Mo films. Journal of Applied Physics. 76(8). 4610–4617. 30 indexed citations

12.

Jia, Tao, et al.. (1991). Non-destructive evaluation of residual stresses in thin films via x-ray diffraction topography methods. Journal of Electronic Materials. 20(7). 819–825. 23 indexed citations

13.

Dew‐Hughes, D., et al.. (1989). Nucleation and propagation of cracks at grain boundaries in zinc bicrystals. Journal of materials research/Pratt's guide to venture capital sources. 4(5). 1182–1194. 11 indexed citations

14.

Rebonato, Riccardo, Gene E. Ice, A. Habenschuss, & J. C. Bilello. (1989). High-resolution microdiffraction study of notch-tip deformation in Mo single crystals using X-ray synchrotron radiation. Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties. 60(5). 571–583. 7 indexed citations

15.

Bilello, J. C.. (1986). Synchrotron X-Ray Topography of Dislocation Arrays. MRS Proceedings. 82. 2 indexed citations

16.

Vanier, P. E., et al.. (1984). Residual strains in amorphous silicon films measured by x-ray double crystal topography. Journal of Applied Physics. 55(2). 375–377. 25 indexed citations

17.

Dew‐Hughes, D., et al.. (1983). Effect of prior deformation on the cleavage of zinc single crystals. Philosophical Magazine B. 47(5). 635–656. 1 indexed citations

18.

Bilello, J. C., et al.. (1981). Interaction of cleavage cracks with forest dislocations in zinc. Metal Science. 15(2). 79–80. 4 indexed citations

19.

Bilello, J. C., et al.. (1978). Temperature dependence of dislocation structure at the crack tip of fractured single crystals of molybdenum. Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties. 38(3). 297–319. 9 indexed citations

20.

Bilello, J. C., et al.. (1970). Quantitative etch-pit distribution in crystals. Journal of Physics E Scientific Instruments. 3(9). 743–744. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact