J. C. Bilello

1.5k citations
105 papers · 1.2k indexed · h-index 20
Topics
Metal and Thin Film Mechanics (46 papers)Microstructure and mechanical properties (30 papers)Copper Interconnects and Reliability (27 papers)

In The Last Decade

J. C. Bilello

98 papers receiving 1.1k citations

Peers

J. C. Bilello
Comparison fields: 5 of 65
  • Materials Chemistry 633
  • Mechanics of Materials 531
  • Electrical and Electronic Engineering 369
  • Mechanical Engineering 280
  • Atomic and Molecular Physics, and Optics 236
Replace D.M. Mattox with:
D.M. Mattox United States
P.B. Barna Hungary
J. Delafond France
A. Kolitsch Germany
W.D. Nix United States
Tōru Imura Japan
Holger Hoche Germany
Y. Pauleau France
D. B. Knorr United States
Leonid Klinger Israel
J. C. Bilello relative to D.M. Mattox United States D.M. Mattox's profile →
Citations per field
00.5×1.5×
D.M. Mattox · 1×
Citations per year

Countries citing papers authored by J. C. Bilello

Since Specialization
Citations

This map shows the geographic impact of J. C. Bilello's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. C. Bilello with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. C. Bilello more than expected).

Fields of papers citing papers by J. C. Bilello

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. C. Bilello. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. C. Bilello. The network helps show where J. C. Bilello may publish in the future.

Co-authorship network of co-authors of J. C. Bilello

This figure shows the co-authorship network connecting the top 25 collaborators of J. C. Bilello. A scholar is included among the top collaborators of J. C. Bilello based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. C. Bilello. J. C. Bilello is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 7
2 2
3 38
4 1
5 16
6 2
7 0
8 64
9 26
10 3
11 30
12 23
13 11
14 7
15 2
16 25
17 1
18 4
19 9
20 1

About J. C. Bilello

J. C. Bilello is a scholar working on Mechanics of Materials, Electronic, Optical and Magnetic Materials and Ceramics and Composites, having authored 105 papers that have together received 1.2k indexed citations. Recurring topics across this work include Metal and Thin Film Mechanics (46 papers), Microstructure and mechanical properties (30 papers) and Copper Interconnects and Reliability (27 papers). The work is most often cited by research in Mechanics of Materials (531 citations), Ceramics and Composites (79 citations) and Materials Chemistry (633 citations). J. C. Bilello has collaborated with scholars based in United States, United Kingdom and Italy. Frequent co-authors include S. M. Yalisove, Z. U. Rek, S. G. Malhotra, David P. Adams, G. Caglioti, D. Dew‐Hughes, Tao Jia, Riccardo Rebonato, Gian Andrea Rizzi and Jay Whitacre. Their work appears in journals such as Physical review. B, Condensed matter, Journal of Applied Physics and Journal of Dental Research.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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